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Displaying records 121 to 130 of 148 records.
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121. Ten years of computer forensic tool testing
Topic: Conformance Testing
Published: 10/12/2011
Authors: James R Lyle, Barbara Guttman, Richard P Ayers
Abstract: The Computer Forensic Tool Testing (CFTT) project at the National Institute of Standards and Technology (NIST) has been active since 2000. The project develops methodologies for testing computer forensic software tools by the creation of general tool ...

122. Testing and Validation of Personal Identity Verification (PIV) Components and Subsystems for Conformance to Federal Information Processing Standard 201
Series: ITL Bulletin
Topic: Conformance Testing
Published: 1/25/2006
Author: Shirley M. Radack
Abstract: This bulletin provides information about testing and validation of personal identity verification (PIV) components and subsystems for conformance to Federal Information Processing Standard 201, Personal Identification Verification of Federal Employee ...

123. The Effect of Histogram Size on Histogram-Derived Pulse Parameters
Topic: Conformance Testing
Published: 6/1/1998
Author: Nicholas G Paulter Jr.
Abstract: The effects of the number of histogram bins on histogram-derived pulse parameters of step-like waveforms is examined. An empirical method for selecting the optimal number of bins is described.

124. The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method
Topic: Conformance Testing
Published: 5/1/2000
Authors: Donald R Larson, Nicholas G Paulter Jr.
Abstract: The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset voltage. The amplitude is almost linear for offset voltages from -500 mV to 500 mV except ...

125. The NIST Digitally Synthesized Power Calibration Source
Series: Technical Note (NIST TN)
Report Number: 1281
Topic: Conformance Testing
Published: 8/1/1990
Authors: Nile M. Oldham, Owen Brede Laug, Bryan C Waltrip, Jon Robert Pratt

126. The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic
Topic: Conformance Testing
Published: 5/1/1999
Authors: S. Avramov, Andrew David Koffman, Nile M. Oldham, Bryan C Waltrip

127. Time-Base Setting Dependence of Pulse Parameters Using High-bandwidth Digital Sampling Oscilloscopes
Topic: Conformance Testing
Published: 7/1/2000
Authors: Nicholas G Paulter Jr., Donald R Larson
Abstract: Errors in the time-base of digital sampling oscilloscopes (samplers) will cause errors in the reported pulse parameters of the sampler-acquired waveforms and will also contribute to the uncertainty estimate for these parameters. We present the resul ...

128. Timebase Distortion Measurements Using Multiphase Sinewaves
Topic: Conformance Testing
Published: 5/1/1997
Authors: Gerard Nordeen Stenbakken, J. P. Deyst

129. Titled Raster Graphics and MIL-R-28002A: A Tutorial and Implementation Guide
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4567
Topic: Conformance Testing
Published: 4/1/1991
Authors: Frankie E. Spielman, L H Sharpe

130. Uncertainties of Frequency Response Estimates Derived from Responses to Uncertain Step-Like Inputs
Topic: Conformance Testing
Published: 6/1/1996
Authors: J. P. Deyst, T. Michael Souders, Jerome J. Blair

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