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Topic Area: Metrology
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Displaying records 21 to 30 of 846 records.
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21. A Differential Wavelength Meter for Laser Tuning
Topic: Metrology
Published: 1/1/1997
Authors: Lowell P. Howard, Jack A Stone Jr
Abstract: A simple interferometer for matching the wavelengths of tunable lasers is described. Our interferometer uses the angular dispersion of a diffraction grating at the Littrow angle to produce a tilted wavefront with respect to a reference mirror in an o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820845

22. A Distribution-Independent Bound on the Level of Confidence in the Result of a Measurement
Topic: Metrology
Published: 9/1/1997
Author: William Tyler Estler
Abstract: The Bienaym?-Chebyshev Inequality provides a quantitative bound on the level of confidence of a measurement with known combined standard uncertainty and assumed coverage factor. The result is independent of the detailed nature of the probability dist ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820841

23. A Fast Algorithm for Determining the Gaussian Filter Mean Line in Surface Metrology
Topic: Metrology
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823110

24. A Fast Algorithm for Determining the Gaussian Filtered Mean Line in Surface Metrology
Topic: Metrology
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820993

25. A Fiber Probe for CMM Measurements of Small Features
Topic: Metrology
Published: 8/1/2005
Authors: Jack A Stone Jr, Balasubramanian Muralikrishnan, John Richard Stoup
Abstract: We report on performance of a new form of fiber probe, which can be used in conjunction with a coordinate measuring machine (CMM) for microfeature measurement.  The probe stylus is a glass fiber with a small ball (?75 ?m diameter) glued to the e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823194

26. A First Step Toward Photorealistic Rendering of Coated Surfaces and Computer-Based Standards of Appearance
Topic: Metrology
Published: 1/1/2001
Authors: Fern Y Hunt, Egon Marx, G Meyer, Theodore Vincent Vorburger, P Walker, H Westlund
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821772

27. A First Step Towards Photorealistic Rendering of Coated Surfaces and Computer Based Standards of Appearance
Topic: Metrology
Published: 1/1/2001
Authors: Fern Y Hunt, Egon Marx, G Meyer, Theodore Vincent Vorburger, P Walker, H Westlund
Abstract: We seek to explore the feasibility of producing computer graphic images to visualize the color and gloss of surfaces using optical and surface topographical data.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822453

28. A Flexible System Framework for a Nanoassembly Cell Using Optical Tweezers
Topic: Metrology
Published: 1/1/2006
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, Satyandra K. Gupta
Abstract: The optical tweezers instrument is a unique tool for directed assembly of nanocomponents. In order to function as a viable nanomanufacturing tool, a software architecture is needed to run the optical tweezers hardware, provide an effective user inter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823209

29. A Flexure Balance With Adjustable Restoring Torque for Nanonewton Force Measurement
Topic: Metrology
Published: 1/1/2002
Authors: Jon Robert Pratt, David B Newell, John A Kramar
Abstract: The NIST electrostatic force balance compares mechanical probe forces to an SI realization of force derived from measurements of the capacitance gradient and voltage in an electronic null balance. As we approach the nanonewton regime, the finite stif ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822422

30. A Frequency Stabilized Laser Array for Use in Displacement Metrology
Topic: Metrology
Published: 2/17/2000
Authors: J Pedulla, R Deslattes, John Russell Lawall
Abstract: We have developed a frequency stabilized laser system to supply light to measure atomic-scale displacements of a stage moved in real time. Each laser in the array provides enough power (~1 mW) for four Michelson interferometers whose accuracy require ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822455



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