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Topic Area: Metrology
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Displaying records 791 to 800 of 850 records.
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791. Parameters Characterizing a Critical Dimension Measurement
Topic: Metrology
Published: 12/1/1994
Authors: Robert D. Larrabee, Michael T Postek
Abstract: There are a number of parameters used to characterize a measurement result for the purposes of specifying its value for the intended purpose. Precision (variability) and accuracy (correctness) are two of the more often used parameters and, like many ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820687

792. Ambient and Vacuum Scanning Tunneling Spectroscopy of Sulfur and Oxygen-Terminated Gallium Arsenide
Topic: Metrology
Published: 11/1/1994
Authors: Richard M Silver, John A. Dagata, H. W. Tseng
Abstract: Tunneling spectroscopy of sulfur- and oxygen-terminated n- and p-type GaAs (110) surfaces is reported for air and ultrahigh-vacuum conditions. Simulations of the complete I-V characteristics with explicit inclusion of surface states within the planar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820713

793. Comprehensive Study of Parameters for Characterizing 3-D Surface Topography III: Parameters for Amplitude and Some Functional Properties
Topic: Metrology
Published: 11/1/1994
Authors: W Dong, P Sullivan, K Stout
Abstract: It is recognized that profiling techniques have been widely used in industry and academic research for manufacturing control and functional control of surface roughness, in some cases, however, the profiling techniques and two-dimensional (2D) parame ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820679

794. Comprehensive Study of Parameters for Characterizing 3-D Surface Topography IV: Parameters for Characterizing Spatial and Hybrid Properties
Topic: Metrology
Published: 11/1/1994
Authors: W Dong, P Sullivan, K Stout
Abstract: This is the last part in a series of reports describing a comprehensive study of parameters to characterize three-dimensional surface topography. In conjunction with other parts of the report, this paper deals with parameters used to characterize spa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820680

795. A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer-Practical Implementation
Topic: Metrology
Published: 10/1/1994
Authors: P Sullivan, Christopher J. Evans
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820719

796. Dynamics and Structure of Self-Assembled Organic Molecules at the Solid-Liquid Interface
Topic: Metrology
Published: 10/1/1994
Authors: J Jorgensen, N Shcmeisser, J Garnaes, L Madsen, K Schaumburg, Larry Hansen
Abstract: We have analysed scanning tunnelling microscopc (STM) images of self-assembled didodecylbenzene (DDB) molecules physisorbed on graphite from a DDB solution using octylbenzene as solvent. The DDB images were obtained alternating with images of the gra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820685

797. Design of an Atomic Force Microscope with Interferometric Position Control
Topic: Metrology
Published: 8/19/1994
Authors: J Schneir, T Mcwaid, J Alexander, B Wilfley
Abstract: Advances in the manufacture of integrated circuits, x?ray optics, magnetic read-write heads, optical data storage media, and razor blades require advances in ultraprecision metrology. Each of these industries is currently investigating the use of ato ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820710

798. Radiation Scattered by Two Touching Spheres
Topic: Metrology
Published: 6/20/1994
Author: Egon Marx
Abstract: During the manufacture of powder metal, the size distribution of the metal spheres can be determined to some extent by the distribution of light scattered by the spheres while they are streaming by a laser beam. Micrographs show the presence of chain ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820692

799. National Institute of Standards and Technology (NIST) J93 Project Proposal Report
Topic: Metrology
Published: 6/15/1994
Authors: Michael T Postek, Robert D. Larrabee, L Linholm, James Edward Potzick, J Schneir, T Mcwaid, Michael W Cresswell, Richard A Allen, E Clayton Teague
Abstract: Unavailable.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820703

800. A Users' Guide to NIST SRM 2084: CMM Probe Performance Standards
Topic: Metrology
Published: 6/1/1994
Authors: Gregory W Caskey, Steven David Phillips, Bruce R. Borchardt, David E Ward, Daniel S Sawyer
Abstract: Standard Reference Materials (SRMs) as defined by the National Institute of Standards and Technology (NIST) are well-characterized materials, produced in quantity and certified for one or more physical or chemical properties. They are used to assure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820674



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