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Displaying records 11 to 20 of 34 records.
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11. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Microwave Measurement Services
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian J Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

12. Full-Wave Analysis of Dielectric-Loaded Cylindrical Waveguides and Cavities Using a New Four-Port Ring Network
Topic: Microwave Measurement Services
Published: 8/31/2012
Authors: Felipe Penaranda-foix, Michael D. Janezic, Jose M. Catala-Civera, Antoni J. Canos-Marin
Abstract: In this paper, a full-wave method for the electromagnetic analysis of dielectric-loaded cylindrical and coaxial waveguides and cavities is developed. For this purpose, a new four-port ring network is proposed, and the mode-matching method is applied ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907688

13. Full-wave Evaluation of Carbon Nanotubes as Microwave Interconnects
Topic: Microwave Measurement Services
Published: 7/25/2010
Authors: Kichul Kim, Paul Rice, Pavel Kabos, Dejan Filipovic
Abstract: Microwave interconnect configurations composed of single wall carbon nanotubes (CNTs) are studied in this paper. Specifically, an atomic layer deposition (ALD) enabled nano-coaxial line with individual CNTs comprising the inner conductor, CNT Goubau ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905332

14. Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope
Topic: Microwave Measurement Services
Published: 7/2/2014
Authors: Atif A. Imtiaz, Thomas M Wallis, Joel C Weber, Kevin J Coakley, Matthew David Brubaker, Paul T Blanchard, Kristine A Bertness, Norman A Sanford
Abstract: We used a broadband, atomic-force-microscope-based, scanning microwave microscope (AFM-SMM) to probe the axial dependence of the depletion in a GaN nanowire (NW) p-n junction structure. The NWs were c-axis oriented and grown by molecular beam epitax ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915848

15. Microwave Radiometric Standards Development at the U.S. National Institute of Standards and Technology
Topic: Microwave Measurement Services
Published: 12/1/2011
Author: David K Walker
Abstract: NIST‰s stated mission is, ,To promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology in ways that enhance economic security and improve our quality of life.Š NIST offers an extensive range o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910146

16. Millimeter-Wave Near-Field Measurements Using Coordinated Robotics
Topic: Microwave Measurement Services
Published: 12/1/2015
Authors: Joshua A Gordon, David R Novotny, Ronald Curtis Wittmann, Michael H Francis, Miranda Leigh Butler, Jeffrey R Guerrieri
Abstract: The National Institute of Standards and Technology(NIST) recently developed a new robotic scanning system for performing near-field measurements at millimeter-wave (mm-wave)frequencies above 100 GHz, the configurable robotic millimeterwave antenna (C ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916450

17. NFRad: Review of the New NIST Noise Measurement System
Topic: Microwave Measurement Services
Published: 6/1/2000
Authors: Chriss A. Grosvenor, James Paul Randa, Robert L. Billinger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21667

18. NIST's High Frequency Metrology Program: Current Capabilities and Future Directions
Topic: Microwave Measurement Services
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current ec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907842

19. NIST's High Frequency Metrology Programs: Current Capabilities and Future Directions
Topic: Microwave Measurement Services
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: Several core areas are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameter (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic condition ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907843

20. NIST‰s High Frequency Metrology Programs: Current Capabilities and Future Directions
Topic: Microwave Measurement Services
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906809



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