NIST logo

Publications Portal

You searched on:
Topic Area: Metrology

Displaying records 831 to 840 of 854 records.
Resort by: Date / Title


831. Precision Engineering/Precision Optics in Japan:  Status, Technology and Culture
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5491
Topic: Metrology
Published: 1/1/1994
Author: Christopher J. Evans
Abstract: Precision engineering and precision optics are commercially and strategically important enabling technologies. The character of precision engineering research and development in Japan is different from that in the U.S. and Europe; these differences a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820681

832. Rapid Post-Polishing of Diamond-Turned Optics
Topic: Metrology
Published: 1/1/1994
Authors: R E. Parks, Christopher J. Evans
Abstract: A simple technique for post-polishing single-point, diamond-turned optics is described. Synthetic fabric-faced laps are used. Surface finish converges to a limiting value set by process parameters. Lap construction and diamond grit size affects both ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820697

833. Scanning Electron Microscope Metrology
Topic: Metrology
Published: 1/1/1994
Author: Michael T Postek
Abstract: During the manufacturing of present-day integrated circuits, certain measurements must be made of the submicrometer structures composing the device with a high degree of precision. Optical microscopy, scanning electron microscopy and the various form ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820702

834. Some Considerations for a Measurement Strategy for Circular Features
Topic: Metrology
Published: 1/1/1994
Authors: Howard H. Harary, C Buchard, P L heritier, J Dufraigne, P Chollet
Abstract: The careful study of manufactured parts is a prerequisite for their intelligent inspection. For this study, we conducted a survey of the processes for making holes by manufacturing a set of test parts using ten different machining processes. The hole ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820683

835. Standards for Coordinate Measuring Machines,
Topic: Metrology
Published: 1/1/1994
Authors: Steven David Phillips, Bruce R. Borchardt, Gregory W Caskey, David E Ward, Daniel S Sawyer, P Snoots, K Harrell
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820699

836. Strategy for Post-Process Control of a Machine Tool
Topic: Metrology
Published: 1/1/1994
Authors: Theodore Vincent Vorburger, K Yee, Brian R Scace, F Rudder
Abstract: The automated control of machine-tool accuracy is discussed based on a quality architecture containing three control loops: real-time, process-intermittent, and post-process. This paper highlights the post-process loop. The architecture is being impl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820726

837. TOF-SIMS Imaging of STM-Modified Semiconductor Surfaces
Topic: Metrology
Published: 1/1/1994
Authors: J. Bennett, John A. Dagata
Abstract: Not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820670

838. The Design of an Atomic Force Microscope for Metrology
Topic: Metrology
Published: 1/1/1994
Authors: T Mcwaid, J Schneir
Abstract: Atomic force microscope (AFM) is a rapidly evolving technique which has been used in numerous academic studies since its invention eight years ago. AFM manufacturers are now marketing instruments for industrial metrology applications. The National In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820694

839. The Development of a Calibrated Atomic Force Microscope
Topic: Metrology
Published: 1/1/1994
Authors: T Mcwaid, J Schneir
Abstract: Advances in the manufacture of integrated circuits, x-ray optics, magnetic read-write heads, optical data storage media, razor blades, etc. require advances in ultraprecision metrology. Each of these industries is currently investigating the use of A ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820695

840. The Geometric Characterization of Rockwell Diamond Indenters
Topic: Metrology
Published: 1/1/1994
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, A Hartman, Brian R Scace, J Smith
Abstract: By using a stylus instrument, a series of calibration and check standards, and calibration and uncertainty calculation procedures, we have calibrated Rockwell diamond indenters with a traceability to fundamental measurements. The combined measurement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820714



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series