NIST logo

Publications Portal

You searched on:
Topic Area: Quantum Electrical Measurements

Displaying records 41 to 50 of 303 records.
Resort by: Date / Title


41. Nonlinear Behavior of Electronic Components Characterized with Precision Multitones from a Josephson Arbitrary Waveform Synthesizer
Topic: Quantum Electrical Measurements
Published: 6/3/2009
Authors: Samuel Paul Benz, Ryan C. Toonen
Abstract: We have extended the application of quantum-based electrical standards from single frequency calibrations to multi-tone tests that can be used to characterize the nonlinear behavior of electronic components and circuits. Specifically, we have used a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33176

42. Tapered Transmission Lines with Dissipative Junctions
Topic: Quantum Electrical Measurements
Published: 6/3/2009
Authors: Paul David Dresselhaus, Mike Elsbury, Samuel Paul Benz
Abstract: NIST is optimizing the design of a 10 V programmable Josephson voltage standard so that it uses less microwave power by use of fewer parallel-biased arrays with higher voltage per array. Increasing the voltage per array by adding more junctions is ch ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33154

43. Application of the Josephson effect in electrical metrology
Topic: Quantum Electrical Measurements
Published: 6/1/2009
Authors: Samuel Paul Benz, B. Jeanneret
Abstract: Over the last 30 years, metrology laboratories have used the quantum behavior of the Josephson effect to greatly improve voltage metrology. The following article reviews the history and present status of the research and development Josephson voltage ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32961

44. AC Power Standard Using a Programmable Josephson Voltage Standard
Topic: Quantum Electrical Measurements
Published: 4/1/2009
Authors: Bryan C Waltrip, Bo Gong, Thomas L Nelson, Yicheng Wang, Charles J Burroughs, Alain Rufenacht, Samuel Paul Benz, Paul David Dresselhaus
Abstract: This paper describes the implementation of a new quantum-based system for the generation of 120 V rms, 5 A rms, sinusoidal, active and reactive power over the 50 Hz to 400 Hz frequency range. The system accurately relates the spectral amplitudes and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33201

45. Improvements in the NIST Johnson Noise Thermometry System
Topic: Quantum Electrical Measurements
Published: 4/1/2009
Authors: Samuel Paul Benz, Jifeng Qu, Horst Rogalla, D. R White, Paul David Dresselhaus, Weston Leo Tew, Sae Woo Nam
Abstract: We have developed a Johnson noise thermometry (JNT) system that is calibrated by precision waveforms synthesized with a quantized voltage noise source (QVNS). Significant improvements to the QVNS and the cross-correlation measurement electronics have ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33058

46. Operating Margins for a Pulse-Driven Josephson Arbitrary Waveform Synthesizer Using a Ternary Bit-Stream Generator
Topic: Quantum Electrical Measurements
Published: 4/1/2009
Authors: Ernest Houtzager, Samuel Paul Benz, Helko vanden Brom
Abstract: We describe measurements with a pulse-driven Josephson arbitrary waveform synthesizer (JAWS) that uses a ternary arbitrary bit-stream generator as the bias source. This system is meant to be used as an AC Josephson voltage standard (ACJVS). From thes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33059

47. Precision Differential Sampling Measurements of Low-Frequency Synthesized Sine Waves with an AC Programmable Josephson Voltage Standard
Topic: Quantum Electrical Measurements
Published: 4/1/2009
Authors: Alain Rufenacht, Charles J Burroughs, Samuel Paul Benz, Paul David Dresselhaus, Bryan C Waltrip, Thomas L Nelson
Abstract: We have developed a precision technique to measure sine wave sources with the use of a quantum-accurate ac programmable Josephson voltage standard. This paper describes a differential method that uses an integrating sampling voltmeter to precisely de ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33051

48. Progress toward a 1 V Pulse-Driven AC Josephson Voltage Standard
Topic: Quantum Electrical Measurements
Published: 4/1/2009
Authors: Samuel Paul Benz, Paul David Dresselhaus, Alain Rufenacht, Norman F Bergren, Joseph R. Mr. (Joseph R.) Kinard Jr., Regis Landim
Abstract: We present a new record rms output voltage of 275 mV, which is a 25 % improvement over the maximum achieved with previous ac Josephson voltage standard (ACJVS) circuits. We demonstrate operating margins for these circuits and use them to measure the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33061

49. Systematic Error Analysis of Stepwise Approximated AC Waveforms Generated by Programmable Josephson Voltage Standards
Topic: Quantum Electrical Measurements
Published: 4/1/2009
Authors: Charles J Burroughs, Alain Rufenacht, Samuel Paul Benz, Paul David Dresselhaus
Abstract: We have measured stepwise-approximated sine waves generated by a Programmable Josephson Voltage Standard (PJVS) with several different output configurations. These data are analyzed to characterize the dominant error mechanisms for rms applications, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33063

50. EEEL Technical Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7568
Topic: Quantum Electrical Measurements
Published: 3/30/2009
Author: Erik M Secula
Abstract: This document describes the technical work of the Electronics and Electrical Engineering Laboratory. In this report, you will find that EEEL researchers are developing the world's most advanced sensors, providing advanced gamma ray imagers for astro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901701



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series