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Topic Area: Conformance Testing
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Displaying records 31 to 40 of 143 records.
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31. An IEEE 1588 Time Synchronization Testbed for Assessing Power Distribution Requirements
Topic: Conformance Testing
Published: 10/25/2010
Authors: Julien Marc Amelot, Clement Vasseur, Jeffrey Fletcher, Dhananjay Anand, YaShian Li-Baboud, James Moyne
Abstract: Wide-area monitoring applications for power distribution rely on accurate global time synchronization. Furthermore, there is interest in replacing current time synchronization methods such as IRIG, with distributed time synchronization protocols that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906259

32. Maintainers Manual for Version 2.2.1 of the NIST DMIS Test Suite
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7720
Topic: Conformance Testing
Published: 10/25/2010
Authors: Thomas Rollin Kramer, John A Horst
Abstract: This manual is a maintainers manual for the NIST DMIS Test Suite, version 2.2.1. DMIS (Dimensional Measuring Interface Standard) is a language for writing programs for coordinate measuring machines and other dimensional measurement equipment. The ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905759

33. Users Manual for Version 2.2.1 of the NIST DMIS Test Suite
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7735
Topic: Conformance Testing
Published: 10/25/2010
Authors: Thomas Rollin Kramer, John A Horst
Abstract: This manual is a users manual for the NIST DMIS Test Suite, version 2.2.1. DMIS (Dimensional Measuring Interface Standard) is a language for writing programs for coordinate measuring machines and other dimensional measurement equipment. The manual d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905756

34. Practical Combinatorial Testing
Series: Special Publication (NIST SP)
Report Number: 800-142
Topic: Conformance Testing
Published: 10/7/2010
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: Combinatorial testing can help detect problems like this early in the testing life cycle. The key insight underlying t-way combinatorial testing is that not every parameter contributes to every fault and most faults are caused by interactions between ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906255

35. NIST SP 800-85A-2: PIV Card Application and Middleware Interface Test Guidelines (SP800-73-3 compliance)
Series: Special Publication (NIST SP)
Report Number: 800-85
Topic: Conformance Testing
Published: 7/28/2010
Authors: Ramaswamy Chandramouli, Hildegard Ferraiolo, Ketan L Mehta
Abstract: The objective of this document is to provide test requirements and test assertions that could be used to validate the compliance/conformance of two PIV components: PIV middleware and PIV card application with the specification in NIST SP 800-73-3, In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906167

36. Computer Security Division 2009 Annual Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7653
Topic: Conformance Testing
Published: 3/23/2010
Author: Patrick D O'Reilly
Abstract: This annual report covers the work conducted within the National Institute of Standards and Technology's Computer Security Division during Fiscal Year 2009. It discusses all projects and programs within the Division, staff highlights, and publication ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905148

37. Interoperability and the DMIS experience
Topic: Conformance Testing
Published: 10/30/2009
Author: John A Horst
Abstract: Because they enable true interoperability, information exchange standards can help manufacturers reduce cost and improve product quality, but only if the standards are developed and implemented correctly. We will answer questions manufacturers and su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903532

38. Reduce Costs and Increase Quality with Information Exchange Standards for Manufacturing Quality
Topic: Conformance Testing
Published: 9/4/2009
Author: John A Horst
Abstract: With the proliferation of computers to process, store, and transfer information, manufacturers are suffering increasing costs due to information incompatibilities. The information incompatibility problem in manufacturing quality is costly to everyo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903668

39. Users Manual for Version 2.1.5 of the NIST DMIS Test Suite (for DMIS 5.1)
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7603
Topic: Conformance Testing
Published: 8/19/2009
Authors: Thomas Rollin Kramer, John A Horst
Abstract: The NIST DMIS Test Suite, version 2.1.5, is described. The test suite is intended to serve two purposes, 1) to help users and vendors use version 5.1 of DMIS (the Dimensional Measuring Interface Standard) and 2) to provide utilities and test files fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903026

40. Combinatorial Software Testing
Topic: Conformance Testing
Published: 8/7/2009
Authors: David R Kuhn, Raghu N Kacker, Yu Lei, Justin Hunter
Abstract: Developers of large data-intensive software often notice an interesting - though not surprising - phenomenon: when usage of an application jumps dramatically, components that have operated for months without trouble suddenly develop previously unde ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903128



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