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You searched on: Topic Area: Metrology

Displaying records 61 to 70 of 83 records.
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61. Performance of Critical Flow Venturis under Transient Conditions
Topic: Metrology
Published: 4/13/2010
Author: John D Wright
Abstract: Critical flow venturis (CFVs) can be used to measure flow under transient pressure and flow conditions with uncertainties of 0.13 % or less (95 % confidence level). Blow-down tests transferred 630 g of nitrogen during a 100 s interval from an unregul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904378

62. The Limits and Extensibility of Optical Patterned Defect Inspection
Topic: Metrology
Published: 4/1/2010
Authors: Richard M Silver, Bryan M Barnes, Martin Y Sohn, Richard Quintanilha, Hui H. Zhou, Chris Deeb, Mark Johnson, Milton Goodwin, Dilip Patel
Abstract: New techniques recently developed at the National Institute of Standards and Technology using bright field optical tools are applied to signal-based defect analysis of features with dimensions well below the measurement wavelength. A key to this app ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905318

63. DYNAMIC PERCEPTION WORKSHOP REPORT: Requirements and Standards for Advanced Manufacturing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7664
Topic: Metrology
Published: 1/14/2010
Authors: Tsai Hong Hong, Elena R Messina, Hui-Min Huang, Michael O Shneier, Roger D. Eastman, Jane Shi, James Wells
Abstract: The Dynamic Perception workshop was intended to further the development of standardized, reproducible, and portable test methods that can advance the technology of sensors and perception systems for new, flexible robotic and automation applications i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904612

64. Performance Evaluation and Metrics for Perception in Intelligent Manufacturing
Topic: Metrology
Published: 12/31/2009
Authors: Roger D. Eastman, Tsai Hong Hong, Jane Shi, Tobias Hanning, Balasubramanian Muralikrishnan, S. Susan Young, Tommy Chang
Abstract: Real-time three-dimensional vision has been rapidly advancing over the past twenty years, leading to a number of successful laboratory demonstrations, including real-time visual servoing, autonomous vehicle navigation , and real-time people and vehic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902103

65. Interoperability and the DMIS experience
Topic: Metrology
Published: 10/30/2009
Author: John A Horst
Abstract: Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903532

66. Mathematical Metrology for Evaluating a 6DOF Visual Servoing System
Topic: Metrology
Published: 10/8/2009
Authors: Tommy Chang, Tsai Hong Hong, Milli Shah, Roger D Eastman
Abstract: In this paper we develop the best homogeneous matrix trans- formation to fit two streams of dynamic six-degree-of-freedom (6DOF) data for evaluating perception systems using ground truth. In particular, we compare object position and orien- tation re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903632

67. Influence of room temperature control system on AFM imaging
Topic: Metrology
Published: 10/1/2009
Authors: Joseph Fu, Wei Chu, Theodore Vincent Vorburger
Abstract: As technology progresses, the control of environment for experiments is also getting more sophisticated; such as the control of lab temperature and vibration. Temperature controlled within ± 0.25° C for a general purpose lab is common place. We illus ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901426

68. The Dimensional Markup Language Specification for Inspection Results Data
Topic: Metrology
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Markup Language (DML) specification defines a data model and Extensible Model Language (XML) encoding rules for dimensional inspection results for discrete parts. To support manufacturing quality assurance processes, DML results file ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903179

69. Update on DMIS Certification
Topic: Metrology
Published: 10/1/2009
Author: William G Rippey
Abstract: The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. Th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903180

70. Reduce Costs and Increase Quality with Information Exchange Standards for Manufacturing Quality
Topic: Metrology
Published: 9/4/2009
Author: John A Horst
Abstract: With the proliferation of computers to process, store, and transfer information, manufacturers are suffering increasing costs due to information incompatibilities. The information incompatibility problem in manufacturing quality is costly to everyo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903668



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