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Topic Area: Quantum Electrical Measurements
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Displaying records 261 to 270 of 303 records.
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261. Sources of Uncertainty in a DVM-Based Measurement System for a Quantized Hall Resistance Standard
Series: Journal of Research (NIST JRES)
Topic: Quantum Electrical Measurements
Published: 5/1/1994
Authors: Kevin C. Lee, Marvin E. Cage, P. S. Rowe
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15964

262. Spectroscopic Study of Quantized Breakdown Voltage States of the Quantum Hall Effect
Series: Journal of Research (NIST JRES)
Topic: Quantum Electrical Measurements
Published: 11/1/1994
Authors: C. F. Lavine, Marvin E. Cage, Randolph E Elmquist
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16570

263. Stable 1 Volt Programmable Voltage Standard
Topic: Quantum Electrical Measurements
Published: 9/1/1997
Authors: Samuel Paul Benz, Clark A. Hamilton, Charles J Burroughs, Todd E Harvey, Laurie Christian
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21414

264. Stacked Nanoscale Josephson Junction Arrays for High-Performance Voltage Standards
Topic: Quantum Electrical Measurements
Published: 12/4/2002
Authors: Samuel Paul Benz, Paul David Dresselhaus, Yonuk Chong, Charles J Burroughs
Abstract: Superconducting Josephson voltage standard systems have replaced electrochemical cell (battery-like) artifact standards for voltage metrology because quantum-based systems produce precise and accurate voltages independent of any material parameters. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30904

265. Stacked SNS Josephson Junction Arrays for Quantum Voltage Standards
Topic: Quantum Electrical Measurements
Published: 6/1/2003
Authors: Paul David Dresselhaus, Yonuk Chong, J. Plantenberg, Samuel Paul Benz
Abstract: NIST is using and developing superconductor-normal metal-superconductor (SNS) Josephson arrays for both programmable DC and AC voltage standards. Increasing the output voltage is difficult because the output voltage per junction is small; hence serie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30315

266. Stacked SNS Josephson Junctions for Quantum Voltage Applications
Topic: Quantum Electrical Measurements
Published: 7/11/2003
Authors: Paul David Dresselhaus, Yonuk Chong, Samuel Paul Benz
Abstract: NIST is using SNS Josephson junctions as the basis of quantum voltage metrology. Planar junction technology limits the voltage and bandwidth of these systems due to parasitic inductances and the transit time of waveforms through the transmission line ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31365

267. Status of the Quantum Hall Resistance RISP
Topic: Quantum Electrical Measurements
Published: 7/1/1994
Author: Randolph E Elmquist
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13807

268. Suggested Triple-Series Connection Measurement Tests of the AC Quantized Hall Resistance and the AC Longitudinal Resistance
Topic: Quantum Electrical Measurements
Published: 7/1/1998
Authors: Marvin E. Cage, Anne-Marie Jeffery, Randolph E Elmquist
Abstract: We find from equivalent circuit calculations that a single ac ratio bridge could be used to measure the ac quantized Hall resistance and to also provide independent values of the ac longitudinal resistance in a quantum Hall effect device by making qu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29591

269. Synthesizing Accurate Voltages with Superconducting Quantum-Based Standards
Topic: Quantum Electrical Measurements
Published: 6/1/2010
Author: Samuel Paul Benz
Abstract: Over the past three decades, the quantum behavior of superconducting Josephson junctions were exploited to dramatically improve the accuracy of dc voltage measurements. Within the past couple years, new superconducting devices, circuits, systems and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905041

270. Systematic Error Analysis of Stepwise Approximated AC Waveforms Generated by Programmable Josephson Voltage Standards
Topic: Quantum Electrical Measurements
Published: 4/1/2009
Authors: Charles J Burroughs, Alain Rufenacht, Samuel Paul Benz, Paul David Dresselhaus
Abstract: We have measured stepwise-approximated sine waves generated by a Programmable Josephson Voltage Standard (PJVS) with several different output configurations. These data are analyzed to characterize the dominant error mechanisms for rms applications, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33063



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