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51. Three Dimensional Shape Retrieval using Scale Invariant Feature Transform and Spatial Restrictions
NIST Interagency/Internal Report (NISTIR)
Lydia Ann Lei
Three dimensional shape retrieval is a fairly new concept being studied all over the world. It is notable and essential because it can be applied to multiple disciplines in society, including: computer vision, CAD models, computer graphics, molecular ...
52. Three-dimensional deep sub-wavelength defect detection using (lambda) = 193 nm optical microscopy
Bryan M Barnes, Martin Y Sohn, Francois R. Goasmat, Hui Zhou, Andras Vladar, Richard M Silver, Abraham Arceo
Identifying defects in photolithographic patterning is a persistent challenge in semiconductor manufacturing. Well-established optical methods in current use are jeopardized by upcoming sub-20 nm device dimensions. Volumetric processing of focus-reso ...
53. Validated Open Source Nanofiber Diameter Measurement Tool
Nathan Alexander Hotaling, Kapil Bharti, Haydn Kriel, Carl George Simon Jr.
Despite the growing use of nanofiber scaffolds for tissue engineering applications, there is not a validated, readily available (commercial or open source) solution for rapid, automated analysis of nanofiber diameter from scanning electron microscope ...
54. Web Accessible Image Similarity Measurements
Antoine Vandecreme, Paul Khouri Saba, Benjamin J Long, Joe Chalfoun, Peter Bajcsy, Mary C Brady