NIST logo

Publications Portal

You searched on: Topic Area: Metrology Sorted by: title

Displaying records 11 to 20 of 85 records.
Resort by: Date / Title


11. An improved L1 based algorithm for standardized planar datum establishment
Topic: Metrology
Published: 10/1/2014
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: This paper has two major goals. First, we present an algorithm for establishing planar datums suitable for a default in tolerancing standards. The algorithm is based on a constrained minimization search based on the L_1 (L1) norm after forming a conv ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916075

12. Analysis of Dimensional Metrology Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6847
Topic: Metrology
Published: 6/1/2001
Authors: Thomas Rollin Kramer, John Evans, Simon Paul Frechette, John A Horst, Hui-Min Huang, Elena R Messina, Frederick M Proctor, William G Rippey, Harry A. Scott, Theodore Vincent Vorburger, Albert J. Wavering
Abstract: This is an analysis of standards related to dimensional metrology, with recommendations regarding standards development. The analysis focuses on the degree to which existing and developing standards provide a complete set of non-overlapping specifica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821714

13. Assessment of Real-Time Factory Performance through the Application of Multi-Relationship Evaluation Design
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7911
Topic: Metrology
Published: 4/17/2013
Authors: Brian A Weiss, John A Horst, Frederick M Proctor
Abstract: Successful operations within manufacturing environments require both accurate and precise information flow from one operation to the next. Incorrect, too little, or too much information can slow the manufacturing process and/or result in poor qua ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912784

14. Calibration of Laminar Flow Meters for Process Gases
Topic: Metrology
Published: 6/1/2012
Authors: John D Wright, Thiago Cobu, Robert F Berg, Michael R Moldover
Abstract: We calibrated three models of commercially-manufactured, laminar flow meters (LFMs) at four pressures (100 kPa, 200 kPa, 300 kPa, and 400 kPa) with five gases (N2, Ar, He, CO2, and SF6) over a 10:1 flow range using NIST‰s primary flow standards as re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908560

15. Capacitors and Electromagnetic Resonators for Gas Metrology
Topic: Metrology
Published: 5/1/2007
Authors: Michael R Moldover, James W Schmidt
Abstract: Gas-filled capacitors are being used as primary thermometers and they show promise as primary pressure standards and for measuring the Boltzmann constant. With these metrological applications in mind, we discuss the advantages and disadvantages of a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830986

16. Choosing test positions for laser tracker evaluation and future Standards development
Topic: Metrology
Published: 7/15/2010
Authors: Balasubramanian Muralikrishnan, Daniel S Sawyer, Christopher J Blackburn, Steven David Phillips, Craig M Shakarji, Ed Morse, Robert Bridges
Abstract: A working group within the ISO TC 213 committee is developing a draft document [11] for evaluating the performance of laser trackers. The ASME B89.4.19 Standard [1] and the draft VDI/VDE 2617 part 10 [2] describe some useful tests that are incorporat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905959

17. Confocal Microscopy Analysis of Breech Face Marks on Fired Cartridge Cases from Ten Consecutively Manufactured Pistol Slides
Topic: Metrology
Published: 7/1/2012
Authors: Xiaoyu A Zheng, Robert Meryln Thompson, Todd Weller
Abstract: Ten (10) pistol slides with consecutively manufactured breech faces, were obtained from Sturm, Ruger Co, Inc. A total of nine (9) test fires from each pistol, for a total of ninety (90) test fired cartridge cases, were compared using comparison micr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906690

18. Control Fusion for Safe Multi-robot Coordination
Topic: Metrology
Published: 5/9/2014
Authors: Roger V Bostelman, Jeremy A Marvel
Abstract: Future smart manufacturing systems will include more complex coordination of mobile manipulators (e.g., robot arms mounted on mobile bases). The National Institute of Standards and Technology, Performance of Collaborative Robot Systems Project has b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915915

19. Cylindrical Acoustic Resonator for the Re-determination of the Boltzmann Constant
Topic: Metrology
Published: 6/1/2010
Authors: J.T. Zhang, H. Lin, X.J. Feng, Keith A Gillis, Michael R Moldover
Abstract: We describe progress towards re-determining the Boltzmann constant {I}k{/I}^dB^ using two fixed-path, gas-filled, cylindrical, acoustic cavity resonators. The longitudinal acoustic resonance modes of a cylindrical cavity have lower quality factors {I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905511

20. DYNAMIC PERCEPTION WORKSHOP REPORT: Requirements and Standards for Advanced Manufacturing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7664
Topic: Metrology
Published: 1/14/2010
Authors: Tsai Hong Hong, Elena R Messina, Hui-Min Huang, Michael O Shneier, Roger D. Eastman, Jane Shi, James Wells
Abstract: The Dynamic Perception workshop was intended to further the development of standardized, reproducible, and portable test methods that can advance the technology of sensors and perception systems for new, flexible robotic and automation applications i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904612



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series