NIST logo

Publications Portal

You searched on:
Topic Area: Software Testing Metrics

Displaying records 11 to 20 of 114 records.
Resort by: Date / Title


11. Report on the Metrics and Standards for Software Testing (MaSST) Workshop 2012
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7920
Topic: Software Testing Metrics
Published: 4/22/2013
Authors: Paul E Black, Elizabeth Nee nee Fong
Abstract: The NIST Software Assurance Metrics And Tool Evaluation (SAMATE) project conducted a workshop on Metrics and Standards for Software Testing (MaSST) on June 20, 2012. This workshop was co-located with the IEEE Sixth International Conference on Sof ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913074

12. Security Content Automation Protocol (SCAP) Version 1.2 Validation Program Test Requirements
Series: ITL Bulletin
Topic: Software Testing Metrics
Published: 4/10/2013
Author: Elizabeth B Lennon
Abstract: This ITL Bulletin describes a new ITL publication, NISTIR 7511, Revision 3, Ssecurity Content Automation Protocol (SCAP) Version 1.2 Validation Program Test Requirements.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913736

13. A Basic CWE-121 Buffer Overflow Effectiveness Test Suite
Topic: Software Testing Metrics
Published: 4/1/2013
Authors: Paul E Black, Hsiao-Ming Michael Koo, Thomas F Irish
Abstract: Phase 3 of MITRE's Common Weakness Enumeration (CWE) Compatibility and Effectiveness program allows a customer to understand how effective a software assurance tool is at finding weaknesses and what code complexities it handles. Phase 3 is based on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913117

14. The Juliet 1.1 C/C++ and Java Test Suite
Topic: Software Testing Metrics
Published: 10/1/2012
Authors: Frederick E Boland Jr, Paul E Black
Abstract: The Juliet Test Suite 1.1 is a collection of over 81,000 synthetic C/C++ and Java programs with known flaws. These programs are useful as test cases for testing the effectiveness of static analyzers and other software assurance tools, and are in the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912128

15. Factory Equipment Network Testing Framework: Concept, Requirements, and Architecture
Series: Technical Note (NIST TN)
Report Number: 1755
Topic: Software Testing Metrics
Published: 9/17/2012
Authors: James D Gilsinn, Kang B Lee, John L Michaloski, Frederick M Proctor, Yuyin Song
Abstract: This document describes the purpose, concept, requirements, and architecture for the Factory Equipment Network Testing (FENT) Framework and the software to test equipment on real-time factory networks. Other documents contain more detailed info ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911180

16. Factory Equipment Network Testing Framework: Universal Client Application, Application Programming Interface
Series: Technical Note (NIST TN)
Report Number: 1754
Topic: Software Testing Metrics
Published: 9/17/2012
Authors: James D Gilsinn, Kang B Lee, John L Michaloski, Frederick M Proctor, Yuyin Song
Abstract: This document describes the application programming interface (API) used by the Factory Equipment Network Testing (FENT) Framework to communicate between the main Universal Client Application (UCA) and the Personality Module (PM). This API abstra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911181

17. Combinatorial Methods for Event Sequence Testing
Topic: Software Testing Metrics
Published: 4/21/2012
Authors: David R Kuhn, James M. Higdon, James F Lawrence, Raghu N Kacker, Yu Lei
Abstract: Many software testing problems involve sequences. This paper presents an application of combinatorial methods to testing problems for which it is important to test multiple configurations, but also to test the order in which events occur. For exam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906770

18. Building Security into Off-the-Shelf Smartphones
Topic: Software Testing Metrics
Published: 2/1/2012
Authors: Angelos Stavrou, Jeffrey Mark Voas, Athanasios T. (Tom) Karygiannis, Stephen Quirolgico
Abstract: Recent advancements in hardware have increased the computing power, memory, storage, and wireless connectivity of handheld mobile devices. Smart-phone devices are used for everyday activities that range from Maps and Geo-location tagging to banking. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909685

19. Foreword to Information Modeling for Interoperable Dimensional Metrology
Topic: Software Testing Metrics
Published: 12/30/2011
Author: John A Horst
Abstract: The value of information exchange standards development is described and defended against other data exchange interoperability options in the context of dimensional metrology in manufacturing.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908909

20. An IEEE 1588 Performance Testing Dashboard for Power Industry Requirements
Topic: Software Testing Metrics
Published: 9/12/2011
Authors: Julien Marc Amelot, YaShian Li-Baboud, Clement Vasseur, Jeffrey Fletcher, Dhananjay Anand, James Moyne
Abstract: The numerous time synchronization performance requirements in the Smart Grid entails the need for a set of common metrics and test methods to verify the ability of the network system and its components to meet the power industry‰s accuracy, reliabili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909255



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series