NIST logo

Publications Portal

You searched on: Topic Area: Advanced Materials Sorted by: date

Displaying records 1 to 10 of 67 records.
Resort by: Date / Title


1. Materials Testing Standards for Additive Manufacturing of Polymer Materials: State of the Art and Standards Applicability
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 8059
Topic: Advanced Materials
Published: 5/15/2015
Author: Aaron M Forster
Abstract: Additive manufacturing (AM) continues to grow as an advanced manufacturing technique. The most recent industry report from Wohlers and Associates indicates AM represented $1.6Bin revenue from parts, systems, and other supporting industries in 201 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917706

2. Photodetectors: High-Gain and Low-Driving-Voltage Photodetectors Based on Organolead Triiodide Perovskites (Adv. Mater. 11/2015)
Topic: Advanced Materials
Published: 3/12/2015
Authors: Riu Dong, Yanjun Fang, Jungseok Chae, Jun Dai, Zhengguo Xiao, Qingfeng Dong, Yongbo Yuan, Andrea Centrone, Xiaocheng Zeng, Jinsong Huang
Abstract: Methylammonium lead triiodide (CH3NH3PbI3) perovskite is an emerging low-cost, solution processable material which attracts great interest for enabling the fabrication of high performance optoelectronic devices such as solar cells, room temperature l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917115

3. Broad Band Optical Properties of Large Area Monolayer CVD Molybdenum Disulfide
Topic: Advanced Materials
Published: 11/21/2014
Authors: wei li, Glen Birdwell, Matin Amani, Yi-Hsien Lee, Ling Xi, Xuelei Liang, Lianmao Peng, Curt A Richter, Kong Jing, David J Gundlach, Nhan V Nguyen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915849

4. Mechanical Properties of Austenitic Stainless Steel Made by Additive Manufacturing
Series: Journal of Research (NIST JRES)
Report Number: 119.015
Topic: Advanced Materials
Published: 10/10/2014
Authors: John A. Slotwinski, William E Luecke
Abstract: Using uniaxial tensile and hardness testing, we evaluated the variability and anisotropy of the mechanical properties of an austenitic stainless steel, UNS S17400, manufactured by an additive process, selective laser melting. Like wrought materia ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915239

5. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Advanced Materials
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian John Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

6. Stress mapping of micromachined polycrystalline silicon devices via confocal Raman microscopy
Topic: Advanced Materials
Published: 6/15/2014
Authors: Grant A Myers, Siddharth Hazra, Maarten de Boer, Chris A Michaels, Stephan J Stranick, Ryan P. Koseski, Robert Francis Cook, Frank W DelRio
Abstract: Stress mapping of micromachined polycrystalline silicon devices with components in various levels of uniaxial tension was performed. Confocal Raman microscopy was used to form two-dimensional maps of Raman spectral shifts, which exhibited variations ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915909

7. Measuring Organelle Shape in 3D in Stem Cells Cultured on Nanofiber Scaffolds
Topic: Advanced Materials
Published: 4/19/2014
Authors: Carl George Simon Jr., Peter Bajcsy, Wojtek J Tutak, Jyotsnendu J. Giri
Abstract: Previous work has demonstrated that culture of osteoprogenitor cells on nanofiber scaffolds can potentiate osteogenic differentiation [1-4]. Culture of cells in nanofiber scaffolds causes changes to cell morphology, suggesting that morphological ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914995

8. Measuring Stem Cell Dimensionality in Tissue Scaffolds
Topic: Advanced Materials
Published: 4/1/2014
Authors: Carl George Simon Jr., Sapun Parekh, Christopher K. Tison, Girish Kumar, Tanya M. Farooque, Charles H Camp
Abstract: Many 3D scaffold systems have evolved for tissue engineering, drug screening and in vitro tissue models. However, it is not clear which scaffolds provide a 3D cell niche and there is no clear way to measure cell niche dimensionality. Advances in 3D ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913148

9. Dynamic contact AFM methods for nanomechanical properties
Topic: Advanced Materials
Published: 12/1/2013
Authors: Donna C. Hurley, Jason Philip Killgore
Abstract: This chapter focuses on two atomic force microscopy (AFM) methods for nanomechanical characterization: force modulation microscopy (FMM) and contact resonance (CR) techniques. FMM and CR methods share several common features that distinguish them fro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911068

10. Airbrushed Nanofiber Scaffolds Support Bone Marrow Stromal Cell Differentiation
Topic: Advanced Materials
Published: 11/1/2013
Authors: Carl George Simon Jr., Wojtek J Tutak, Sumona Sarkar, Tanya M. Farooque, Jyotsnendu J. Giri, Dongbo Wang, Sheng Lin-Gibson, Joachim Kohn, Durgadas Bolikal
Abstract: Nanofiber scaffolds are effective for tissue engineering since they emulate the fibrous nanostructure of native extracellular matrix (ECM). Although electrospinning has been the most common approach for fabricating nanofiber scaffolds, airbrushi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912293



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series