NIST logo

Publications Portal

You searched on:
Topic Area: Product Data
Sorted by: title

Displaying records 41 to 50 of 63 records.
Resort by: Date / Title


41. Opening Up to Standardization
Topic: Product Data
Published: 6/1/1999
Authors: Barbara L Goldstein, J. Cartwright
Abstract: Today's electronics manufacturers are expected to reduce their time-to-market cycles and lower total costs simultaneously. Product development cycles and volume ramp-up times are rapid, and corresponding end-of-life production is dramatic. This env ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29297

42. Operating Procedures and Life Cycle Documentation for the Initial Graphics Exchange Specification
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5666
Topic: Product Data
Published: 6/1/1995
Authors: E. Reid, Curtis H. Parks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1736

43. Platform-based Product Design and Development: A Knowledge Intensive Support Approach
Topic: Product Data
Published: 8/1/2006
Authors: XuanFang Zha, Ram D Sriram
Abstract: This paper presents a knowledge-intensive support paradigm for platform-based product family design and development. The fundamental issues underlying the product family design and development, including product platform and product family modeling, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822620

44. Proceedings Plug and Play Software for Agile Manufacturing
Topic: Product Data
Published: 2/1/1997
Author: Barbara L Goldstein
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=827

45. Recommended practice for the representation of component catalog data in STEP AP210 (ISO-10303:210)
Series: Grant/Contract Reports (NISTGCR)
Report Number: 12-969
Topic: Product Data
Published: 5/1/2012
Author: Kevin G Brady
Abstract: The purpose of this document is to recommend a practice for the representation of electronic component catalog data in STEP AP210 (ISO-10303:210). Catalog data encompasses a wide variety of performance characteristics and specifications, rating limit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911292

46. Representation of Heterogeneous Material Properties in the Core Product Model
Topic: Product Data
Published: 6/1/2006
Authors: Arpan Biswas, Steven J. Fenves, V Shapiro, Ram D Sriram
Abstract: The Core Product Model (CPM) was developed at NIST as a high level abstraction for representing product related information, to support data exchange, in a distributive and a collaborative environment. In this paper, we extend the CPM to components w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822612

47. Representation of functional networks in STEP AP210 with application to SPICE circuit simulation
Series: Grant/Contract Reports (NISTGCR)
Report Number: 11-949
Topic: Product Data
Published: 11/11/2011
Author: Jamie Stori
Abstract: STEP AP210 (ISO 10303-210) supports a comprehensive functional network model representation. SPICE (Simulation Program with Integrated Circuit Emphasis) is a general purpose, industry standard, analog electronic circuit simulation. Originally dev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910094

48. Roadmap for the Computer Integrated Manufacturing Application Framework
Topic: Product Data
Published: 5/1/1995
Authors: S. L. Stewart, James A St. Pierre
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2523

49. Roadmap for the Computer Integrated Manufacturing Application Framework
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5679
Topic: Product Data
Published: 6/1/1995
Authors: S. L. Stewart, James A St. Pierre
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9559

50. Scanning Probe Microscopy for Dielectric and Metal Characterization
Topic: Product Data
Published: 6/10/2008
Authors: Joseph J Kopanski, Thomas R Walker
Abstract: The properties of both insulators and metals can be characterized capacitively with scanning probe microscopy, though the techniques employed are different. Intermittent contact scanning capacitance microscopy (IC-SCM) is a useful technique for chara ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32949



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series