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Topic Area: Metrology

Displaying records 841 to 846.
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841. Proposed Coating Technology Consortium
Topic: Metrology
Published: 4/1/1993
Author: Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902032

842. Regimes of Surface Roughness Measurable with Light Scattering
Topic: Metrology
Published: 1/1/1993
Authors: Theodore Vincent Vorburger, Egon Marx, T Lettieri
Abstract: In this paper we summarize a number of previous experiments on the measurement of the roughness of metallic surfaces by light scattering. We identify several regimes that permit measurement of different surface parameters and functions, and we establ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821000

843. Surface Metrology of Soft X-ray Optics
Topic: Metrology
Published: 1/1/1993
Authors: Theodore Vincent Vorburger, T. McWade, Joseph Fu, Christopher J. Evans, William Tyler Estler, R Parks
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901970

844. XUV Optics Characterization at the National Institute of Standards and Technology
Topic: Metrology
Published: 1/1/1993
Authors: R N. Watts, Charles S Tarrio, Thomas B Lucatorto, R P. Madden, R Deslattes, Ariel Caticha, William Tyler Estler, Christopher J. Evans, T. McWade, Joseph Fu, Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901965

845. Establishing a World-Wide Unified Rockwell Hardness Scale Using Standard Diamond Indenters
Topic: Metrology
Published: Date unknown
Authors: S Desogus, A Germak, H Ishida, T Polzin, H Yang, Jun-Feng Song, Samuel Rea Low III, David J Pitchure
Abstract: Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. It is now possible to establish standard grade Rockwell diamond indenters characterized by high geometry uni ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822526

846. Imaging Optics and CCD Camera Characterization for Metrology
Topic: Metrology
Published: Date unknown
Authors: S Fox, Edward A Kornegay, Richard M Silver
Abstract: Optical semiconductor characterization and metrology rely heavily on digital camera imaging and its associated optical imaging systems. This work characterizes the performance of a widely used, commercially available camera and compares its performan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820962



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