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Topic Area: Optoelectronics
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Displaying records 1 to 10 of 63 records.
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1. A General Approach to Low noise Readout of Terahertz Imaging Arrays
Topic: Optoelectronics
Published: Date unknown
Authors: Erich N Grossman, Jonathan D Chisum, Zoya Popovic
Abstract: This article describes the theory and design of an ultra-low noise electronic readout circuit for use with room temperature video-rate terahertz imaging arrays. First, the. noise characteristics of various imaging detectors,including low resistance b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908220

2. Absolute Absorptivity of Single-walled Carbon Nanotubes Employing a Pyroelectric Detector
Topic: Optoelectronics
Published: 12/20/2006
Authors: Katie Hurst, Anne Dillon, John H Lehman
Abstract: Optical properties are important for determining fundamental characteristics of carbon single-walled nanotube (SWNT) samples including purity, chirality, and tube diameter. Previously, we have estimated the volume fraction of metallic versus semicond ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32551

3. Absorption, transmission, and scattering of expanded polystyrene at millimeter-wave and terahertz frequencies
Topic: Optoelectronics
Published: 3/17/2008
Authors: Charles Dietlein, Jon E. Bjarnason, Erich N Grossman, Zoya Popovic
Abstract: Conventional material measurements of transmission and reflection in the millimeter-wave and terahertz frequency range do not differentiate between scattering and absorption, grouping effects from both mechanisms together into 'loss'. Accurate knowle ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32981

4. Analysis of trace impurities in semiconductor gas via cavity-enhanced direct frequency comb spectroscopy
Topic: Optoelectronics
Published: 7/20/2010
Authors: Kristine A Bertness, Kevin C Cossel, F Adler, M J Thorpe, Jun Ye
Abstract: Cavity-enhanced direct frequency comb spectroscopy (CE-DFCS) has demonstrated powerful potential for trace-gas detection based on its unique combination of high bandwidth, rapid data acquisition, high sensitivity, and high resolution, which is unava ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908253

5. Analyzing quantitative light scattering spectra of phantoms measured with optical coherence tomography
Topic: Optoelectronics
Published: 3/1/2008
Authors: Tasshi Dennis, Shellee Dawn Dyer, Andrew Dienstfrey, Gurpreet Singh, Paul Rice
Abstract: We demonstrate the ability of multiple forms of optical coherence tomography (OCT) in the frequency domain to quantitatively size scatterers. Combined with a variety of distinct phantoms, we gain insight into the measurement uncertainties associated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32640

6. Application of carbon nanotube coatings for laser measurements
Topic: Optoelectronics
Published: 10/17/2005
Authors: John H Lehman, Paul Rice, Natalia Varaksa, Chaiwat Engtrakul, Anne Dillon
Abstract: We have demonstrated coatings based on carbon nanotubes (CNTs) on a variety of detector platforms for laser power and energy measurement standards. These coatings must be resistant to damage and aging while maintaining desirable optical and thermal p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32127

7. Applications of artificial neural networks in optical performance monitoring
Topic: Optoelectronics
Published: 8/15/2009
Authors: Jeffrey A Jargon, Xiaoxia Wu, Ronald Skoog, Loukas Paraschis, Alan Willner
Abstract: Applications using artificial neural networks (ANNs) for optical performance monitoring (OPM) are proposed and demonstrated. Simultaneous identification of optical signal-to-noise-ratio (OSNR), chromatic dispersion (CD), and polarization-mode-dispers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901396

8. Bilateral comparison of power measurement standards for KrF lasers between PTB and NIST
Topic: Optoelectronics
Published: 5/2/2010
Authors: Marla L Dowell, Christopher L Cromer, Darryl A. Keenan, Stefan Kuck, Friedhelm Brandt
Abstract: We report results of the first bilateral laser power comparison for 248-nm KrF excimer lasers accomplished by the National Metrology Institutes of Germany (Physikalisch-Technische Bundesanstalt, PTB) and of the United States of America (National Inst ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903905

9. Calculation of pulse parameters and propagation of uncertainty
Topic: Optoelectronics
Published: 3/1/2009
Authors: Paul D Hale, Chih-Ming Wang
Abstract: The fundamental starting point for the analysis of all two-state waveforms is the determination of the low- and highstate levels. This is a two-step process. First, the data are grouped into points belonging to each state, and second, the value of ea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32782

10. Calibration service for instruments that measure laser beam diameter
Series: Special Publication (NIST SP)
Report Number: 250-87
Topic: Optoelectronics
Published: 7/1/2010
Author: Shao Yang
Abstract: This document describes the calibration service for instruments that measure laser beam diameter. An overview of the measurement procedures, measurement system, and uncertainty analysis is presented. A sample measurement report is included in this do ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903067



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