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Topic Area: Metrology

Displaying records 41 to 50 of 851 records.
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41. 2011 Solutions in Perception Challenge Performance Metrics and Results
Topic: Metrology
Published: 3/22/2012
Authors: Jeremy A Marvel, Tsai Hong Hong, Elena R Messina
Abstract: The 2011 Solutions in Perception Challenge (SPC) presented an international collection of teams with the opportunity to develop algorithms that could positively identify and accurately locate in space an arbitrary collection of artifacts. Researchers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910645

42. An Overview of Robot-Sensor Calibration Methods for Evaluation of Perception Systems
Topic: Metrology
Published: 3/22/2012
Authors: Mili Indra Shah, Roger D. Eastman, Tsai Hong Hong
Abstract: In this paper, an overview of methods that solve the robot-sensor calibration problem of the forms AX = XB and AX = YB is given. Each form will be split into three solutions: separable closed-form solutions, simultaneous closed- form solutions, and i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910651

43. Traceable Calibration of a Critical Dimension Atomic Force Microscope
Topic: Metrology
Published: 3/9/2012
Authors: Ronald G Dixson, Ndubuisi George Orji, Craig Dyer McGray, John E Bonevich, Jon C Geist
Abstract: The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this program, and the focus of this paper, is the use of critical dimension atomic force ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908943

44. Measurement and Evaluation of Visibility Experiments for Powered Industrial Vehicles
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7837
Topic: Metrology
Published: 12/16/2011
Authors: Roger V Bostelman, Li Peng Liang
Abstract: Powered Industrial Vehicles, such as forklifts, are widely used in manufacturing and other industries. The National Institute of Standards and Technology's Intelligent System Division has been researching advanced 2D and 3D imaging sensors and their ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909306

45. Ultra-Precision Linear Motion Metrology of a Commerically Available Linear Translation Stage
Topic: Metrology
Published: 11/18/2011
Authors: Ronnie R. Fesperman Jr., M Alkan Donmez, Shawn P Moylan
Abstract: Many new compact ultra-precision linear translation stages with exceptionally long ranges of motion on the order of tens of millimeters and positioning resolutions on the order of a nanometer are finding their way into emerging nanotechnologies. Thi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909376

46. NON-CONTACT DIMENSIONAL MEASUREMENTS OF BIPOLAR FUEL CELL PLATES
Topic: Metrology
Published: 11/15/2011
Authors: Balasubramanian Muralikrishnan, Wei Ren, Dennis S Everett, Eric S Stanfield, Theodore D Doiron
Abstract: Non-contact dimensional measurement of fuel cell plates is critical to the eventual rapid manufacture by supporting in-process measurement and control. This need has been identified by the Department of Energy‰s Hydrogen Program, and by numerous manu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909299

47. A Two Degree of Freedom Nanopositioner with Electrothermal Actuator for Decoupled Motion
Topic: Metrology
Published: 8/31/2011
Authors: Yong Sik Kim, Nicholas G Dagalakis, Satyandra K. Gupta
Abstract: Building a two degree-of-freedom (2 DOF) MEMS nanopositioner with decoupled X-Y motion has been a challenge in nanopositioner design. In this paper a novel design concept on making the decoupled motion of the MEMS nanopositioner is suggested. The sug ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908777

48. A Prototype IEEE 1451.4 Smart Transducer Interface for Sensors and Actuators
Topic: Metrology
Published: 8/19/2011
Authors: Yuyin Song, David Michael Westbrook, Kang B Lee
Abstract: Analog transducers (sensors or actuators) are widely used in industry. The Institute of Electrical and Electronics Engineers (IEEE) 1451.4 standard defines a mixed-mode communication protocol and the Transducer Electronic Data Sheet (TEDS) formats fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908970

49. Large-Area Overhead Manipulator for Access of Fields
Topic: Metrology
Published: 7/22/2011
Authors: Jeffrey W White, Roger V Bostelman
Abstract: Multi-axis, cable-driven manipulators have evolved over many years providing large area suspended platform access, programmability, relatively rigid and flexibly- positioned platform control and full six degree of freedom (DOF) manipulation of sensor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905268

50. Inkjet Metrology II: Resolved Effects of Ejection Frequency, Fluidic Pressure and Droplet Number on Reproducible Drop-on-Demand Dispensing
Topic: Metrology
Published: 6/13/2011
Authors: R Michael Verkouteren, Jennifer R Verkouteren
Abstract: We report highly reproducible gravimetric and optical measurements of microdroplets enabled by fluidic pressure feedback control and state-of-the-art measurement systems that lend new insights into the process of drop-on-demand (DOD) printing. Baseli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908095



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