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Topic Area: Quantum Electrical Measurements
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Displaying records 261 to 270 of 300 records.
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261. Stacked Nanoscale Josephson Junction Arrays for High-Performance Voltage Standards
Topic: Quantum Electrical Measurements
Published: 12/4/2002
Authors: Samuel Paul Benz, Paul David Dresselhaus, Yonuk Chong, Charles J Burroughs
Abstract: Superconducting Josephson voltage standard systems have replaced electrochemical cell (battery-like) artifact standards for voltage metrology because quantum-based systems produce precise and accurate voltages independent of any material parameters. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30904

262. Stacked SNS Josephson Junction Arrays for Quantum Voltage Standards
Topic: Quantum Electrical Measurements
Published: 6/1/2003
Authors: Paul David Dresselhaus, Yonuk Chong, J. Plantenberg, Samuel Paul Benz
Abstract: NIST is using and developing superconductor-normal metal-superconductor (SNS) Josephson arrays for both programmable DC and AC voltage standards. Increasing the output voltage is difficult because the output voltage per junction is small; hence serie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30315

263. Stacked SNS Josephson Junctions for Quantum Voltage Applications
Topic: Quantum Electrical Measurements
Published: 7/11/2003
Authors: Paul David Dresselhaus, Yonuk Chong, Samuel Paul Benz
Abstract: NIST is using SNS Josephson junctions as the basis of quantum voltage metrology. Planar junction technology limits the voltage and bandwidth of these systems due to parasitic inductances and the transit time of waveforms through the transmission line ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31365

264. Status of the Quantum Hall Resistance RISP
Topic: Quantum Electrical Measurements
Published: 7/1/1994
Author: Randolph E Elmquist
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13807

265. Suggested Triple-Series Connection Measurement Tests of the AC Quantized Hall Resistance and the AC Longitudinal Resistance
Topic: Quantum Electrical Measurements
Published: 7/1/1998
Authors: Marvin E. Cage, Anne-Marie Jeffery, Randolph E Elmquist
Abstract: We find from equivalent circuit calculations that a single ac ratio bridge could be used to measure the ac quantized Hall resistance and to also provide independent values of the ac longitudinal resistance in a quantum Hall effect device by making qu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29591

266. Synthesizing Accurate Voltages with Superconducting Quantum-Based Standards
Topic: Quantum Electrical Measurements
Published: 6/1/2010
Author: Samuel Paul Benz
Abstract: Over the past three decades, the quantum behavior of superconducting Josephson junctions were exploited to dramatically improve the accuracy of dc voltage measurements. Within the past couple years, new superconducting devices, circuits, systems and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905041

267. Systematic Error Analysis of Stepwise Approximated AC Waveforms Generated by Programmable Josephson Voltage Standards
Topic: Quantum Electrical Measurements
Published: 4/1/2009
Authors: Charles J Burroughs, Alain Rufenacht, Samuel Paul Benz, Paul David Dresselhaus
Abstract: We have measured stepwise-approximated sine waves generated by a Programmable Josephson Voltage Standard (PJVS) with several different output configurations. These data are analyzed to characterize the dominant error mechanisms for rms applications, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33063

268. Systematic Error Analysis of Stepwise Approximated AC Waveforms Generated by a Programmable Josephson Voltage Standard
Topic: Quantum Electrical Measurements
Published: 6/22/2007
Authors: Charles J Burroughs, Alain Rufenacht, Samuel Paul Benz, Paul David Dresselhaus
Abstract: We have measured stepwise-approximated sinewaves generated by a Programmable Josephson Voltage Standard with several different output configurations. These data are analyzed to characterize the dominant error mechanisms for rms applications, such as ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32893

269. Systematic-Error Signals in the AC Josephson Voltage Standard: Measurement and Reduction
Topic: Quantum Electrical Measurements
Published: 6/30/2008
Authors: Regis Landim, Samuel Paul Benz, Paul David Dresselhaus, Charles J Burroughs
Abstract: We investigate the dominant frequency-dependent systematic error signals (SES) in the ac Josephson voltage standard. We describe our error measurement technique and a number of methods to reduce the errors. Most importantly we found that a small chan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32671

270. Tapered Transmission Lines with Dissipative Junctions
Topic: Quantum Electrical Measurements
Published: 6/3/2009
Authors: Paul David Dresselhaus, Mike Elsbury, Samuel Paul Benz
Abstract: NIST is optimizing the design of a 10 V programmable Josephson voltage standard so that it uses less microwave power by use of fewer parallel-biased arrays with higher voltage per array. Increasing the voltage per array by adding more junctions is ch ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33154



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