NIST logo

Publications Portal

You searched on: Topic Area: Optoelectronics Sorted by: date

Displaying records 11 to 20 of 24 records.
Resort by: Date / Title


11. Optical performance monitoring of (Q)PSK data channels using artificial neural networks trained with parameters derived from delay-tap asynchronous diagrams
Topic: Optoelectronics
Published: 2/15/2011
Authors: Jeffrey A Jargon, Xiaoxia Wu, Alan Willner, Loukas Paraschis
Abstract: We demonstrate a technique of using artificial neural networks trained with parameters derived from delay-tap asynchronous diagrams for optical performance monitoring of phase shift keying (PSK) data signals. We show that asynchronous diagrams from b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906680

12. The effect of growth orientation and diameter on the elasticity of GaN Nanowires - a combined insitu TEM and atomistic modeling investigation
Topic: Optoelectronics
Published: 12/20/2010
Authors: Kristine A Bertness, Norman A Sanford, Albert Davydov
Abstract: We characterized the elastic properties of GaN nanowires grown along different crystallographic orientations. In situ transmission electron microscopy tensile tests were conducted using a MEMS-based nanoscale testing system. Complementary atomistic s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906878

13. Passive terahertz camera for standoff security screening
Topic: Optoelectronics
Published: 7/1/2010
Authors: Erich N Grossman, Charles Dietlein
Abstract: We describe the construction and performance of a passive, real-time terahertz camera based on a modular, 64-element linear array of cryogenic hotspot microbolometers. A reflective conical scanner sweeps out a 2 m ×4 m(vertical × horizontal) field of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905973

14. Dark pulse quantum dot diode laser
Topic: Optoelectronics
Published: 6/7/2010
Authors: Mingming M. Feng, Kevin Lawrence Silverman, Richard P Mirin, Steven T Cundiff
Abstract: We describe an operating regime for passively mode-locked quantum dot diode laser where the output consists of a train of dark pulses, i.e., intensity dips on a continuous background. We show that a dark pulse train is a solution to the master equati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907918

15. Waveform metrology and a quantitative study of regularized deconvolution
Topic: Optoelectronics
Published: 5/1/2010
Authors: Paul D Hale, Andrew M Dienstfrey
Abstract: We present methodology and preliminary results of a Monte-Carlo simulation to perform a quantified analysis of regularized deconvolution in the context of full waveform metrology. We analyze the behavior of different regularized inversion methods wi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904937

16. Tensile measurement of single crystal gallium nitride nanowires on MEMS test stages
Topic: Optoelectronics
Published: 4/18/2010
Authors: J. J. Brown, A. I. Baca, Kristine A Bertness, D. A. Dikin, R. S. Ruoff, Victor M. Bright
Abstract: This paper reports the first direct tensile tests on nearly defect free, n-type (Si-doped) gallium nitride single crystal nanowires. Here, for the first time, nanowires have been integrated with actuated, active microelectromechanical (MEMS) structur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902539

17. Steady-state and transient photoconductivity in c-axis GaN nanowires grown by nitrogen-plasma-assisted molecular beam epitaxy
Topic: Optoelectronics
Published: 2/12/2010
Authors: Norman A Sanford, Paul Timothy Blanchard, Kristine A Bertness, Lorelle Mansfield, John B Schlager, Aric Warner Sanders, Alexana Roshko, Beau Burton, Steven George
Abstract: Analysis of steady-state and transient photoconductivity measurements at room temperature performed on c-axis oriented GaN nanowires yielded estimates of free carrier concentration, drift, mobility, surface band bending, and surface capture coefficie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33133

18. Relative Photon-to-Carrier Efficiencies of Alternating Nanolayers of Zinc Phthalocyanine and C60 Multilayer Films Assessed by Time-Resolved Terahertz Spectroscopy
Topic: Optoelectronics
Published: 10/1/2009
Authors: Okan Esenturk, Joseph S Melinger, Paul A. Lane, Edwin J Heilweil
Abstract: Alternating multi-layer and 1:1 blended films of zinc phthalocyanine (ZnPc)and buckminsterfullerene (C60) were investigated as model active layers for solar cells by Time-Resolved Terahertz Spectroscopy (TRTS). Relative photon-to-carrier efficiencies ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902140

19. Full PMD vector measured directly from modulated data using linear optical sampling
Topic: Optoelectronics
Published: 7/15/2009
Authors: Paul A Williams, Tasshi Dennis
Abstract: We demonstrate a new technique to monitor the polarization-mode dispersion in a fiber communication channel by analyzing the modulated data at the fiber output measured with Polarization-Sensitive Linear Optical Sampling (PS-LOS).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902416

20. EEEL Technical Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7568
Topic: Optoelectronics
Published: 3/30/2009
Author: Erik M Secula
Abstract: This document describes the technical work of the Electronics and Electrical Engineering Laboratory. In this report, you will find that EEEL researchers are developing the world's most advanced sensors, providing advanced gamma ray imagers for astro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901701



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series