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Topic Area: Semiconductors

Displaying records 141 to 150 of 152 records.
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141. Reliability of Ultra-Thin Silicon Dioxide Under Substrate Hot-Electronic, Substrate Hot-Hole, and Tunneling Stress
Topic: Semiconductors
Published: 11/1/2001
Authors: Eric M. Vogel, Monica D Edelstein, John S Suehle
Abstract: Substrate hot-electron and substrate hot-hole injection experiments are used to provide insight into defect generation and breakdown of ultra-thin silicon dioxide under constant voltage tunneling stress. Results from substrate hot-electron injection ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25004

142. Embedded Decoupling Capacitance Materials Characterization
Topic: Semiconductors
Published: 12/1/2000
Author: Jan Obrzut
Abstract: The dielectric constant of the embedded capacitance materials was measured in the frequency range from 100 Hz to 5 GHz. The testing included evaluation of the capacitance density, leakage current, and the effect of HAST on the capacitance. A test sp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851697

143. Micromachined Branch Line Coupler in CMOS Technology
Topic: Semiconductors
Published: 6/1/2000
Authors: Mehmet Ozgur, Ulas C. Kozat, Mona Elwakkad Zaghloul, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906354

144. Charaterization of PFC Emissions from Semiconductor Process Tools
Topic: Semiconductors
Published: 9/1/1998
Authors: David S. Green, J. Meyers
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903728

145. Interconnection Continuity Test for Packaged Functional Modules
Topic: Semiconductors
Published: 3/3/1998
Author: Jan Obrzut
Abstract: We developed an electrical test to evaluate interconnections in packaged, electrostatic-discharge (ESD) protected modules. The ESD protection circuit, which in modern integrated circuits is present at every I/O as an inherent part of the chip struct ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854051

146. Building-In Reliability: Making It Work
Topic: Semiconductors
Published: 5/1/1991
Authors: Harry A. Schafft, D F Lee, P. E. Kennedy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6948

147. An Evaluation of Instrumental Correction Factors for Infrared Absorption Concentration Measurements,
Topic: Semiconductors
Published: 12/31/1989
Authors: D. Baghdadi, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=26303

148. Current Status of, and Future Directions in, Silicon Photodiode Self-Calibration
Topic: Semiconductors
Published: 12/31/1989
Author: Jon C Geist
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29375

149. The Absorption Cross Section of As in Si
Topic: Semiconductors
Published: 12/31/1989
Authors: Jon C Geist, M. G. Stapelbroek, M. D. Petroff
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10869

150. 2014 INTERNATIONAL TECHNOLOGY ROADMAP FOR SEMICONDUCTORS RADIO FREQUENCY AND ANALOG/MIXED-SIGNAL TECHNOLOGIES
Topic: Semiconductors
Published: Date unknown
Author: Herbert S Bennett
Abstract: Radio frequency (RF), high frequency (HF), and analog/mixed-signal (AMS) technologies serve the rapidly growing communications markets that include many of the physical components for the Internet of Everything (IoE) (e.g., http://www.cisco.com/w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917231



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