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Topic Area: Metrology

Displaying records 61 to 70 of 836 records.
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61. DYNAMIC PERCEPTION WORKSHOP REPORT: Requirements and Standards for Advanced Manufacturing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7664
Topic: Metrology
Published: 1/14/2010
Authors: Tsai Hong Hong, Elena R Messina, Hui-Min Huang, Michael O Shneier, Roger Diack Eastman, Jane Shi, James Wells
Abstract: The Dynamic Perception workshop was intended to further the development of standardized, reproducible, and portable test methods that can advance the technology of sensors and perception systems for new, flexible robotic and automation applications i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904612

62. Performance Evaluation and Metrics for Perception in Intelligent Manufacturing
Topic: Metrology
Published: 12/31/2009
Authors: Roger Diack Eastman, Tsai Hong Hong, Jane Shi, Tobias Hanning, Balasubramanian Muralikrishnan, S. Susan Young, Tommy Chang
Abstract: Real-time three-dimensional vision has been rapidly advancing over the past twenty years, leading to a number of successful laboratory demonstrations, including real-time visual servoing, autonomous vehicle navigation , and real-time people and vehic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902103

63. Traceability for Ballistics Signature Measurements in Forensic Science
Topic: Metrology
Published: 12/1/2009
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Susan M Ballou, Li Ma, Thomas B Renegar, Xiaoyu A Zheng, Martin Ols
Abstract: The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the Standard Reference Material (SRM) 2460 Bullets and 2461 Casings. NIST has also developed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824703

64. Interoperability and the DMIS experience
Topic: Metrology
Published: 10/30/2009
Author: John A Horst
Abstract: Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903532

65. Mathematical Metrology for Evaluating a 6DOF Visual Servoing System
Topic: Metrology
Published: 10/8/2009
Authors: Tommy Chang, Tsai Hong Hong, Milli Shah, Roger D Eastman
Abstract: In this paper we develop the best homogeneous matrix trans- formation to fit two streams of dynamic six-degree-of-freedom (6DOF) data for evaluating perception systems using ground truth. In particular, we compare object position and orien- tation re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903632

66. Influence of room temperature control system on AFM imaging
Topic: Metrology
Published: 10/1/2009
Authors: Joseph Fu, Wei Chu, Theodore Vincent Vorburger
Abstract: As technology progresses, the control of environment for experiments is also getting more sophisticated; such as the control of lab temperature and vibration. Temperature controlled within ± 0.25° C for a general purpose lab is common place. We illus ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901426

67. The Dimensional Markup Language Specification for Inspection Results Data
Topic: Metrology
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Markup Language (DML) specification defines a data model and Extensible Model Language (XML) encoding rules for dimensional inspection results for discrete parts. To support manufacturing quality assurance processes, DML results file ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903179

68. Update on DMIS Certification
Topic: Metrology
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. Th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903180

69. Reduce Costs and Increase Quality with Information Exchange Standards for Manufacturing Quality
Topic: Metrology
Published: 9/4/2009
Author: John A Horst
Abstract: With the proliferation of computers to process, store, and transfer information, manufacturers are suffering increasing costs due to information incompatibilities. The information incompatibility problem in manufacturing quality is costly to everyo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903668

70. 193 nm Angle-Resolved Scatterfield Microscope for Semiconductor Metrology
Topic: Metrology
Published: 8/24/2009
Authors: Martin Yeungjoon Sohn, Richard Quintanilha, Bryan M Barnes, Richard M Silver
Abstract: An angle-resolved scatterfield microscope (ARSM( feating 193 nm excimer laser light wa developed for measuring critical dimension (CD) and overlay of nanoscale targets as used in semiconductor metrology. The microscope is designed to have a wide and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903754