NIST logo

Publications Portal

You searched on:
Topic Area: Optoelectronics
Sorted by: title

Displaying records 11 to 20 of 70 records.
Resort by: Date / Title


11. Catalyst-free GaN Nanowires as Nanoscale Light Emitters
Topic: Optoelectronics
Published: Date unknown
Authors: Kristine A Bertness, Norman A Sanford, John B Schlager, Alexana Roshko, Todd E Harvey, Paul Timothy Blanchard, Matthew David Brubaker, Andrew M. Herrero, Aric Warner Sanders
Abstract: Catalyst-free growth of GaN nanowires with molecular beam epitaxy produces material of exceptionally high quality with long minority carrier lifetimes and low surface recombination velocity. The nanowires grow by thermodynamic driving forces that enh ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910889

12. Catalyst-free GaN nanowire growth and optoelectronic characterization
Topic: Optoelectronics
Published: 8/19/2011
Authors: Kristine A Bertness, Norman A Sanford, John B Schlager
Abstract: We discuss the present state-of-the-art concerning the growth mechanism, optical luminescence and electrical properties for GaN nanowires grown with catalyst-free molecular beam epitaxy. These nanowires are essentially defect-free and display long p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906115

13. Characterizing a Noninsertable Directional Device Using the NIST Uncertainty Framework
Topic: Optoelectronics
Published: 6/6/2014
Authors: Jeffrey A Jargon, Dylan F Williams, Paul D Hale, Michael D Janezic
Abstract: We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913524

14. Chirp characterization of external modulators with finite extinction ratio using linear optical sampling
Topic: Optoelectronics
Published: 5/1/2010
Authors: Tasshi Dennis, Paul A Williams
Abstract: We demonstrate a network monitoring technique for the frequency chirping of external modulators based on linear optical sampling. We present α parameter waveforms of digital data modulation from simultaneously measured amplitude and phase. Digit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904102

15. Comb-assisted swept laser spectroscopy with a mode-hop free tunable external cavity QCL
Topic: Optoelectronics
Published: 5/1/2012
Authors: Kevin O. (Kevin) Knabe, Fabrizio Raphael Giorgetta, Nathan Reynolds Newbury, Chris Armacost, Michael Radunsky, Sam Crivello, Timothy Day, Paul A Williams
Abstract: We demonstrate sub-MHz spectral resolution of N^d2^O absorption spectra acquired with a swept external-cavity quantum cascade laser (QCL) over 0.87 THz. The QCL frequency is monitored by sum -frequency generation with an optical fiber frequency comb.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910257

16. Comparison of absolute measurements of laser power using next generation NIST high power radiometer and Air Force high power calorimeter
Topic: Optoelectronics
Published: 6/8/2011
Authors: Marla L Dowell, Christopher L Cromer, Xiaoyu X. Li, John Bagford, Dan Seibert, John Eric, David Cooper, Steven Comisford, Ernie Cromwell, Richard Bowling
Abstract: We report comparisons of laser power measurements between the new NIST radiometer, also known as the BB Prime, and the current Air Force standards, known as the BB calorimeter. [1] These measurements were performed using high power laser sources in t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908402

17. Dark pulse quantum dot diode laser
Topic: Optoelectronics
Published: 6/7/2010
Authors: Mingming M. Feng, Kevin Lawrence Silverman, Richard P Mirin, Steven T Cundiff
Abstract: We describe an operating regime for passively mode-locked quantum dot diode laser where the output consists of a train of dark pulses, i.e., intensity dips on a continuous background. We show that a dark pulse train is a solution to the master equati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907918

18. Determination of graphene work function and graphene-insulator-semiconductor band alignment by internal photoemission spectroscopy
Topic: Optoelectronics
Published: 7/11/2012
Authors: Rusen Yan, Qin Q. Zhang, Wei Li, Irene G. Calizo, Tian T. Shen, Curt A Richter, Angela R Hight Walker, Xuelei X. Liang, David J Gundlach, Nhan V Nguyen, Huili Grace Xing, Alan Seabaugh
Abstract: We determined the band alignment of a graphene-oxide-silicon structure using internal photoemission spectroscopy. From the flatband voltage and Dirac voltage we infer a 4.3  10e11 cm-2 negative extrinsic charge present on the graphene surface. Als ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911396

19. Direct measurement of vector polarization-mode dispersion from repeated random data by use of linear optical sampling
Topic: Optoelectronics
Published: 3/1/2010
Authors: Paul A Williams, Tasshi Dennis
Abstract: Polarization-dependent optical sampling techniques measure the complex electric field, allowing one to monitor the degrading effects of a communication channel. Here we show the ability to extract the polarization-mode dispersion of the transmission ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903751

20. Dual-rate linear optical sampling for remote monitoring of complex modulation formats
Topic: Optoelectronics
Published: 6/2/2010
Authors: Tasshi Dennis, Paul A Williams
Abstract: We demonstrate linear optical sampling using simultaneous pulsed and CW local oscillators to enable phase tracking of a data modulated carrier. The technique enables the direct measurement of remotely received signals with low phase noise.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904987



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series