NIST logo

Publications Portal

You searched on:
Topic Area: Data and Informatics

Displaying records 61 to 70 of 188 records.
Resort by: Date / Title


61. Measuring the Impact of Information on Complex Systems
Series: Special Publication (NIST SP)
Report Number: 982
Topic: Data and Informatics
Published: 6/1/2002
Authors: Larry H Reeker, Albert W Jones
Abstract: The application of power-driven machinery to manufacturing and other areas of human endeavor characterized the Industrial Revolution in the 18th and 19th centuries. Measurement contributed in many ways to the increasing economic influence of these ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50937

62. Measurement of Dynamic Properties in Thin-Films
Topic: Data and Informatics
Published: 12/1/2001
Author: Thomas J Silva
Abstract: I present a summary of the various techniques available for the determination of response times in magnetic recording head materials. In addition, I derive useful equations for the interpretation of data in the context of the Landau-Lifshitz-Gilbert ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30800

63. Window-Based Applications of TRC Databases: Structure and Internet Distribution
Topic: Data and Informatics
Published: 1/1/2001
Authors: X. Yan, Qian Dong, Michael Frenkel, K. R. Hall
Abstract: Thermophysical and thermochemical property data on organic compounds provide vital background information for scientific and engineering communities in both academic and industrial environments. The Thermodynamics Research Center (TRC) has collect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907446

64. Gd(0001): A semi-infinite three-dimensional Heisenberg ferromagnet with ordinary surface transition
Topic: Data and Informatics
Published: 12/1/2000
Author: C S Arnold
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30561

65. Electronic scattering from Co/Cu interfaces: In situ measurement, comparison with microstructure, and failure of semiclassical free-electron models
Topic: Data and Informatics
Published: 5/1/2000
Authors: William E Bailey, S X Wang, E Yu Tsymbal
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30445

66. Electronic scattering from Co/Cu interfaces: In situ measurement and comparison with theory
Topic: Data and Informatics
Published: 1/1/2000
Authors: William E Bailey, S X Wang, E and Yu
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30446

67. Exchange Biasing in Ferromagnet/Antiferromagnet Fe/KMnF^d3^
Topic: Data and Informatics
Published: 8/1/1999
Authors: Zbigniew J. Celinski, D Licic, Nicholas Cramer, R. E. Camley, Ronald B Goldfarb, Danuta Skrzypek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30341

68. Magnetic Susceptibility Determination of the Relaxation Time for Domain-Wall Motion in Perpendicularly Magnetized, Ultrathin Films
Topic: Data and Informatics
Published: 7/1/1999
Authors: C S Arnold, David P Pappas, D Dunlavy, D Venus
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30566

69. Switching Characteristics of Spin Valve Devices Designed for MRAM Applications
Topic: Data and Informatics
Published: 7/1/1999
Authors: Stephen E Russek, J O Oti, Y K Kim
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30685

70. Inductive Measurement of Ultrafast Magnetization Dynamics in Thin-Film Permalloy
Topic: Data and Informatics
Published: 6/1/1999
Authors: Thomas J Silva, C G Lee, T. M. Crawford, C. T. Rogers
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30724



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series