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Topic Area: Nanomanufacturing

Displaying records 31 to 40 of 80 records.
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31. Traceable Calibration of a Critical Dimension Atomic Force Microscope
Topic: Nanomanufacturing
Published: 6/6/2011
Authors: Ronald G Dixson, Ndubuisi George Orji, Craig Dyer McGray, Jon C Geist
Abstract: The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this effort is a custom in-house metrology AFM, called the calibrated AFM (C-AFM). The NI ...

32. Lithography, Metrology and Nanomanufacturing
Topic: Nanomanufacturing
Published: 4/12/2011
Authors: James Alexander Liddle, Gregg M. Gallatin
Abstract: Semiconductor chip manufacturing is by far the predominant nanomanufacturing technology in the world today. Top-down lithography techniques are used for fabrication of logic and memory chips since, in order to function, these chips must essentially b ...

33. The effect of growth orientation and diameter on the elasticity of GaN Nanowires - a combined insitu TEM and atomistic modeling investigation
Topic: Nanomanufacturing
Published: 12/20/2010
Authors: Kristine A Bertness, Norman A Sanford, Albert Davydov
Abstract: We characterized the elastic properties of GaN nanowires grown along different crystallographic orientations. In situ transmission electron microscopy tensile tests were conducted using a MEMS-based nanoscale testing system. Complementary atomistic s ...

34. Vision Guided Multi-Probe Assembly of 3D Microstructures
Topic: Nanomanufacturing
Published: 10/20/2010
Authors: John D. Wason, John T Wen, Young M. Choi, Jason John Gorman, Nicholas G Dagalakis
Abstract: This paper describes the operator assisted automated assembly of a 3-legged spatial platform by using a vision guided multi-probe assembly process. This is the first step towards the ultimate goal of building a microscale active spatial platform. Two ...

35. AFM characterization of nanopositioner in-plane stiffnesses
Topic: Nanomanufacturing
Published: 8/19/2010
Authors: Seung Ho Yang, Yong Sik Kim, Premsagar Purushotham Kavuri, Jae M. Yoo, Young M. Choi, Nicholas G Dagalakis
Abstract: A versatile method for measurement of in-plane stiffness of micro-elements was developed and its usefulness has been demonstrated. The in-plane stiffness of a NIST nanopositioner has been measured directly using a colloidal probe in an AFM without an ...

36. High-voltage Nanoimprint Lithography of Refractory Metal Film
Topic: Nanomanufacturing
Published: 7/1/2010
Authors: John A Dagata, Natalia Farkas, R Ramsier
Abstract: Local oxidation of metal, semiconductor, and polymer surfaces has provided a common basis from which to explore fundamental principles of nanolithography and prototype functional nanostructures for many years now. This article summarizes an investiga ...

37. The Nanomechanical Properties of Thin Film of Type I Collagen Fibrils
Topic: Nanomanufacturing
Published: 3/2/2010
Authors: Koo-Hyun Chung, Kiran Bhadriraju, Tighe Spurlin, Robert Francis Cook, Anne L Plant
Abstract: Cells sense and respond to the mechanical properties of the substrate to which they adhere. Matrices composed of collagen have been an important experimental system to study cell responses to the stiffness of the extracellular matrix. We had previo ...

38. Measuring the Structure of Epitaxially Assembled Block Copolymer Domains with Soft X-ray Diffraction
Topic: Nanomanufacturing
Published: 11/30/2009
Authors: Gila Stein, James Alexander Liddle, Andrew Aquila, Eric M Gullikson
Abstract: The size, shape, and roughness of poly(styrene-b-methyl methacrylate) block copolymer domains assembled on an epitaxial template are characterized with soft x-ray diffraction. The domain size and shape are deformed when the dimensions of the epitax ...

39. Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment
Topic: Nanomanufacturing
Published: 9/25/2009
Authors: Ndubuisi George Orji, Ronald G Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
Abstract: A key requirement for nano-manufacturing is maintaining acceptable traceability of measurements performed to determine size. Given that properties and functionality at the nanoscale are governed by absolute size, maintaining the traceability of dimen ...

40. Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses
Topic: Nanomanufacturing
Published: 9/8/2009
Authors: Gordon Allan Shaw, Joseph J. Maurer, Steven Earl Fick, Thomas P Moffat, J. J. Mallett, John L. Hudson
Abstract: Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Beca ...

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