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Displaying records 31 to 35.
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31. SIMULATIONS OF NOISE-PARAMETER VERIFICATION USING CASCADE WITH ISOLATOR OR MISMATCHED TRANSMISSION LINE
Topic: Microwave Measurement Services
Published: 11/30/2007
Authors: James Paul Randa, Ken Wong, Roger Pollard
Abstract: Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the DUT) and then mea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32814

32. Simulations of Noise-Parameter Uncertainties
Topic: Microwave Measurement Services
Published: 6/7/2002
Author: James Paul Randa
Abstract: This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlyin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24469

33. Superconducting multiplexer filter bank for a frequency-selective power limiter
Topic: Microwave Measurement Services
Published: 12/23/2010
Authors: Eduard Rocas, Alberto Padilla, Jordi Mateu, Juan C. Collado Gomez, James C Booth, Juan M. O'Callaghan
Abstract: This work proposes a superconducting multiplexer filter bank configuration to be used as a frequency-selective power limiter. The proposed configuration limits narrowband high power signals without degrading the signal performance in the remainder fr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906233

34. Vector Corrected Noise Temperature Measurements
Topic: Microwave Measurement Services
Published: 6/7/2002
Authors: Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James Paul Randa
Abstract: A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using iso ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=954

35. Wideband measurement of extreme impedance with a multistate reflectometer
Topic: Microwave Measurement Services
Published: 12/12/2008
Authors: Arkadiusz C. Lewandowski, Denis X. LeGolvan, Ronald A Ginley, Thomas M Wallis, Atif A. Imtiaz, Pavel Kabos
Abstract: Abstract: We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900214



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