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Topic Area: Process Improvement
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Displaying records 1 to 10 of 28 records.
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1. 2012 Proceedings of the Performance Metrics for Intelligent Systems (PerMI'12) Workshop
Series: Special Publication (NIST SP)
Report Number: 1136
Topic: Process Improvement
Published: 11/21/2012
Authors: Rajmohan Madhavan, Elena R Messina, Brian A Weiss
Abstract: The 2012 Performance Metrics for Intelligent Systems workshop is the eleventh in a series dedicated to defining measures and methodologies of evaluating performance of intelligent systems. Started in 2000, the PerMIS series focuses on application ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911879

2. A Detailed Discussion of Lessons Learned in Evaluating Emerging and Advanced Military Technologies
Topic: Process Improvement
Published: 6/3/2011
Authors: Craig I Schlenoff, Brian A Weiss, Michelle Potts Steves
Abstract: For the past six years, personnel from the National Institute of Standards and Technology (NIST) have served as the Independent Evaluation Team (IET) for two major DARPA programs. DARPA ASSIST (Advanced Soldier Sensor Information System and Technolog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907576

3. A Factory-Wide EDA Data Quality Performance Simulation for APC Capabilities Analysis
Topic: Process Improvement
Published: 10/1/2008
Authors: Xiao Zhu, Dhananjay Anand, Sulaiman Hussain, YaShian Li-Baboud, James Moyne
Abstract: Realizing benefits from real-time process control requires in-situ monitoring of process environment, equipment, and the wafer to maximize opportunities for process improvement and minimizing effects of process deviations. The data gathered from the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33161

4. A Literature Review of Sensor Ontologies for Manufacturing Applications
Topic: Process Improvement
Published: 10/23/2013
Authors: Craig I Schlenoff, Tsai Hong Hong, Roger D. Eastman
Abstract: The purpose of this paper is to review existing sensor and sensor network ontologies to understand whether they can be reused as a basis for a manufacturing perception sensor ontology, or if the existing ontologies hold lessons for the development of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914024

5. A Retrospective Analysis of Lessons Learned in Evaluating Advanced Military Technologies
Topic: Process Improvement
Published: 12/30/2011
Authors: Craig I Schlenoff, Brian A Weiss, Michelle Potts Steves
Abstract: For the past six years, personnel from the National Institute of Standards and Technology (NIST) have served as the Independent Evaluation Team (IET) for two major DARPA programs. DARPA ASSIST (Advanced Soldier Sensor Information System and Technolog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908594

6. Allocation of Manufacturers through Internet-based Collaboration for Distributed Process Planning
Topic: Process Improvement
Published: 8/1/2006
Authors: Jungyub Woo, Hyunbo Cho, Boonserm Kulvatunyou
Abstract: The pursuit of lower cost, shorter time-to-market, and better quality has led to a shift toward global production in today?s competitive business environment. This shift, however, forces manufacturing enterprises to have separate design houses and ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822617

7. An Approach to Ontology-Based Intention Recognition Using State Representations
Topic: Process Improvement
Published: 10/7/2012
Authors: Craig I Schlenoff, Sebti Foufou, Stephen B. Balakirsky
Abstract: In this paper, we present initial thoughts on an approach to ontology/logic-based intention recognition based on the recognition, representation, and ordering of states. This is different than traditional approaches to intention recognition, which us ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911867

8. An IEEE Standard Ontology for Robotics and Automation
Topic: Process Improvement
Published: 10/12/2012
Authors: Craig I Schlenoff, Edson Prestes, Rajmohan Madhavan, Paulo Goncalvest, Howard Li, Stephen B. Balakirsky, Thomas Rollin Kramer, Emilio Miguelanez
Abstract: In this article, we discuss a newly formed IEEE- RAS working group entitled Ontologies for Robotics and Automation (ORA). The goal of this working group is to develop a standard ontology and associated methodology for knowledge representation and rea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911827

9. Carbon Weight Analysis for Machining Operation and Allocation for Redesign
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7560
Topic: Process Improvement
Published: 12/16/2009
Authors: Gaurav Ameta, Mahesh Mani, Rachuri Rachuri, Kevin W Lyons, Shaw C Feng, Ram D Sriram
Abstract: The objective of this research is to explore and develop a new methodology for computing carbon weight (CW) - often referred to as carbon footprint, in manufacturing processes from the part level to assembly level. In this initial study we focused on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901525

10. Dynamic Properties for Modeling and Simulation of Machining: An Update of Results from the NIST Pulse-Heated Kolsky Bar
Topic: Process Improvement
Published: 5/7/2009
Authors: Timothy J Burns, Steven P Mates, Richard L. Rhorer, Eric Paul Whitenton, Debasis Basak
Abstract: The NIST Pulse-Heated Kolsky Bar Laboratory has been developed for the measure-ment of dynamic properties of metals, primarily for application to the study of high-speed machining processes. Because the work material in these processes can be subject ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901481



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