NIST logo

Publications Portal

You searched on:
Topic Area: Advanced Materials
Sorted by: title

Displaying records 21 to 30 of 69 records.
Resort by: Date / Title


21. Effects of Solution pH and Surface Chemistry on the Post-deposition Growth of Chemical Bath Deposited PbSe Nanocrystalline
Topic: Advanced Materials
Published: 9/1/2007
Authors: Shaibai K Sarkar, Shifi Kababya, Shimon Vega, Hagal Cohen, Joseph C Woicik, A I Frenkel, Gary Hodes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854229

22. Electron beam heating effects during ESEM imaging of water condensation on superhydrophobic surfaces
Topic: Advanced Materials
Published: 3/1/2011
Authors: Konrad Rykaczewski, John Henry j Scott, Andrei G. Fedorov
Abstract: Nanostructured superhydrophobic surfaces show promise as promoters of dropwise condensation and may lead to significant efficiency improvements in numerous industrial processes. Droplets with diameters below ~10 µm account for the majority of the he ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907573

23. Examination of the Application of a Wavelet Transformation to Acoustic Emission Signals: Part 2. Source Location
Topic: Advanced Materials
Published: 1/1/2002
Authors: Marvin Arnold Hamstad, Agnes O'Gallagher, John M. Gary
Abstract: In Part 2, (Part 1 Source Identification) the same finite-element-generated database of acoustic emission (AE) signals was used to examine the application of a wavelet transform (WT) to improve the accuracy of AE source location. The method utilizes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851302

24. Examination of the Application of a Wavelet Transformation to Acoustic Emission Signals: part 1. Source Identification
Topic: Advanced Materials
Published: 1/1/2002
Authors: Marvin Arnold Hamstad, Agnes O'Gallagher, John M. Gary
Abstract: A database of wideband acoustic emission (AE) modeled signals was used in Part 1 to examine the application of a wavelet transform (WT) to accomplish identification of AE sources. The AE signals in the database were created by use of a validted thre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851301

25. Freeform Fabricated Scaffolds with Roughened Struts that Enhance both Stem Cell Proliferation and Differentiation by Controlling Cell Shape
Topic: Advanced Materials
Published: 3/1/2012
Authors: Girish Kumar, Carl George Simon Jr, Michael S. (Michael Stephan) Waters, Tanya M. Farooque, Marian F Young
Abstract: We demonstrate that imparting freeform fabricated (FFF) scaffolds with surface roughness on their struts enhances osteogenic differentiation of primary human bone marrow stromal cells (hBMSCs) by controlling cell shape. Previous work showed that hBM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910664

26. Gas-Foamed Scaffold Gradients for Combinatorial Screening in 3D
Topic: Advanced Materials
Published: 5/1/2012
Authors: Carl George Simon Jr, Kaushik Chatterjee, Alison McGibbon Kraigsley, Joachim Kohn, Durgadas Bolikal
Abstract: Current methods for screening cell-material interactions typically utilize two-dimensional (2D) culture format where cells are cultured on flat surfaces. However, there is a need for combinatorial and high-throughput screening methods to systematica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910404

27. Generation of Monolayer Gradients in Surface Energy and Chemistry for Block Copolymer Thin Film Studies
Topic: Advanced Materials
Published: 12/1/2009
Authors: Julie N. L. Albert, Michael J. Baney, Christopher M Stafford, Jennifer Y. Kelly, Thomas H Epps
Abstract: We utilize an innovative vapor deposition set-up and cross-diffusion of functionalized chlorosilanes under dynamic vacuum to generate a linear gradient in surface energy and composition on a silicon substrate. The gradient can be tuned by manipulati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902680

28. Giant piezoelectricity in PMN-PT thin films: Beyond PZT
Topic: Advanced Materials
Published: 11/1/2012
Authors: S. H. Baek, M. S. Rzchowski, Vladimir A Aksyuk
Abstract: Micro-electromechanical systems (MEMS) incorporating piezoelectric layers provide active transduction between electrical and mechanical energy, which enables highly sensitive sensors and low-voltage driven actuators surpassing the passive operation o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912113

29. Graphene Epitaxial Growth on SiC(0001) for Resistance Standards
Topic: Advanced Materials
Published: 6/1/2012
Authors: Mariano A. Real, Tian T. Shen, George R Jones, Randolph E Elmquist, Johannes A Soons, Albert Davydov
Abstract: Epitaxial growth of graphene layers on 6H-SiC(0001) substrates have been studied in order to improve graphene‰s performance for metrological applications. A face-to-face (FTF) sublimation method at 2000 °C and in Ar background atmosphere is used to i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910566

30. Graphene Epitaxial Growth on SiC(0001) for Resistance Standards
Topic: Advanced Materials
Published: 6/3/2013
Authors: Mariano A. Real, Eric Lass, Fan-Hung Liu, Tian T. Shen, George R Jones, Johannes A Soons, David B Newell, Albert Davydov, Randolph E Elmquist
Abstract: A well-controlled technique for high-temperature epitaxial growth on 6H-SiC(0001) substrates is shown to allow development of monolayer graphene that exhibits promise for precise metrological applications. Face-to-face (FTF) and face-to-graphite (FTG ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911731



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series