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31. Surge Protection in Low-Voltage AC Power Circuits - An Anthology Part 2: Development of Standards - Reality Checks
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6714-2
Topic: Electric Power Metrology
Published: 3/1/2002
Author: Francois D. Martzloff
Abstract: Part 2 of a multi-part anthology. The previously published papers collected in this Part 2 were written primarily as contributions to the development of IEEE and IEC Standards on surges in low-voltage AC power circuits. The papers report the result ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15221

32. Testing Phasor Measurement Units Using IEEE 1588 Precision Time Protocol
Topic: Electric Power Metrology
Published: 7/1/2012
Authors: Julien Marc Amelot, Gerard Stenbakken
Abstract: As the electric power grid is changing to a smarter more dynamically controlled system, there is increasing need for measurements that show the global status of the system for wide-area monitoring and control. These measurements require time synchron ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910573

33. The U.S.--Poland Energy Roundtable Smart Grid Applications
Topic: Electric Power Metrology
Published: 6/23/2010
Author: Allen R Hefner Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907121

34. Thermal Network Component Models for 10 kV SiC Power Module Packages
Topic: Electric Power Metrology
Published: 6/13/2008
Authors: Jose Miguel Ortiz, Madelaine Herminia Hernandez, Tam Hoang Duong, Scott G Leslie, Allen R Hefner Jr
Abstract: The DARPA WBGS-HPE program is developing 100 A, 10 kV SiC power modules to demonstrate the viability of a 2.75 MVA Solid State Power Substation that uses 10 kV, 20 kHz switching-capable devices. Thermal network component models for these modules are ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33007

35. Vertical Insulated Gate Bipolar Transistor Lumped Model and Saber Simulator Implementation
Topic: Electric Power Metrology
Published: 5/1/1994
Author: Allen R Hefner Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13056