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Topic Area: Simulation
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Displaying records 81 to 85.
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81. Tradeoffs in Building a Generic Supply Chain Simulation Capability
Topic: Simulation
Published: 10/15/2008
Author: Sanjay Jain
Abstract: Building a simulation model for any large complex sys-tem requires high expertise and effort. These requirements can be reduced through building generic simulation capability that includes artifacts for facilitating the development of the simulation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824711

82. USARSim/ROS: A Combined Framework for Robotic Control and Simulation
Topic: Simulation
Published: 6/20/2012
Authors: Stephen B. Balakirsky, Zeid Kootbally
Abstract: The Robot Operating System (ROS) has been steadily gaining popularity among robotics researchers as an open source framework for robot control. The Unified System for Automation and Robot Simulation (USARSim) has been used for many years by robotics ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910918

83. User Interface of Simulation of the Shipbuilding Operations
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7320
Topic: Simulation
Published: 6/1/2006
Authors: Guodong Shao, Charles R. McLean, Swee Kong Leong
Abstract: This paper discusses the development of the user interface for a simulation of the shipbuilding operations. It presents an overview of a generic simulation of shipbuilding operations, the simulation system's user profiles, and the user interface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822610

84. Using Simulation To Assess The Effectiveness of Pallet Stacking Methods
Topic: Simulation
Published: 11/19/2010
Authors: Stephen B. Balakirsky, Frederick M Proctor, Thomas Rollin Kramer, Pushkar Kolhe, Henrik I. Christensen
Abstract: Stacking objects onto pallets is the most widely used method of bulk shipping, accounting for over 60% of the volume of goods shipped worldwide. Due in part to the wide variation in size, shape and weight of objects to be palletized, successful stack ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906569

85. VCI Simulation with Semiconductor Device Models: Test Report
Topic: Simulation
Published: 2/29/2012
Author: John S Villarrubia
Abstract: JMONSEL, an electron beam imaging simulator, has been modified to permit conducting regions of a sample to be designated as unconnected to an external source or sink of charge (floating) or, alternatively, to be connected with a user-specified relaxa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910799



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