NIST logo

Publications Portal

You searched on:
Topic Area: Nanomanufacturing

Displaying records 31 to 40 of 76 records.
Resort by: Date / Title

31. AFM characterization of nanopositioner in-plane stiffnesses
Topic: Nanomanufacturing
Published: 8/19/2010
Authors: Seung Ho Yang, Yong Sik Kim, Premsagar Purushotham Kavuri, Jae Myung Yoo, Young M. Choi, Nicholas G Dagalakis
Abstract: A versatile method for measurement of in-plane stiffness of micro-elements was developed and its usefulness has been demonstrated. The in-plane stiffness of a NIST nanopositioner has been measured directly using a colloidal probe in an AFM without an ...

32. High-voltage Nanoimprint Lithography of Refractory Metal Film
Topic: Nanomanufacturing
Published: 7/1/2010
Authors: John A. Dagata, Natalia Farkas, R Ramsier
Abstract: Local oxidation of metal, semiconductor, and polymer surfaces has provided a common basis from which to explore fundamental principles of nanolithography and prototype functional nanostructures for many years now. This article summarizes an investiga ...

33. The Nanomechanical Properties of Thin Film of Type I Collagen Fibrils
Topic: Nanomanufacturing
Published: 3/2/2010
Authors: Koo-Hyun Chung, Kiran Bhadriraju, Tighe Spurlin, Robert Francis Cook, Anne L Plant
Abstract: Cells sense and respond to the mechanical properties of the substrate to which they adhere. Matrices composed of collagen have been an important experimental system to study cell responses to the stiffness of the extracellular matrix. We had previo ...

34. Measuring the Structure of Epitaxially Assembled Block Copolymer Domains with Soft X-ray Diffraction
Topic: Nanomanufacturing
Published: 11/30/2009
Authors: Gila Stein, James Alexander Liddle, Andrew Aquila, Eric M Gullikson
Abstract: The size, shape, and roughness of poly(styrene-b-methyl methacrylate) block copolymer domains assembled on an epitaxial template are characterized with soft x-ray diffraction. The domain size and shape are deformed when the dimensions of the epitax ...

35. Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment
Topic: Nanomanufacturing
Published: 9/25/2009
Authors: Ndubuisi George Orji, Ronald G Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
Abstract: A key requirement for nano-manufacturing is maintaining acceptable traceability of measurements performed to determine size. Given that properties and functionality at the nanoscale are governed by absolute size, maintaining the traceability of dimen ...

36. Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses
Topic: Nanomanufacturing
Published: 9/8/2009
Authors: Gordon Allan Shaw, Joseph J. Maurer, Steven Earl Fick, Thomas P Moffat, J. J. Mallett, John L. Hudson
Abstract: Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Beca ...

37. Nanometrology Solutions Using an Ultra-High Resolution In-lens SEM
Topic: Nanomanufacturing
Published: 9/1/2009
Authors: Michael T Postek, Andras Vladar, John S Villarrubia
Abstract: The imaging and measurement of nanostructures such as particles, carbon nanotubes, and quantum dots have placed new demands on the high resolution imaging capabilities of scanning electron microscopes. A barrier to accurate dimensional metrology is t ...

38. A Decade of Commitment from the NIST Manufacturing Engineering Laboratory to Nanomanufacturing and Nanometrology
Topic: Nanomanufacturing
Published: 8/27/2009
Authors: Kevin W Lyons, Michael T Postek
Abstract: Advanced research in nanomanufacturing technologies and processes has continued at an accelerating rate over the past decade. Profitable niche applications such as the use of carbon nanotubes for improving battery performance and nanoparticle-enhance ...

39. Methods for transferring the SI unit of force from millinewtons to piconewtons
Topic: Nanomanufacturing
Published: 6/1/2009
Authors: Gordon Allan Shaw, Koo-Hyun Chung, Douglas T Smith, Jon Robert Pratt
Abstract: The establishment of standards for small force measurement requires a link to an absolute measurement of force traceable to the international system of units (SI). To this end, a host of different means are being employed by the NIST small force meas ...

40. Understanding Imaging and Metrology with the Helium Ion Microscope
Topic: Nanomanufacturing
Published: 3/1/2009
Authors: Michael T Postek, Andras Vladar, Bin Ming
Abstract: The development of accurate metrology for the characterization of nanomaterials is one barrier to innovation confronting all phases of nanotechnology. Ultra-high resolution microscopy is a key technology needed to achieve this goal. But, current micr ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series