NIST logo

Publications Portal

You searched on:
Topic Area: Optoelectronics
Sorted by: title

Displaying records 21 to 30 of 63 records.
Resort by: Date / Title


21. Efficient Greens Function Modeling of Line and Surface Defects in Multilayered Anisotropic Elastic and Piezoelectric Material
Topic: Optoelectronics
Published: 10/2/2006
Authors: B. Yang, Vinod K Tewary
Abstract: Greens function (GF) modeling defects may take effect only if the GF as well as its various integrals over a line, a surface and/or a small volume can be efficiently evaluated. The GF itself is needed in modeling a point defect while the integrals ne ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851356

22. Electron Microscope Study of Strain in InGaN Quantum Wells in GaN Nanowires
Topic: Optoelectronics
Published: 4/1/2009
Authors: Roy Howard Geiss, David Thomas Read
Abstract: GaN nanowires with InGaN quantum wells (QW) were grown on heated Si(111) substrates by molecular beam epitaxy (MBE) using elemental Ga and In and a radio-frequency-plasma N2 source. The growth procedures and the morphology of these nanowires have bee ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902327

23. Enhanced coupling between light and surface plasmons by nanostructured Fabry-Pérot resonator
Topic: Optoelectronics
Published: 9/26/2011
Authors: Brian S. Dennis, Vladimir A Aksyuk, Michael Haftel, Stefan T. Koev, Girsh Blumberg
Abstract: It is recognized that surface plasmons (SPs),which can be present on particulate, smooth, or corrugated metallic surfaces, have enormous potential in the fields of novel nano-optical and opto-electronic devices, as well as in spectroscopic, biologic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907837

24. Frequency Characterization of an External-Cavity Quantum Cascade Laser at 4.5 {mu}m using a Frequency Comb
Topic: Optoelectronics
Published: 1/25/2012
Authors: Kevin Otis Knabe, Paul A Williams, Fabrizio Raphael Giorgetta, Chris Armacost, Michael Radunsky, Nathan Reynolds Newbury
Abstract: We measure the frequency noise spectrum of a free-running external-cavity quantum cascade laser at 4.5 {mu}m through sum frequency generation with a fiber frequency comb.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909814

25. Full PMD vector measured directly from modulated data using linear optical sampling
Topic: Optoelectronics
Published: 7/15/2009
Authors: Paul A Williams, Tasshi Dennis
Abstract: We demonstrate a new technique to monitor the polarization-mode dispersion in a fiber communication channel by analyzing the modulated data at the fiber output measured with Polarization-Sensitive Linear Optical Sampling (PS-LOS).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902416

26. Gallium Nitride Nanowires for On-Chip Optical Interconnects on Ex-Situ Substrates
Topic: Optoelectronics
Published: 1/16/2013
Authors: Matthew David Brubaker, Paul Timothy Blanchard, John B Schlager, Aric Warner Sanders, Alexana Roshko, Shannon Marie Madison Duff, Jason Gray, Victor M. Bright, Norman A Sanford, Kristine A Bertness
Abstract: In this letter we report on the fabrication, device characteristics, and optical coupling of a two-nanowire device comprising light-emitting diode and photoconductive GaN nanowires. Axial p-n junction GaN nanowires were grown by molecular beam epita ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912280

27. Gallium nitride nanowire electromechanical resonators with piezoresistive readout
Topic: Optoelectronics
Published: 8/11/2011
Authors: Kristine A Bertness, Jason M. Gray, Norman A Sanford, Charles T. Rogers
Abstract: We report on the fabrication, piezoresistive readout, and frequency response of doubly-clamped c-axis gallium nitride (GaN) nanowire (NW) resonators that show mechanical quality factors exceeding 10,000. The devices are fabricated using a combination ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907884

28. High-Accuracy Photoreceiver Frequency Response Measurements at 1.55 um by Use of a Heterodyne Phase-Locked Loop
Topic: Optoelectronics
Published: 9/29/2011
Authors: Tasshi Dennis, Paul D Hale
Abstract: We demonstrate a high-accuracy heterodyne measurement system for characterizing the magnitude of the frequency response of high-speed 1.55 µm photoreceivers from 2 MHz to greater than 50 GHz. At measurement frequencies below 2 GHz, we employ a phase- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908885

29. Improved Thermal Detector Coatings for Laser Radiometry at NIST
Topic: Optoelectronics
Published: 2/27/2006
Author: John H Lehman
Abstract: Nearly all of the radiometric standards for laser power and energy measurements at NIST and elsewhere in the world are based on thermal detectors. These detectors usually rely on a thermal absorber coating to enhance the detector responsivity. Ideall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32136

30. Lateral variations in self-assembled InGaAs quantum dot distributions
Topic: Optoelectronics
Published: 6/26/2009
Authors: Alexana Roshko, Todd E Harvey, Brittany L Hyland, Lehman Y Susan, Keith D Cobry
Abstract: The lateral uniformity of self-assembled InGaAs quantum dots grown by molecular beam epitaxy(MBE) was assessed as a function of growth conditions. Variations in the dot density and height were determined from atomic force micrographs. Growth rate h ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32815



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series