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Topic Area: Conformance Testing
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Displaying records 111 to 120 of 144 records.
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111. Software Write Block, Testing Support Tools Validation Part B Test and Code Review Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7207-B
Topic: Conformance Testing
Published: 3/1/2005
Author: Paul E Black
Abstract: This NIST Internal Report consists of two parts. Part A covers the planning, design, and specification of testing and reviewing the Software write block (SWB) support tools. Part B, which is a companion document, covers the test and code review su ...

112. Software to Optimize the Testing of Mixed-Signal Devices
Topic: Conformance Testing
Published: 6/1/1999
Authors: Gerard Nordeen Stenbakken, Andrew David Koffman, T. Michael Souders
Abstract: New software is now available to help test and measurement engineers optimize the testing of complex electronic devices. Examples of products that are benefiting from this software range from A/D and D/A converters to multi-range precision instrument ...

113. Source Code Security Analysis Tool Test Plan
Series: Special Publication (NIST SP)
Report Number: 500-270
Topic: Conformance Testing
Published: 10/4/2011
Authors: Hsiao-Ming Michael Koo, Romain Gaucher, Charline Cleraux, Jenise Reyes Rodriguez
Abstract: This document provides a set of metrics, including test suites and methods, to determine how well a particular source code security analysis tool conforms to the requirements specified in Source Code Security Analysis Tool Functional Specification Ve ...

114. Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) Validation Procedures
Series: OTHER
Report Number: 6127
Topic: Conformance Testing
Published: 5/1/1998
Authors: W H. Dashiell, L A. Johnson, Lynne S. Rosenthal
Abstract: This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector Certification Issuing Organizations which provide conformance assessment for the SDTS/TV standard.

115. Standards for the Interchange of Large Format Tiled Raster Documents
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 88-4017
Topic: Conformance Testing
Published: 12/1/1988
Author: Frankie E. Spielman

116. Temperature Effects on the High Speed Response of Digitizing Sampling Oscilloscopes
Topic: Conformance Testing
Published: 7/1/2000
Authors: Donald R Larson, Nicholas G Paulter Jr
Abstract: We describe the effects of temperature on the performance of 20 GHz and 50 GHz digital sampling oscilloscopes and high speed pulse generators. The temperature of the sampling heads is varied through the manufacturer's specified minimum operating tem ...

117. Ten years of computer forensic tool testing
Topic: Conformance Testing
Published: 10/12/2011
Authors: James R Lyle, Barbara Guttman, Richard P Ayers
Abstract: The Computer Forensic Tool Testing (CFTT) project at the National Institute of Standards and Technology (NIST) has been active since 2000. The project develops methodologies for testing computer forensic software tools by the creation of general tool ...

118. Testing and Validation of Personal Identity Verification (PIV) Components and Subsystems for Conformance to Federal Information Processing Standard 201
Series: ITL Bulletin
Topic: Conformance Testing
Published: 1/25/2006
Author: Shirley M. Radack
Abstract: This bulletin provides information about testing and validation of personal identity verification (PIV) components and subsystems for conformance to Federal Information Processing Standard 201, Personal Identification Verification of Federal Employee ...

119. The Effect of Histogram Size on Histogram-Derived Pulse Parameters
Topic: Conformance Testing
Published: 6/1/1998
Author: Nicholas G Paulter Jr
Abstract: The effects of the number of histogram bins on histogram-derived pulse parameters of step-like waveforms is examined. An empirical method for selecting the optimal number of bins is described.

120. The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method
Topic: Conformance Testing
Published: 5/1/2000
Authors: Donald R Larson, Nicholas G Paulter Jr
Abstract: The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset voltage. The amplitude is almost linear for offset voltages from -500 mV to 500 mV except ...

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  • SP 250-XX: Calibration Services
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