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Topic Area: Metrology
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Displaying records 811 to 820 of 855 records.
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811. Uncertainty Analysis for Angle Calibrations Using Circle Closure
Topic: Metrology
Published: 3/1/1998
Author: William Tyler Estler
Abstract: We analyze two types of full-circle angle calibrations: a simple closure in which a single set of unknown angular segments is sequentially compared with an unknown reference angle, and a dual closure in which two divided circles are simultaneously ca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820892

812. Uncertainty Analysis for Angle Calibrations Using Circle Closure
Series: Journal of Research (NIST JRES)
Topic: Metrology
Published: 3/1/1998
Author: William Tyler Estler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823098

813. Uncertainty Due to Finite Resolution Measurements
Topic: Metrology
Published: 1/1/2004
Authors: Steven David Phillips, B Tolman, William Tyler Estler
Abstract: We investigate the influence of finite resolution on measurement uncertainty from a perspective of the Guide to the Expression of Uncertainty in Measurement (GUM). Finite resolution in the presence of Gaussian noise yields a distribution of results t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822244

814. Uncertainty Estimation for Multiposition Form Error Metrology
Topic: Metrology
Published: 9/1/1997
Authors: William Tyler Estler, Christopher J. Evans, Lianzhen Shao
Abstract: We analyze a general multiposition comparator measurement procedure that leads to partial removal of artifact error for a class of problems including roundness metrology, measurement of radial error motions of precision spindles, and figure error met ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820842

815. Uncertainty Procedure for NIST Surface Finish and Microform Calibration
Topic: Metrology
Published: 1/1/1996
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: An uncertainty procedure is used for reporting the NIST surface finish and microform calibration uncertainties. The combined standard uncertainty is a combination of the uncertainty from the geometric non-uniformity of the measured surface, and the u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820822

816. Uncertainty and Dimensional Calibrations
Topic: Metrology
Published: 11/1/1997
Authors: Theodore D Doiron, John Richard Stoup
Abstract: The calculation of uncertainty for a measurement is an effort to set reasonable bounds for the measurement result according to standardized rules. Since every measurement produces only an estimate of the answer, the primary requisite of an uncertaint ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820840

817. Uncertainty in Measurement of the Maximum Cutting Tool Temperature by Infrared Thermography
Topic: Metrology
Published: 6/13/2014
Authors: Brandon M Lane, Eric Paul Whitenton, Viswanathan Madhavan, M Alkan Donmez
Abstract: This paper presents an analysis of the uncertainty in measurement of the peak temperature on the side face of a cutting tool by infrared thermography. An analytical method uses the temperature measurement equation to study the uncertainty arising f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915534

818. Uncertainty of temperature measurements by infrared thermography for metal cutting applications
Topic: Metrology
Published: 12/31/2013
Authors: Brandon M Lane, Eric Paul Whitenton, Viswanathan Madhavan, M Alkan Donmez
Abstract: This paper presents the methodology and results of a comprehensive measurement uncertainty analysis for infrared thermography of a cutting tool during the metal cutting process. The analysis is based on a commercial off-the-shelf (COTS) camera, ty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913632

819. Understanding Scanned Probe Oxidation of Silicon
Topic: Metrology
Published: 1/1/1998
Authors: John A Dagata, T Inoue, J Itoh, H Yokoyama
Abstract: A model for scanned probe microscope (SPM) silicon oxidation is presented. The model was derived from a consideration of the space-charge dependence of this solid-state reaction as a function of substrate doping type/level and has been verified exper ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821775

820. Unified Advanced CD-SEM specification for Sub-0.18um Technology (1999 Version)
Topic: Metrology
Published: 1/31/2000
Authors: J Allgair, C Archie, W Banke, H Bogardus, A Delaporte, Michael T Postek, J Schlesinger, B Singh, Andras Vladar, A Yanof
Abstract: The Advanced Metrology Advisory Group (AMAG) comprised of representatives from: the International SEMATECH (ISEMATECH) consortium member companies; the National Institute of Standards and Technology; and ISEMATECH assignees have joined to develop a u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823125



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