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Topic Area: Conformance Testing
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Displaying records 121 to 130 of 147 records.
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121. Testing and Validation of Personal Identity Verification (PIV) Components and Subsystems for Conformance to Federal Information Processing Standard 201
Series: ITL Bulletin
Topic: Conformance Testing
Published: 1/25/2006
Author: Shirley M. Radack
Abstract: This bulletin provides information about testing and validation of personal identity verification (PIV) components and subsystems for conformance to Federal Information Processing Standard 201, Personal Identification Verification of Federal Employee ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150596

122. The Effect of Histogram Size on Histogram-Derived Pulse Parameters
Topic: Conformance Testing
Published: 6/1/1998
Author: Nicholas G Paulter Jr
Abstract: The effects of the number of histogram bins on histogram-derived pulse parameters of step-like waveforms is examined. An empirical method for selecting the optimal number of bins is described.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20809

123. The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method
Topic: Conformance Testing
Published: 5/1/2000
Authors: Donald R Larson, Nicholas G Paulter Jr
Abstract: The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset voltage. The amplitude is almost linear for offset voltages from -500 mV to 500 mV except ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5695

124. The NIST Digitally Synthesized Power Calibration Source
Series: Technical Note (NIST TN)
Report Number: 1281
Topic: Conformance Testing
Published: 8/1/1990
Authors: Nile M. Oldham, Owen Brede Laug, Bryan C Waltrip, Jon Robert Pratt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24104

125. The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic
Topic: Conformance Testing
Published: 5/1/1999
Authors: S. Avramov, Andrew David Koffman, Nile M. Oldham, Bryan C Waltrip
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18201

126. Time-Base Setting Dependence of Pulse Parameters Using High-bandwidth Digital Sampling Oscilloscopes
Topic: Conformance Testing
Published: 7/1/2000
Authors: Nicholas G Paulter Jr, Donald R Larson
Abstract: Errors in the time-base of digital sampling oscilloscopes (samplers) will cause errors in the reported pulse parameters of the sampler-acquired waveforms and will also contribute to the uncertainty estimate for these parameters. We present the resul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25408

127. Timebase Distortion Measurements Using Multiphase Sinewaves
Topic: Conformance Testing
Published: 5/1/1997
Authors: Gerard Nordeen Stenbakken, J. P. Deyst
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13433

128. Titled Raster Graphics and MIL-R-28002A: A Tutorial and Implementation Guide
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4567
Topic: Conformance Testing
Published: 4/1/1991
Authors: Frankie E. Spielman, L H Sharpe
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900598

129. Uncertainties of Frequency Response Estimates Derived from Responses to Uncertain Step-Like Inputs
Topic: Conformance Testing
Published: 6/1/1996
Authors: J. P. Deyst, T. Michael Souders, Jerome J. Blair
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14544

130. Uncertainty Analysis for Four Terminal-Pair Capacitance and Dissipation Factor Characterization at 1 MHz and 10 MHz
Topic: Conformance Testing
Published: 5/1/1999
Authors: Andrew David Koffman, S. Avramov, Bryan C Waltrip, Nile M. Oldham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5083



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