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Topic Area: Semiconductors

Displaying records 31 to 40 of 147 records.
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31. Status of Interagency Advanced Power Group (IAPG), Electrical Systems Working Group (ESWG)
Topic: Semiconductors
Published: 12/1/2010
Author: Allen R Hefner Jr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908470

32. US Anti-Counterfeiting Standards Development Activities: An Overview
Topic: Semiconductors
Published: 12/1/2010
Authors: Yaw S Obeng, Eric D Simmon, YaShian Li-Baboud
Abstract: Counterfeit electronics components impact performance, hence can be viewed as a reliability concern. Several different strategies have been proposed to mitigate the penetration and impact of counterfeits on the supply chain. Standards afford effe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907215

33. Characterization of a Soluble Anthradithiophene Derivative
Topic: Semiconductors
Published: 10/1/2010
Authors: Brad Conrad, Calvin Chan, Marsha A. Loth, Sean R Parkin, Xinran Zhang, John E Anthony, David J Gundlach
Abstract: The structural and electrical properties of a new solution processable material, 2,8-diflouro-5,11-tert-butyldimethylsilylethynl anthradithiophene (TBDMS), were measured for single crystal and spun cast thin-film transistors. TBDMS is observed to rea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905704

34. Graphene Nanoribbon Tunnel FETs
Topic: Semiconductors
Published: 9/21/2010
Author: Qin Q. Zhang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907100

35. Graphene Nanoribbon Schottky-barrier FETs for End-of-the-roadmap CMOS: Challenges and Opportunities
Topic: Semiconductors
Published: 6/23/2010
Authors: Qin Q. Zhang, Yeqing Lu, Huili Xing, Curt A Richter, Steven J Koester, Siyuranga Koswatta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907102

36. Tensile measurement of single crystal gallium nitride nanowires on MEMS test stages
Topic: Semiconductors
Published: 4/18/2010
Authors: J. J. Brown, A. I. Baca, Kristine A Bertness, D. A. Dikin, R. S. Ruoff, Victor M. Bright
Abstract: This paper reports the first direct tensile tests on nearly defect free, n-type (Si-doped) gallium nitride single crystal nanowires. Here, for the first time, nanowires have been integrated with actuated, active microelectromechanical (MEMS) structur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902539

37. Structural and Electrical Characterization of Flip Chip Laminated omega-functionalized thiols
Topic: Semiconductors
Published: 4/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907067

38. Challenges and Opportunities of Organic Electronics
Topic: Semiconductors
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

39. Probing Single Nanometer-Scale Pores with Polymeric Molecular Rulers
Topic: Semiconductors
Published: 4/2/2010
Authors: Sarah E Henrickson, Edmund A DiMarzio, Qian Wang, Vincent M Stanford, John J Kasianowicz
Abstract: It has been shown that individual molecules of single stranded DNA can be driven electrophoretically through a single Staphylococcus aureus ?-hemolysin ion channel. Polynucleotides thread through the channel as extended chains and the polymer-induced ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32215

40. Organic Electronics: Challenges and Opportunities
Topic: Semiconductors
Published: 3/31/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905389



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