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Topic Area: Process Improvement
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21. The Multi-Relationship Evaluation Design (MRED) Framework: Producing Evaluation Blueprints to Test Emerging, Advanced, and Intelligent Systems
Topic: Process Improvement
Published: 9/30/2010
Authors: Brian A Weiss, Linda C. Schmidt
Abstract: This paper introduces the Multi-Relationship Evaluation Design (MRED) framework whose objective is to take uncertain input data and automatically output comprehensive evaluation blueprints complete with targeted evaluation elements. MRED is unique in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906664

22. The Multi-Relationship Evaluation Design Framework: Producing Evaluation Blueprints to Test Emerging, Advanced, and Intelligent Technologies
Topic: Process Improvement
Published: 6/30/2011
Authors: Brian A Weiss, Linda C. Schmidt
Abstract: This article introduces the Multi-Relationship Evaluation Design (MRED) framework whose objective is to take uncertain input data and automatically output comprehensive evaluation blueprints complete with targeted evaluation elements. MRED is unique ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909315

23. UML 2 Activity and Action Models
Topic: Process Improvement
Published: 7/1/2003
Author: Conrad E Bock
Abstract: This is the first in a series introducing the activity model in the Unified Modeling Language, version 2 (UML 2), and how it integrates with the action model [1]. The series is a companion to the standard, providing additional background, rationale, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908407

24. Web-enabled Real-time Quality Feedback for Factory Systems using MTConnect
Topic: Process Improvement
Published: 8/15/2012
Authors: John L Michaloski, Byeong Eon Lee, Frederick M Proctor, Sid Venkatesh
Abstract: Quality is a key element to success for any manufacturer, and the fundamental prerequisite for quality is measurement. In the discrete parts industry, quality is attained through inspection of parts but typically there is a long latency between ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911323