NIST logo

Publications Portal

You searched on: Topic Area: Metrology

Displaying records 11 to 20 of 84 records.
Resort by: Date / Title


11. Measurement Science for 6DOF object pose ground truth
Topic: Metrology
Published: 6/28/2013
Authors: Roger D. Eastman, Jeremy A Marvel, Joseph A Falco, Tsai Hong Hong
Abstract: Users of perception systems in industrial manufacturing applications need standardized, third party ground truth procedures to validate system performance before deployment. Many manufacturing robotic applications require parts and assemblies to be p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913794

12. Solving the Robot-World/Hand-Eye Calibration Problem Using the Kronecker Product
Topic: Metrology
Published: 6/24/2013
Author: Mili Indra Shah
Abstract: This paper constructs a closed-form solution to the robot-world/hand-eye calibration paper using the Kronecker product. In other words, it constructs the optimal X and Y to solve AX = YB. Additionally, this paper provides errors metrics that will mea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910225

13. Development of Standard Test Methods for Unmanned and Manned Industrial Vehicles Used Near Humans
Topic: Metrology
Published: 5/3/2013
Authors: Roger V Bostelman, Richard J Norcross, Joseph A Falco, Jeremy A Marvel
Abstract: The National Institute of Standards and Technology (NIST) has been researching human-robot/vehicle collaborative environments for automated guided vehicles (AGVs) and manned forklifts. Safety of AGVs and manned vehicles with automated functions (e.g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913625

14. Review of Research on the Ground Truth Systems for Evaluating Part Identification Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7926
Topic: Metrology
Published: 4/23/2013
Authors: Afzal A Godil, Roger D. Eastman, Tsai Hong Hong
Abstract: In this report we discuss different types of potential ground-truth systems that could be used to test part identification systems for manufacturing assembly applications. We discuss four main ways of acquiring ground truth for evaluating part re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913579

15. Assessment of Real-Time Factory Performance through the Application of Multi-Relationship Evaluation Design
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7911
Topic: Metrology
Published: 4/17/2013
Authors: Brian A Weiss, John A Horst, Frederick M Proctor
Abstract: Successful operations within manufacturing environments require both accurate and precise information flow from one operation to the next. Incorrect, too little, or too much information can slow the manufacturing process and/or result in poor qua ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912784

16. Ground Truth Systems for Object Recognition and Tracking
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7923
Topic: Metrology
Published: 3/29/2013
Authors: Afzal A Godil, Roger D. Eastman, Tsai Hong Hong
Abstract: In this report we discuss different types of ground-truth systems used for evaluation of object recognition and tracking systems in industrial manufacturing environments. We discuss three main ways for acquiring ground truth for object recognitio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913121

17. A Humidity Generator for Temperatures to 200 °C and Pressures to 1.6 MPa
Topic: Metrology
Published: 11/30/2012
Authors: D Vega-Maza, W Wyatt Miller, Dean C Ripple, Gregory E Scace
Abstract: We have constructed a new humidity generator that produces gas streams of known moisture content at temperatures from 85 °C to 200 °C, absolute pressures from 0.2 MPa to 1.6 MPa, and relative humidities from 10 % to 90 %. The generator produces a moi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905234

18. An Industrial Robotic Knowledge Representation for Kit Building Applications
Topic: Metrology
Published: 10/12/2012
Authors: Stephen B. Balakirsky, Zeid Kootbally, Craig I Schlenoff, Thomas Rollin Kramer, Satyandra K. Gupta
Abstract: The IEEE RAS Ontologies for Robotics and Automation Working Group is dedicated to developing a methodology for knowledge representation and reasoning in robotics and automation. As part of this working group, the Industrial Robots sub-group is tasked ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911866

19. Factory Equipment Network Testing Framework: Concept, Requirements, and Architecture
Series: Technical Note (NIST TN)
Report Number: 1755
Topic: Metrology
Published: 9/17/2012
Authors: James D Gilsinn, Kang B Lee, John L Michaloski, Frederick M Proctor, Yuyin Song
Abstract: This document describes the purpose, concept, requirements, and architecture for the Factory Equipment Network Testing (FENT) Framework and the software to test equipment on real-time factory networks. Other documents contain more detailed info ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911180

20. Factory Equipment Network Testing Framework: Universal Client Application, Application Programming Interface
Series: Technical Note (NIST TN)
Report Number: 1754
Topic: Metrology
Published: 9/17/2012
Authors: James D Gilsinn, Kang B Lee, John L Michaloski, Frederick M Proctor, Yuyin Song
Abstract: This document describes the application programming interface (API) used by the Factory Equipment Network Testing (FENT) Framework to communicate between the main Universal Client Application (UCA) and the Personality Module (PM). This API abstra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911181



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series