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You searched on: Topic Area: Simulation Sorted by: title

Displaying records 11 to 20 of 44 records.
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11. Advancing Manufacturing Research Through Competitions
Topic: Simulation
Published: 4/17/2009
Authors: Stephen B. Balakirsky, Rajmohan Madhavan
Abstract: Competitions provide a technique for building interest and collaboration in targeted research areas. This paper will present a new competition that aims to increase collaboration amongst Universities, automation end-users, and automation manufacturer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902579

12. An Analysis of Solver-Based Simulation Tools
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7846
Topic: Simulation
Published: 3/7/2012
Authors: Ion Matei, Conrad E Bock
Abstract: Computer-interpretable representations of systems‰ structure and behavior are at the center of designing today‰s complex systems. Engineers create and review such representations using (graphical) modeling languages that support specification, analy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909924

13. An Industrial Control System Cybersecurity Performance Testbed
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 8089
Topic: Simulation
Published: 12/10/2015
Authors: Richard Candell, Timothy Aaron Zimmerman, Keith A Stouffer
Abstract: The National Institute of Standards and Technology (NIST) is developing a cybersecurity performance testbed for industrial control systems. The goal of the testbed is to measure the performance of industrial control systems (ICS) when instrumente ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919407

14. Core Manufacturing Simulation Data - UML Model Standard
Topic: Simulation
Published: 11/24/2010
Authors: Yung-Tsun Tina Lee, Frank H Riddick
Abstract: This product, Core Manufacturing Simulation Data (CMSD), addresses interoperability between simulation systems and other manufacturing applications. The CMSD information model is a standard representation for core manufacturing simulation data. It pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907352

15. DATA ANALYTICS USING SIMULATION FOR SMART MANUFACTURING
Topic: Simulation
Published: 12/11/2014
Authors: Guodong Shao, Sanjay Jain, Seungjun Shin
Abstract: Manufacturing organizations are able to accumulate large amounts of plant floor production and environmental data due to advances in data collection, communications technology, and use of standards. The challenge has shifted from collecting a suffic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915917

16. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Simulation
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian J Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

17. Distributed Simulation for Interoperability Testing Along the Supply Chain
Topic: Simulation
Published: 7/1/2007
Authors: Sanjay Jain, Frank H Riddick, Andreas Craens, Deogratias Kibira
Abstract: The need for interoperability of information systems among supply chain partners has been recognized. A number of standards have been or are being developed to ensure interoperability of applications used along the sup-ply chain. An associated need ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822735

18. Enabling Quantitative Optical Imaging for In-die-capable Critical Dimension Targets
Topic: Simulation
Published: 4/4/2016
Authors: Bryan M Barnes, Mark Alexander Henn, Martin Y Sohn, Hui Zhou, Richard M Silver
Abstract: Dimensional scaling trends will eventually bring the semiconductor critical dimensions (CDs) down to only a few atoms in width. New optical techniques are required to address intra-die variability for these CDs using sufficiently small in-die metrolo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920551

19. Engineering Change Management Concepts for Systems Modeling
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7922
Topic: Simulation
Published: 4/22/2013
Authors: Conrad E Bock, Allison Barnard Feeney
Abstract: A significant cost of manufactured systems arises in changing system specifications after they have been built and delivered to customers. This might be due to errors in the original specifications, feedback from customers, competition from other ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913323

20. Evaluating The RoboCup 2009 Virtual Robot Rescue Competition
Topic: Simulation
Published: 4/22/2010
Authors: Stephen B. Balakirsky, Stefano Carpin, Arnoud Visser
Abstract: The 2009 RoboCup Competitions took place in Graz Austria in July of 2009. The Virtual Robot Rescue Competition included 11 competitors from 10 different countries. The main objective of this competition is to utilize teams of robots to perform an urb ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904116



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