Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Metrology

Displaying records 61 to 70 of 92 records.
Resort by: Date / Title

61. Description and Uncertainty Analysis of NIST‰s 20 Liter Hydrocarbon Liquid Flow Standard (20 L HLFS)
Topic: Metrology
Published: 10/15/2010
Authors: Aaron N Johnson, Christopher J. Crowley, Tsyh Tyan Yeh
Abstract: The National Institute of Standards and Technology (NIST) uses a bi-directional piston prover as its primary standard for measuring hydrocarbon liquid flows ranging from 1.86 × 10-5 m3/s (0.3 gpm) to 2.6 × 10-3 m3/s (40 gpm). An uncertainty analysis ...

62. Methodology for evaluating Static six-degree-of-freedom (6DoF) Perception Systems
Topic: Metrology
Published: 10/15/2010
Authors: Tommy Chang, Tsai Hong Hong, Joseph A Falco, Michael O Shneier, Milli Shah, Roger D Eastman
Abstract: In this paper, we apply two fundamental approaches toward evaluating a static, vision based, six-degree-of-freedom (6DoF) pose determination system that measures the position and orientation of a part. The first approach uses ground\-truth carefully ...

63. Properties for Accurate Gas Flow Measurements
Topic: Metrology
Published: 10/15/2010
Author: John D Wright
Abstract: Accurate gas properties are needed to take full advantage of the low uncertainties provided by NIST‰s Gas Flow Calibration Services. If a flowmeter user and NIST use different values for these properties (molecular mass, compressibility, density, vis ...

64. Embedded Capacitive Displacement Sensor for Nanopositioning Applications
Topic: Metrology
Published: 8/17/2010
Authors: Svetlana Avramov-Zamurovic1, Nicholas G Dagalakis, Rae Duk Lee, Yong Sik Kim, Jae M. Yoo, Seung Ho Yang
Abstract: The scale of nano objects requires very precise position determination. The state-of-the-art manipulators involve accurate nanometer positioning. This paper presents the design of a capacitive displacement sensor for a nanopositioning application. Th ...

65. Choosing test positions for laser tracker evaluation and future Standards development
Topic: Metrology
Published: 7/15/2010
Authors: Balasubramanian Muralikrishnan, Daniel S Sawyer, Christopher J. Blackburn, Steven David Phillips, Craig M Shakarji, Ed Morse, Robert Bridges
Abstract: A working group within the ISO TC 213 committee is developing a draft document [11] for evaluating the performance of laser trackers. The ASME B89.4.19 Standard [1] and the draft VDI/VDE 2617 part 10 [2] describe some useful tests that are incorporat ...

66. Cylindrical Acoustic Resonator for the Re-determination of the Boltzmann Constant
Topic: Metrology
Published: 6/1/2010
Authors: J.T. Zhang, H. Lin, X.J. Feng, Keith A Gillis, Michael R Moldover
Abstract: We describe progress towards re-determining the Boltzmann constant {I}k{/I}^dB^ using two fixed-path, gas-filled, cylindrical, acoustic cavity resonators. The longitudinal acoustic resonance modes of a cylindrical cavity have lower quality factors {I ...

67. Feasibility of an Accurate Dynamic Standard for Water Flow
Topic: Metrology
Published: 6/1/2010
Authors: Iosif I Shinder, Michael R Moldover
Abstract: We used NIST's primary water flow standard to study the feasibility of accurately determining mass flow rates {I}m{/I}^ddot^ of water "dynamically," that is from the time derivative of the weight {I}W{/I} of the collection tank: {I}m{/I ...

68. Modeling and metrology of metallic nanowires with application to microwave interconnects
Topic: Metrology
Published: 5/23/2010
Authors: Kichul Kim, Thomas M Wallis, Paul Rice, Chin J. Chiang, Atif A. Imtiaz, Pavel Kabos, Jintao Zhang
Abstract: Abstract: Broadband characterization of individual metallic nanowires for microwave interconnect applications is discussed. Circuit and method of moments (MoM) modeling are benchmarked using a set of coplanar waveguide (CPW) test devices with microw ...

69. Performance of Critical Flow Venturis under Transient Conditions
Topic: Metrology
Published: 4/13/2010
Author: John D Wright
Abstract: Critical flow venturis (CFVs) can be used to measure flow under transient pressure and flow conditions with uncertainties of 0.13 % or less (95 % confidence level). Blow-down tests transferred 630 g of nitrogen during a 100 s interval from an unregul ...

70. The Limits and Extensibility of Optical Patterned Defect Inspection
Topic: Metrology
Published: 4/1/2010
Authors: Richard M Silver, Bryan M Barnes, Martin Y Sohn, Richard Quintanilha, Hui Zhou, Chris Deeb, Mark Johnson, Milton Goodwin, Dilip Patel
Abstract: New techniques recently developed at the National Institute of Standards and Technology using bright field optical tools are applied to signal-based defect analysis of features with dimensions well below the measurement wavelength. A key to this app ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series