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You searched on: Topic Area: Metrology

Displaying records 61 to 70 of 91 records.
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61. Methodology for evaluating Static six-degree-of-freedom (6DoF) Perception Systems
Topic: Metrology
Published: 10/15/2010
Authors: Tommy Chang, Tsai Hong Hong, Joseph A Falco, Michael O Shneier, Milli Shah, Roger D Eastman
Abstract: In this paper, we apply two fundamental approaches toward evaluating a static, vision based, six-degree-of-freedom (6DoF) pose determination system that measures the position and orientation of a part. The first approach uses ground\-truth carefully ...

62. Properties for Accurate Gas Flow Measurements
Topic: Metrology
Published: 10/15/2010
Author: John D Wright
Abstract: Accurate gas properties are needed to take full advantage of the low uncertainties provided by NIST‰s Gas Flow Calibration Services. If a flowmeter user and NIST use different values for these properties (molecular mass, compressibility, density, vis ...

63. Embedded Capacitive Displacement Sensor for Nanopositioning Applications
Topic: Metrology
Published: 8/17/2010
Authors: Svetlana Avramov-Zamurovic1, Nicholas G Dagalakis, Rae Duk Lee, Yong Sik Kim, Jae M. Yoo, Seung Ho Yang
Abstract: The scale of nano objects requires very precise position determination. The state-of-the-art manipulators involve accurate nanometer positioning. This paper presents the design of a capacitive displacement sensor for a nanopositioning application. Th ...

64. Choosing test positions for laser tracker evaluation and future Standards development
Topic: Metrology
Published: 7/15/2010
Authors: Balasubramanian Muralikrishnan, Daniel S Sawyer, Christopher J Blackburn, Steven David Phillips, Craig M Shakarji, Ed Morse, Robert Bridges
Abstract: A working group within the ISO TC 213 committee is developing a draft document [11] for evaluating the performance of laser trackers. The ASME B89.4.19 Standard [1] and the draft VDI/VDE 2617 part 10 [2] describe some useful tests that are incorporat ...

65. Cylindrical Acoustic Resonator for the Re-determination of the Boltzmann Constant
Topic: Metrology
Published: 6/1/2010
Authors: J.T. Zhang, H. Lin, X.J. Feng, Keith A Gillis, Michael R Moldover
Abstract: We describe progress towards re-determining the Boltzmann constant {I}k{/I}^dB^ using two fixed-path, gas-filled, cylindrical, acoustic cavity resonators. The longitudinal acoustic resonance modes of a cylindrical cavity have lower quality factors {I ...

66. Feasibility of an Accurate Dynamic Standard for Water Flow
Topic: Metrology
Published: 6/1/2010
Authors: Iosif I Shinder, Michael R Moldover
Abstract: We used NIST's primary water flow standard to study the feasibility of accurately determining mass flow rates {I}m{/I}^ddot^ of water "dynamically," that is from the time derivative of the weight {I}W{/I} of the collection tank: {I}m{/I ...

67. Modeling and metrology of metallic nanowires with application to microwave interconnects
Topic: Metrology
Published: 5/23/2010
Authors: Kichul Kim, Thomas M Wallis, Paul Rice, Chin J. Chiang, Atif A. Imtiaz, Pavel Kabos, Jintao Zhang
Abstract: Abstract: Broadband characterization of individual metallic nanowires for microwave interconnect applications is discussed. Circuit and method of moments (MoM) modeling are benchmarked using a set of coplanar waveguide (CPW) test devices with microw ...

68. Performance of Critical Flow Venturis under Transient Conditions
Topic: Metrology
Published: 4/13/2010
Author: John D Wright
Abstract: Critical flow venturis (CFVs) can be used to measure flow under transient pressure and flow conditions with uncertainties of 0.13 % or less (95 % confidence level). Blow-down tests transferred 630 g of nitrogen during a 100 s interval from an unregul ...

69. The Limits and Extensibility of Optical Patterned Defect Inspection
Topic: Metrology
Published: 4/1/2010
Authors: Richard M Silver, Bryan M Barnes, Martin Y Sohn, Richard Quintanilha, Hui Zhou, Chris Deeb, Mark Johnson, Milton Goodwin, Dilip Patel
Abstract: New techniques recently developed at the National Institute of Standards and Technology using bright field optical tools are applied to signal-based defect analysis of features with dimensions well below the measurement wavelength. A key to this app ...

70. DYNAMIC PERCEPTION WORKSHOP REPORT: Requirements and Standards for Advanced Manufacturing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7664
Topic: Metrology
Published: 1/14/2010
Authors: Tsai Hong Hong, Elena R Messina, Hui-Min Huang, Michael O Shneier, Roger D. Eastman, Jane Shi, James Wells
Abstract: The Dynamic Perception workshop was intended to further the development of standardized, reproducible, and portable test methods that can advance the technology of sensors and perception systems for new, flexible robotic and automation applications i ...

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