NIST logo

Publications Portal

You searched on:
Topic Area: Microwave Measurement Services

Displaying records 61 to 70 of 84 records.
Resort by: Date / Title


61. The National Wireless Electronic Systems Testbed and its Initial Development
Topic: Microwave Measurement Services
Published: 2/1/1999
Author: Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8651

62. Microwave Network Analyzers - A Discussion of Verification Methods
Topic: Microwave Measurement Services
Published: 1/1/1999
Author: Ronald A Ginley
Abstract: Verification of Vector Network Analyzers (VNAs) is very important to the measurement process as well as to establish confidence in the uncertainty of the system. This paper presents a basic discussion about VNA verification including what verificati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19265

63. The National Wireless Electronic Systems Testbed and its Initial Development
Topic: Microwave Measurement Services
Published: 12/1/1998
Author: Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21656

64. National Institute of Standards and Technology Programs in Electrical Measurements for Electronic Interconnections
Topic: Microwave Measurement Services
Published: 10/1/1998
Authors: Donald C. DeGroot, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7607

65. On-Wafer Millimeter-Wave Characterization
Topic: Microwave Measurement Services
Published: 10/1/1998
Author: Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25257

66. International Comparison of Noise-Temperature Measurements at 2, 4, and 12 GHz
Topic: Microwave Measurement Services
Published: 7/1/1998
Authors: James Paul Randa, J. Achkar, F. I Buchholz, T. Colard, D. Schubert, M. Sinclair, Joseph Paul Rice, G. Silvia Williams
Abstract: We report results of a recent international comparison of thermal noise-power measurements, performed under the auspices of CIPM/CCE. The noise temperatures of two solid-state sources with GPC-7 connectors were measured at 2, 4, and 12 GHz. All res ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24272

67. Accuracy of Lumped-Element Calibrations for Four-Sampler Vector Network Analyzers
Topic: Microwave Measurement Services
Published: 6/1/1998
Authors: Roger Marks, Jeffrey A Jargon, D. K. Rytting
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20227

68. Accurate Characteristic Impedance Measurement on Silicon
Topic: Microwave Measurement Services
Published: 6/1/1998
Authors: Dylan F Williams, Uwe Arz, Hartmut Grabinski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10077

69. Lumped-Element Impedance Standards
Topic: Microwave Measurement Services
Published: 6/1/1998
Authors: Dylan F Williams, David K Walker
Abstract: We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard's impedance depends not only on the standard itself, but also on probe placement, probe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21060

70. Metal-Insulator-Semiconductor Transmission Line Model
Topic: Microwave Measurement Services
Published: 6/1/1998
Author: Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18999



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series