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Displaying records 511 to 518.
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511. Well Coupled, Low Noise, dc SQUIDs
Topic: Sensors
Published: 3/1/1985
Authors: B. Muhlfelder, James A Beall, M. W. Cromar, Ronald H. Ono, W. Johnson

512. Wide-Band Low Noise mm-Wave SIS Mixers with a Single Tuning Element
Topic: Sensors
Published: 12/31/1986
Authors: A. V. Raisanen, D. G. Crete, P. L. Richards, F. L. Lloyd

513. Wireless Sensor Network Performance Metrics for Building Applications
Topic: Sensors
Published: 4/1/2010
Authors: Won Suk Jang, William M Healy
Abstract: Metrics are investigated to help assess the performance of wireless sensors in buildings. Wireless sensor networks present tremendous opportunities for energy savings and improvement in occupant comfort in buildings by making data about conditions a ...

514. Work Function Characterization of TaSiN and TaCN Electrodes Using CV, IV, IPE and SKPM
Topic: Sensors
Published: 11/1/2006
Authors: Hao Xiong, Nhan V Nguyen, Joseph J Kopanski, John S Suehle, Eric M. Vogel
Abstract: Work function of TaSiN (TaCN) films on HfO2 or SiO2 gate dielectrics is investigated for the first time using a combination of Capacitance?Voltage, Fowler?Nordheim tunneling, internal Photoemission, and scanning Kelevin probe microscopy methods, whic ...

515. YBa^d2^Cu^d3^O^d7-x^ Josephson Junctions on Bicrystal Al^d2^O^d3^ and Sr TiO^d3^ Substrates
Topic: Sensors
Published: 6/1/1997
Authors: Leila R Vale, Ronald H. Ono, David A Rudman

516. YBa^d2^Cu^d3^O^dx^/Insulator Multi-layers for Crossover Fabrication
Topic: Sensors
Published: 3/1/1991
Authors: James A Beall, M. W. Cromar, Todd E Harvey, Martin Johansson, Ronald H. Ono, David A Rudman, A. J. Nelson, S. E. Asher, A. B. Swartzlander

517. Yba^d2^Cu^d3^O^d7-x^ to Si Interconnection for Hybrid Superconductor/Semiconductor Integration
Topic: Sensors
Published: 11/2/1992
Authors: Todd E Harvey, John M Moreland, B. Jeanneret, Ronald H. Ono, David A Rudman

518. ^u199^Hg^+^ Optical Frequency Standard: Progress Report
Topic: Sensors
Published: 4/1/1999
Authors: R J Rafac, B. Young, J. E. Cruz, James A Beall, J. C. Bergquist, Wayne M Itano, David J Wineland

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
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  • SP 823-XX: Integrated Services Digital Network Series