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Topic Area: Conformance Testing
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Displaying records 121 to 130 of 144 records.
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121. Validated Products List 1992 No. 3
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4871
Topic: Conformance Testing
Published: 7/1/1992
Author: Judy B. Kailey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900643

122. Automatic Inductive Voltage Divider Bridge for Operation from 10 Hz to 100 kHz
Topic: Conformance Testing
Published: 6/1/1992
Authors: S. Avramov, Nile M. Oldham, Dean G Jarrett, Bryan C Waltrip
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10088

123. Raster Graphics Validation
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4848
Topic: Conformance Testing
Published: 5/1/1992
Author: Frankie E. Spielman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900639

124. Validated Products List 1992, No. 2(Supersedes NISTIR 4739)
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4820
Topic: Conformance Testing
Published: 4/1/1992
Author: Judy B. Kailey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900634

125. A Formal Description of the SDNS Security Protocol at Layer 4 (SP4)
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4792
Topic: Conformance Testing
Published: 3/1/1992
Author: Wayne Jansen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900629

126. Diakoptic and Large Change Sensitivity Analysis
Topic: Conformance Testing
Published: 2/1/1992
Authors: Gerard Nordeen Stenbakken, J. A. Starzyk
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=753

127. Validated Processor List 1992, No. 1 (Supersedes NISTIR 4690)
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4739
Topic: Conformance Testing
Published: 1/1/1992
Author: Judy B. Kailey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900619

128. Electronic Limitations in Phase Meters for Heterodyne Interferometry
Topic: Conformance Testing
Published: 10/1/1991
Authors: Nile M. Oldham, P. S. Hetrick, John A Kramar, William B. Penzes, T. Wheatley, E Clayton Teague
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22839

129. Linear Error Modeling of Analog and Mixed-Signal Devices
Topic: Conformance Testing
Published: 10/1/1991
Authors: Gerard Nordeen Stenbakken, T. Michael Souders
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16862

130. ISDN Conformance Testing, Layer 1--Physical Layer, Part 1--Basic Rate S/T Interface, User Side
Series: Special Publication (NIST SP)
Report Number: 500-194
Topic: Conformance Testing
Published: 9/1/1991
Authors: S A. Wakid, Kathleen M Roberts
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900445



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