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Displaying records 21 to 30 of 88 records.
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21. Control Fusion for Safe Multi-robot Coordination
Topic: Metrology
Published: 5/9/2014
Authors: Roger V Bostelman, Jeremy A Marvel
Abstract: Future smart manufacturing systems will include more complex coordination of mobile manipulators (e.g., robot arms mounted on mobile bases). The National Institute of Standards and Technology, Performance of Collaborative Robot Systems Project has b ...

22. Cylindrical Acoustic Resonator for the Re-determination of the Boltzmann Constant
Topic: Metrology
Published: 6/1/2010
Authors: J.T. Zhang, H. Lin, X.J. Feng, Keith A Gillis, Michael R Moldover
Abstract: We describe progress towards re-determining the Boltzmann constant {I}k{/I}^dB^ using two fixed-path, gas-filled, cylindrical, acoustic cavity resonators. The longitudinal acoustic resonance modes of a cylindrical cavity have lower quality factors {I ...

23. DYNAMIC PERCEPTION WORKSHOP REPORT: Requirements and Standards for Advanced Manufacturing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7664
Topic: Metrology
Published: 1/14/2010
Authors: Tsai Hong Hong, Elena R Messina, Hui-Min Huang, Michael O Shneier, Roger D. Eastman, Jane Shi, James Wells
Abstract: The Dynamic Perception workshop was intended to further the development of standardized, reproducible, and portable test methods that can advance the technology of sensors and perception systems for new, flexible robotic and automation applications i ...

24. Description and Uncertainty Analysis of NIST‰s 20 Liter Hydrocarbon Liquid Flow Standard (20 L HLFS)
Topic: Metrology
Published: 10/15/2010
Authors: Aaron N Johnson, Christopher J. Crowley, Tsyh Tyan Yeh
Abstract: The National Institute of Standards and Technology (NIST) uses a bi-directional piston prover as its primary standard for measuring hydrocarbon liquid flows ranging from 1.86 × 10-5 m3/s (0.3 gpm) to 2.6 × 10-3 m3/s (40 gpm). An uncertainty analysis ...

25. Design And Fabrication Of MJTCs On Quartz Substrates At NIST
Topic: Metrology
Published: 6/1/2008
Authors: Thomas E Lipe, Joseph R. Mr. (Joseph R.) Kinard Jr., Luciana Scarioni
Abstract: Wet and dry etching are employed in the fabrication of new planar, thin-film multijunction thermal converters (MJTCs) on quartz membranes and crystalline quartz chips at NIST. The use of crystalline quartz as a material for the membrane and for the c ...

26. Development of Standard Test Methods for Unmanned and Manned Industrial Vehicles Used Near Humans
Topic: Metrology
Published: 5/3/2013
Authors: Roger V Bostelman, Richard J Norcross, Joseph A Falco, Jeremy A Marvel
Abstract: The National Institute of Standards and Technology (NIST) has been researching human-robot/vehicle collaborative environments for automated guided vehicles (AGVs) and manned forklifts. Safety of AGVs and manned vehicles with automated functions (e.g ...

27. Development of an Ultra-Pure, Carrier-Free 209Po Solution Standard
Series: Journal of Research (NIST JRES)
Topic: Metrology
Published: 7/23/2015
Authors: Ronald Colle, Ryan P Fitzgerald, Lizbeth Laureano-Perez
Abstract: Ultra-pure, carrier-free 209Po solution standards have been prepared and standardized for their massic alpha-particle emission rate. The standards, which will be disseminated by the National Institute of Standards and Technology (NIST) as Standard Re ...

28. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Metrology
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian John Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...

29. Embedded Capacitive Displacement Sensor for Nanopositioning Applications
Topic: Metrology
Published: 8/17/2010
Authors: Svetlana Avramov-Zamurovic1, Nicholas G Dagalakis, Rae Duk Lee, Yong Sik Kim, Jae M. Yoo, Seung Ho Yang
Abstract: The scale of nano objects requires very precise position determination. The state-of-the-art manipulators involve accurate nanometer positioning. This paper presents the design of a capacitive displacement sensor for a nanopositioning application. Th ...

30. Factory Equipment Network Testing Framework: Concept, Requirements, and Architecture
Series: Technical Note (NIST TN)
Report Number: 1755
Topic: Metrology
Published: 9/17/2012
Authors: James D Gilsinn, Kang B Lee, John L Michaloski, Frederick M Proctor, Yuyin Song
Abstract: This document describes the purpose, concept, requirements, and architecture for the Factory Equipment Network Testing (FENT) Framework and the software to test equipment on real-time factory networks. Other documents contain more detailed info ...

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