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You searched on: Topic Area: Nanomanufacturing Sorted by: title

Displaying records 31 to 40 of 45 records.
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31. On the Field Evaporation Behavior of c-axis GaN Nanowires in Laser-Pulsed Atom Probe Tomography
Topic: Nanomanufacturing
Published: 6/26/2013
Authors: Matthew David Brubaker, Kristine A Bertness, Norman A Sanford, Brian Gorman, David R Diercks, R Kirchofer
Abstract: GaN has seen use in many applications such as photovoltaics, blue and ultraviolet lasers, and light-emitting diodes with additional research into expanded and new applications. GaN in the form of nanowires present additional possibilities due to th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913334

32. Optical Through-Focus Technique that Differentiates Small Changes in Line Width, Line Height and Sidewall Angle for CD, Overlay, and Defect Metrology Applications
Topic: Nanomanufacturing
Published: 4/16/2008
Authors: Ravikiran Attota, Richard M Silver, Bryan M Barnes
Abstract: We present a new optical technique for dimensional analysis of sub 100 nm sized targets by analyzing through-focus images obtained using a conventional bright-field optical microscope.  We present a method to create through-focus image maps (TFIM) us ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824634

33. Orthogonal Analysis of Functional Gold Nanoparticles for Biomedical Applications
Topic: Nanomanufacturing
Published: 9/11/2015
Authors: De-Hao D. Tsai, Yi-Fu Lu, Frank W DelRio, Tae Joon Cho, Suvajyoti S. Guha, Michael Russel Zachariah, Fan Zhang, Andrew John Allen, Vincent A Hackley
Abstract: We report a comprehensive strategy based on implementation of orthogonal measurement techniques to provide critical and verifiable material characteristics for functionalized gold nanoparticles (AuNPs) used in biomedical applications. Thiolated polye ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918793

34. PDH-locked, frequency-stabilized cavity ring-down spectrometer
Topic: Nanomanufacturing
Published: 6/16/2011
Authors: Joseph Terence Hodges, A. Cygan, Piotr Maslowski, Katarzyna Ewelina Bielska, S. Wojtewicz, J. Domyslawska, H Abe, R.S. Trawinski, R. Ciurylo
Abstract: We describe a high sensitivity and high spectral resolution laser absorption spectrometer based upon the frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) technique. We used the Pound-Drever-Hall (PDH) method to lock the probe laser to th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907960

35. Preface, Introduction and Chapter 11 to appear in the book Control from MEMS to Atoms
Topic: Nanomanufacturing
Published: 12/31/2012
Authors: Jason John Gorman, Benjamin Shapiro
Abstract: Preface Abstract: This is the preface of the book. No abstract is available. Introduction Abstract: The goal of this book is to show how control systems can be successfully applied to applications in micro- and nanosystems, to explore the wide v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907965

36. Rapid Prototyping of Nanofluidic Slits in a Silicone Bilayer
Topic: Nanomanufacturing
Published: 11/17/2015
Authors: Thomas Pedicino Kole, Kuo-Tang Liao, Daniel Robert Paul Schiffels, Bojan R Ilic, Elizabeth A Strychalski, Jason G Kralj, James Alexander Liddle, Anatoly Dritschilo, Samuel M Stavis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918788

37. Re-calibration of the NIST SRM 2059 Master Standard using Traceable Atomic Force Microscope Metrology
Topic: Nanomanufacturing
Published: 10/17/2008
Authors: Ronald G Dixson, James Edward Potzick, Ndubuisi George Orji
Abstract: The National Institute of Standards and Technology (NIST) has had a robust program in photomask dimensional metrology since the late 70s when the late Diana Nyyssonen and coworkers developed the first chrome-on-glass (COG) Standard Reference Materi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824724

38. Selective Area Growth of Ga- and N-polar GaN Nanowire Arrays on Non-Polar Si (111) Substrates
Topic: Nanomanufacturing
Published: 9/7/2014
Authors: Matthew David Brubaker, Shannon M.M. Duff, Todd E Harvey, Paul T Blanchard, Alexana Roshko, Aric Warner Sanders, Norman A Sanford, Kristine A Bertness
Abstract: This study presents a technique for obtaining Ga- and N-polar Gallium Nitride nanowire (GaN NW) arrays on non-polar Si (111) substrates by use of polarity-controlled AlN/GaN buffer layers. AlN films are demonstrated to adopt Al-/N-polarity for N ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915866

39. Simulated SEM Images for Resolution Measurement
Topic: Nanomanufacturing
Published: 7/30/2008
Authors: Petr Cizmar, Andras Vladar, Bin Ming, Michael T Postek
Abstract: Resolution is a key performance metric, which often defines the quality of a scanning electron microscope (SEM). Traditionally, there is the subjective measurement of the distance between two points on special ''resolution'' samples and there are sev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823050

40. Size-independent effects on nanoparticle retention behavior in asymmetric flow field-flow fractionation
Topic: Nanomanufacturing
Published: 5/29/2013
Authors: Julien C. Gigault, Vincent A Hackley
Abstract: In this work we highlight the size-independent influence of the material properties of nanoparticles on their retention behavior in asymmetric-flow field-flow fractionation (A4F). The phenomena described here suggest there are limits to the effec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913433



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