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Topic Area: Conformance Testing

Displaying records 81 to 90 of 147 records.
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81. Software to Optimize the Testing of Mixed-Signal Devices
Topic: Conformance Testing
Published: 6/1/1999
Authors: Gerard Nordeen Stenbakken, Andrew David Koffman, T. Michael Souders
Abstract: New software is now available to help test and measurement engineers optimize the testing of complex electronic devices. Examples of products that are benefiting from this software range from A/D and D/A converters to multi-range precision instrument ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20755

82. High-Dimensional Empirical Linear Prediction (HELP) Toolbox User's Guide, Version 2.2
Series: Technical Note (NIST TN)
Report Number: 1428
Topic: Conformance Testing
Published: 5/1/1999
Authors: Andrew David Koffman, T. Michael Souders, Gerard Nordeen Stenbakken, Hans Engler
Abstract: This user's guide will assist software users in the understanding of the theory and procedures underlying the High-dimensional Empirical Linear Prediction (HELP) Toolbox, developed for use with the MATLAB(r) mathematical software environment. The HE ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14609

83. Internet-Based Test Service for Multifunction Calibrators
Topic: Conformance Testing
Published: 5/1/1999
Authors: Nile M. Oldham, Mark E. Parker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18278

84. SIMnet - a Collaborative Tool for Metrology in the Americas
Topic: Conformance Testing
Published: 5/1/1999
Authors: Piotr S. Filipski, Nile M. Oldham
Abstract: The use of video conferencing equipment used with the Internet to facilitate international comparisons and collaborations is described. The system employs standard hardware and software at a number of National Metrology Institutes within the America ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27378

85. The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic
Topic: Conformance Testing
Published: 5/1/1999
Authors: S. Avramov, Andrew David Koffman, Nile M. Oldham, Bryan C Waltrip
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18201

86. Uncertainty Analysis for Four Terminal-Pair Capacitance and Dissipation Factor Characterization at 1 MHz and 10 MHz
Topic: Conformance Testing
Published: 5/1/1999
Authors: Andrew David Koffman, S. Avramov, Bryan C Waltrip, Nile M. Oldham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5083

87. A Pulse Measurement Intercomparison
Topic: Conformance Testing
Published: 10/1/1998
Authors: T. Michael Souders, J R Andrews, A. Caravone, J. P. Deyst, C. Duff, S. Naboicheck
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=26535

88. The Effect of Histogram Size on Histogram-Derived Pulse Parameters
Topic: Conformance Testing
Published: 6/1/1998
Author: Nicholas G Paulter Jr
Abstract: The effects of the number of histogram bins on histogram-derived pulse parameters of step-like waveforms is examined. An empirical method for selecting the optimal number of bins is described.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20809

89. Criteria for United States Geological Survey (USGS) Recognizing Certificate Issuing Organizations: Functions and Requirements
Series: OTHER
Report Number: 6126
Topic: Conformance Testing
Published: 5/1/1998
Authors: W H. Dashiell, L A. Johnson, Lynne S. Rosenthal
Abstract: This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector Certification Issuing Organizations which provide conformance assessment for the SDTS/TV standard.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151636

90. Model for Test Method Executive Control Committee (TMECC) Organization and Procedures Part of United States Geological Survey Recognition of Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) Certification System
Series: OTHER
Report Number: 6125
Topic: Conformance Testing
Published: 5/1/1998
Authors: W H. Dashiell, L A. Johnson, Lynne S. Rosenthal
Abstract: This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector certification issuing organizations which provide conformance assessment for the SDTS/TV standard.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151635



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