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You searched on: Topic Area: Nanomanufacturing

Displaying records 41 to 50 of 81 records.
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41. Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses
Topic: Nanomanufacturing
Published: 9/8/2009
Authors: Gordon Allan Shaw, Joseph J. Maurer, Steven Earl Fick, Thomas P Moffat, J. J. Mallett, John L. Hudson
Abstract: Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Beca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901052

42. Nanometrology Solutions Using an Ultra-High Resolution In-lens SEM
Topic: Nanomanufacturing
Published: 9/1/2009
Authors: Michael T Postek, Andras Vladar, John S Villarrubia
Abstract: The imaging and measurement of nanostructures such as particles, carbon nanotubes, and quantum dots have placed new demands on the high resolution imaging capabilities of scanning electron microscopes. A barrier to accurate dimensional metrology is t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902308

43. A Decade of Commitment from the NIST Manufacturing Engineering Laboratory to Nanomanufacturing and Nanometrology
Topic: Nanomanufacturing
Published: 8/27/2009
Authors: Kevin W Lyons, Michael T Postek
Abstract: Advanced research in nanomanufacturing technologies and processes has continued at an accelerating rate over the past decade. Profitable niche applications such as the use of carbon nanotubes for improving battery performance and nanoparticle-enhance ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902648

44. Methods for transferring the SI unit of force from millinewtons to piconewtons
Topic: Nanomanufacturing
Published: 6/1/2009
Authors: Gordon Allan Shaw, Koo-Hyun Chung, Douglas T Smith, Jon Robert Pratt
Abstract: The establishment of standards for small force measurement requires a link to an absolute measurement of force traceable to the international system of units (SI). To this end, a host of different means are being employed by the NIST small force meas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902346

45. Understanding Imaging and Metrology with the Helium Ion Microscope
Topic: Nanomanufacturing
Published: 3/1/2009
Authors: Michael T Postek, Andras Vladar, Bin Ming
Abstract: The development of accurate metrology for the characterization of nanomaterials is one barrier to innovation confronting all phases of nanotechnology. Ultra-high resolution microscopy is a key technology needed to achieve this goal. But, current micr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902394

46. 2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)
Topic: Nanomanufacturing
Published: 12/10/2008
Authors: Ronald G Dixson, Jon Robert Pratt, Vincent A Hackley, James Edward Potzick, Richard A Allen, Ndubuisi George Orji, Michael T Postek, Herbert S Bennett, Theodore Vincent Vorburger, Jeffrey A Fagan, Robert L. Watters
Abstract: A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for National Measurement Standards (NRC-INMS) on February 7, 2007 when the first Tri-National wo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824641

47. Blind estimation of general tip shape in AFM imaging
Topic: Nanomanufacturing
Published: 12/1/2008
Authors: Fenglei Tian, Xiaoping Qian, John S Villarrubia
Abstract: The use of flared tip and bi-directional servo control in some recent atomic force microscopes (AFM) has made it possible for these advanced AFMs to image structures of general shapes with undercuts and reentrant surfaces. Since AFM images are distor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824643

48. Helium Ion Microscopy and its Application to Nanotechnology and Nanometrology
Topic: Nanomanufacturing
Published: 11/4/2008
Authors: Michael T Postek, Andras Vladar
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824682

49. A COMPACT, COMPOUND ACTUATOR FOR THE MOLECULAR MEASURING MACHINE
Topic: Nanomanufacturing
Published: 10/19/2008
Authors: Jing Li, Yin-Lin Shen, Jaehwa Jeong, Fredric Scire, John A Kramar
Abstract: A compact, two-stage, vertical actuator with built-in sensors has been developed for the Molecular Measuring Machine (M3) and other potential precision instrumentation applications, such as scanning probe microscopy (SPM). In this article, we descri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824698

50. OPTIMIZING GAUSSIAN FILTER LONG WAVELENGTH CUTOFF »c FOR IMPROVING 3D BALLISTICS SIGNATURE CORRELATIONS
Topic: Nanomanufacturing
Published: 10/19/2008
Authors: Jun-Feng Song, Li Ma, Theodore Vincent Vorburger, Susan M Ballou
Abstract: In the ballistics measurements and correlations, optimum selection of c has particular importance for an unambiguous extraction of Individual Characteristics from the Class Characteristics . Poorly selected c might result in the Class Character ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824686



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