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Topic Area: Electric Power Metrology
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Displaying records 11 to 20 of 38 records.
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11. Electro-Thermal Simulation of a 100 A, 10 kV Half-Bridge SiC MOSFET/JBS Power Module
Topic: Electric Power Metrology
Published: 6/13/2008
Authors: Tam Hoang Duong, Jose Miguel Ortiz, R. N Raju, Allen R Hefner Jr
Abstract: This paper presents the results from a parametric simulation study that was conducted to optimize the performance of 100 A, 10 kV, 20 kHz half-bridge SiC MOSFET/JBS power modules. The power modules are being developed by the DARPA WBGS-HPE Phase II p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33006

12. Electro-thermal-mechanical Simulation and Reliability for Plug-in Vehicle Converters and Inverters
Topic: Electric Power Metrology
Published: 2/24/2011
Author: Allen R Hefner Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908465

13. Energy Storage Distributed Energy Resource (ES-DER), Priority Action Plan
Topic: Electric Power Metrology
Published: 11/18/2009
Author: Allen R Hefner Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907124

14. Energy Storage -- Distributed Energy Resource (ES-DER), Standards Goals and Scoping Document Status
Topic: Electric Power Metrology
Published: 5/25/2010
Author: Allen R Hefner Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907123

15. Energy Storage Priority Action Plan for Smart Grid Interoperability
Topic: Electric Power Metrology
Published: 12/11/2009
Author: Allen R Hefner Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907117

16. Evaluation of Energy Consumption Rating Methods for Thermoelectric Wine Chillers and Compact Refrigerators
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7963
Topic: Electric Power Metrology
Published: 10/21/2013
Authors: David A Yashar, Young-Jin Baik
Abstract: Most types of refrigerating appliances are rated according to an established test procedure and their energy use is regulated by the US Department of energy. These products are generally built around a vapor compression system that is used to maintai ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914637

17. High Temperature, High Power Module Design for Wide Bandgap Semiconductors: Packaging Architecture and Materials Considerations
Topic: Electric Power Metrology
Published: 5/1/2008
Authors: Allen R Hefner Jr, Z. John Shen, Ryan McClure, Ali Gordon, Brian Grummel
Abstract: Wide bandgap power semiconductors such as SiC or GaN can safely operate at a junction temperature of 500°C. Such a high operating temperature range can substantially relax or completely eliminate the need for bulky and costly cooling components ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33018

18. High-Voltage Isolated Gate Drive Circuit for 10 kV, 100 A SiC MOSFET/JBS Power Modules
Topic: Electric Power Metrology
Published: 6/2/2008
Authors: David W. Berning, Tam Hoang Duong, Jose Miguel Ortiz, Angel Rivera, Allen R Hefner Jr
Abstract: A high-current, high-voltage-isolated gate drive circuit developed for characterization of high-voltage, high-frequency 10 kV, 100 A SiC MOSFET/JBS half-bridge power modules is presented and described. Gate driver characterization and simulation have ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33062

19. INFLUENCE OF CURRENT AND VOLTAGE HARMONIC DISTORTION ON THE POWER MEASUREMENT OF LED LAMPS AND LUMINAIRES
Topic: Electric Power Metrology
Published: 4/15/2013
Authors: Christophe Martinsons, Yuqin Zong, Carl C Miller, Yoshihiro Ohno
Abstract: Specific issues appear in the measurement of the electrical power of AC-powered LED lamps and luminaires because they often generate harmonic currents in a wide frequency range. The topic of this paper is to clarify the impact of these harmonic curre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913513

20. Inverter Dynamic Electro-Thermal Modeling and Simulation with Experimental Verification
Topic: Electric Power Metrology
Published: 4/1/2005
Authors: John V. Reichl, Allen R Hefner Jr, Ty R. McNutt, David W. Berning
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906291



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