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Topic Area: Microwave Measurement Services
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Displaying records 11 to 20 of 84 records.
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11. COMPARISON OF NEAR-FIELD METHODS AT NIST K. MacReynolds, M.H. Francis and D. Tamura
Topic: Microwave Measurement Services
Published: 7/14/2010
Authors: Katherine MacReynolds, Michael H Francis, Douglas T. Tamura
Abstract: A comparison of the planar, spherical and cylindrical near-field techniques was completed at the National Institute of Standards and Technology (NIST) for a Ku-band Cassegrain reflector antenna. This paper discusses the measurement results for the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906057

12. Calibrated nanoscale dopant profiling using a scanning microwave microscope.
Topic: Microwave Measurement Services
Published: 1/3/2012
Authors: Pavel Kabos, Thomas M Wallis, H P. Hubner, I. Humer, M. Hochleitner, M. Fenner, M. Moertelmaier, C. Rankl, Atif Imtiaz, H. Tanbakuchi, P. Hinterdorfer, J. Smoliner, Joseph J Kopanski, F. Kienberger
Abstract: The scanning microwave microscope (SMM) is used for calibrated capacitance spectroscopy and spatially resolved dopant profiling measurements. It consists of an atomic force microscope (AFM) combined with a vector network analyzer operating between 1- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908761

13. Characteristic Impedance Measurement of Planar Transmission Lines
Topic: Microwave Measurement Services
Published: 8/17/2002
Authors: Uwe Arz, Dylan F Williams, Hartmut Grabinski
Abstract: In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines like CPW and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33080

14. Characteristic Impedance, Power and Causality
Topic: Microwave Measurement Services
Published: 5/1/1999
Authors: Dylan F Williams, Bradley K Alpert
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17005

15. Characteristic-Impedance Measurement Error on Lossy Substrates
Topic: Microwave Measurement Services
Published: 7/1/2001
Authors: Dylan F Williams, Uwe Arz, Hartmut Grabinski
Abstract: This paper examines error in the characteristic impedance measured by the calibration comparison method.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13906

16. Characterization of Asymmetric Coupled CMOS Line
Topic: Microwave Measurement Services
Published: 6/1/2000
Authors: Uwe Arz, Dylan F Williams, David K Walker, J. E. Rogers, M. Rudack, D. Treytner, Hartmut Grabinski
Abstract: This paper investigates the properties of asymmetric coupled lines built in a 0.25 5m CMOS technology in the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from callibrated four-port S-parameter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14312

17. Characterization of Embedded Multiconductor Transmission Lines
Topic: Microwave Measurement Services
Published: 6/1/1997
Author: Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14641

18. Characterizing Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers
Topic: Microwave Measurement Services
Published: 10/1/1999
Authors: Jeffrey A Jargon, Roger Marks, D. K. Rytting
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16672

19. Comparison of Adapter Characterization Methods
Topic: Microwave Measurement Services
Published: 12/1/1999
Authors: James Paul Randa, Wojciech Wiatr, Robert L Billinger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21880

20. Comparison of Large-Signal-Network-Analyzer Calibrations
Topic: Microwave Measurement Services
Published: 2/5/2010
Authors: Dylan F Williams, Catherine A Remley, Joe Gering, Grand Aivazian
Abstract: We develop a procedure and metrics for comparing large-signal-network-analyzer calibrations. The metrics we develop provide a bound on differences between measurements obtained from large-signal-network-analyzer calibrations, as well as more specific ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900909



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