NIST logo

Publications Portal

You searched on: Topic Area: Metrology

Displaying records 41 to 50 of 83 records.
Resort by: Date / Title

41. Ultra-Precision Linear Motion Metrology of a Commerically Available Linear Translation Stage
Topic: Metrology
Published: 11/18/2011
Authors: Ronnie R. Fesperman Jr., M Alkan Donmez, Shawn P Moylan
Abstract: Many new compact ultra-precision linear translation stages with exceptionally long ranges of motion on the order of tens of millimeters and positioning resolutions on the order of a nanometer are finding their way into emerging nanotechnologies. Thi ...

Topic: Metrology
Published: 11/15/2011
Authors: Balasubramanian Muralikrishnan, Wei Ren, Dennis S Everett, Eric S Stanfield, Theodore D Doiron
Abstract: Non-contact dimensional measurement of fuel cell plates is critical to the eventual rapid manufacture by supporting in-process measurement and control. This need has been identified by the Department of Energy‰s Hydrogen Program, and by numerous manu ...

43. A Prototype IEEE 1451.4 Smart Transducer Interface for Sensors and Actuators
Topic: Metrology
Published: 8/19/2011
Authors: Yuyin Song, David Michael Westbrook, Kang B Lee
Abstract: Analog transducers (sensors or actuators) are widely used in industry. The Institute of Electrical and Electronics Engineers (IEEE) 1451.4 standard defines a mixed-mode communication protocol and the Transducer Electronic Data Sheet (TEDS) formats fo ...

44. Large-Area Overhead Manipulator for Access of Fields
Topic: Metrology
Published: 7/22/2011
Authors: Jeffrey W White, Roger V Bostelman
Abstract: Multi-axis, cable-driven manipulators have evolved over many years providing large area suspended platform access, programmability, relatively rigid and flexibly- positioned platform control and full six degree of freedom (DOF) manipulation of sensor ...

45. Methodology for imaging of nano-to-microscale water condensation dynamics on complex nanostructures
Topic: Metrology
Published: 6/11/2011
Authors: Konrad Rykaczewski, John Henry j Scott
Abstract: By transferring of a small part of a macroscale sample to a novel thermally insulated sample platform we are able to mitigate flooding and electron heating problems typically associated with Environmental Scanning Electron Microscopy imaging of water ...

46. Mixed Pallet Stacking: An Overview and Summary of the 2010 PerMIS Special Session
Topic: Metrology
Published: 2/4/2011
Authors: Stephen B. Balakirsky, Henrik I. Christensen, Thomas Rollin Kramer, Pushkar Kolhe, Frederick M Proctor
Abstract: Stacking boxes of various sizes and contents on pallets (i.e. making mixed pallets) is a primary method of preparing goods for shipment from a warehouse to a store or other distant site. A special session of the 2010 PERMIS workshop was held to exami ...

47. Present Estimates of the Differences Between Thermodynamic Temperatures and the ITS-90
Topic: Metrology
Published: 1/29/2011
Authors: Joachim Fischer, M. DePodesta, K. D. Hill, Michael R Moldover, Laurent Pitre, R. Rusby, Peter Steur, Osamu Tamura, R. White, L. Wolber
Abstract: In 2005, the Consultative Committee for Thermometry (CCT) recommended the creation of a Mise en pratique for the definition of the kelvin and envisioned that future versions of the Mise en pratique would recommend values of the differences between ...

48. Inexpensive Ground Truth and Performance Evaluation for Human Tracking using multiple Laser Measurement Sensors
Topic: Metrology
Published: 10/27/2010
Authors: William P Shackleford, Tsai Hong Hong, Tommy Chang
Abstract: This paper will describe a flexible and inexpensive method of obtaining ground truth for the evaluation of Human Tracking systems. It is expected to be appropriate for evaluating systems used to allow robots and/or autonomous vehicles to operate safe ...

49. Maintainers Manual for Version 2.2.1 of the NIST DMIS Test Suite
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7720
Topic: Metrology
Published: 10/25/2010
Authors: Thomas Rollin Kramer, John A Horst
Abstract: This manual is a maintainers manual for the NIST DMIS Test Suite, version 2.2.1. DMIS (Dimensional Measuring Interface Standard) is a language for writing programs for coordinate measuring machines and other dimensional measurement equipment. The ma ...

50. Performance Assessment of Face Recognition Using Super-Resolution
Topic: Metrology
Published: 10/25/2010
Authors: Shuowen Hu, Robert Maschal, S. Susan Young, Tsai Hong Hong, P Jonathon Phillips
Abstract: Recognition rate of face recognition algorithms is dependent on the resolution of the imagery, specifically the number of pixels contained within the face. Using a sequence of frames from low-resolution videos, super-resolution reconstruction can fo ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series