NIST logo

Publications Portal

You searched on: Topic Area: Metrology Sorted by: title

Displaying records 21 to 30 of 83 records.
Resort by: Date / Title


21. Description and Uncertainty Analysis of NIST‰s 20 Liter Hydrocarbon Liquid Flow Standard (20 L HLFS)
Topic: Metrology
Published: 10/15/2010
Authors: Aaron N Johnson, Christopher J. Crowley, Tsyh Tyan Yeh
Abstract: The National Institute of Standards and Technology (NIST) uses a bi-directional piston prover as its primary standard for measuring hydrocarbon liquid flows ranging from 1.86 × 10-5 m3/s (0.3 gpm) to 2.6 × 10-3 m3/s (40 gpm). An uncertainty analysis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906350

22. Design And Fabrication Of MJTCs On Quartz Substrates At NIST
Topic: Metrology
Published: 6/1/2008
Authors: Thomas E Lipe, Joseph R. Mr. (Joseph R.) Kinard Jr., Luciana Scarioni
Abstract: Wet and dry etching are employed in the fabrication of new planar, thin-film multijunction thermal converters (MJTCs) on quartz membranes and crystalline quartz chips at NIST. The use of crystalline quartz as a material for the membrane and for the c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33053

23. Development of Standard Test Methods for Unmanned and Manned Industrial Vehicles Used Near Humans
Topic: Metrology
Published: 5/3/2013
Authors: Roger V Bostelman, Richard J Norcross, Joseph A Falco, Jeremy A Marvel
Abstract: The National Institute of Standards and Technology (NIST) has been researching human-robot/vehicle collaborative environments for automated guided vehicles (AGVs) and manned forklifts. Safety of AGVs and manned vehicles with automated functions (e.g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913625

24. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Metrology
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian John Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

25. Embedded Capacitive Displacement Sensor for Nanopositioning Applications
Topic: Metrology
Published: 8/17/2010
Authors: Svetlana Avramov-Zamurovic1, Nicholas G Dagalakis, Rae Duk Lee, Yong Sik Kim, Jae M. Yoo, Seung Ho Yang
Abstract: The scale of nano objects requires very precise position determination. The state-of-the-art manipulators involve accurate nanometer positioning. This paper presents the design of a capacitive displacement sensor for a nanopositioning application. Th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906019

26. Factory Equipment Network Testing Framework: Concept, Requirements, and Architecture
Series: Technical Note (NIST TN)
Report Number: 1755
Topic: Metrology
Published: 9/17/2012
Authors: James D Gilsinn, Kang B Lee, John L Michaloski, Frederick M Proctor, Yuyin Song
Abstract: This document describes the purpose, concept, requirements, and architecture for the Factory Equipment Network Testing (FENT) Framework and the software to test equipment on real-time factory networks. Other documents contain more detailed info ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911180

27. Factory Equipment Network Testing Framework: Universal Client Application, Application Programming Interface
Series: Technical Note (NIST TN)
Report Number: 1754
Topic: Metrology
Published: 9/17/2012
Authors: James D Gilsinn, Kang B Lee, John L Michaloski, Frederick M Proctor, Yuyin Song
Abstract: This document describes the application programming interface (API) used by the Factory Equipment Network Testing (FENT) Framework to communicate between the main Universal Client Application (UCA) and the Personality Module (PM). This API abstra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911181

28. Feasibility of an Accurate Dynamic Standard for Water Flow
Topic: Metrology
Published: 6/1/2010
Authors: Iosif I Shinder, Michael R Moldover
Abstract: We used NIST's primary water flow standard to study the feasibility of accurately determining mass flow rates {I}m{/I}^ddot^ of water "dynamically," that is from the time derivative of the weight {I}W{/I} of the collection tank: {I}m{/I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832344

29. Fiber orientation angle effects in machining of unidirectional CFRP laminated composites
Topic: Metrology
Published: 6/13/2014
Authors: Viswanathan Madhavan, Gary Lipczynski, Brandon M Lane, Eric Paul Whitenton
Abstract: Experiments were carried out at the National Institute of Standards and Technology, in collaboration with The Boeing Company, to obtain force and temperature data as a function of feed, speed and fiber orientation angle (FOA), for validation of finit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915409

30. Gas Flowmeter Calibrations with the 34 L and 677 L PVTt Standards
Series: Special Publication (NIST SP)
Topic: Metrology
Published: 6/23/2004
Authors: John D Wright, Aaron N Johnson, Michael R Moldover, Gina M Kline
Abstract: This document provides a description of the 34 L and 677 L pressure, volume, temperature, and time (PVTt) primary gas flow standards operated by the National Institute of Standards and Technology (NIST) Fluid Flow Group. These facilities are used to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830866



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series