Publications Portal

You searched on:
Topic Area: Microwave Measurement Services

Displaying records 41 to 50 of 83 records.
Resort by: Date / Title

41. Characterization of Asymmetric Coupled CMOS Line
Topic: Microwave Measurement Services
Published: 6/1/2000
Authors: Uwe Arz, Dylan F Williams, David K Walker, J. E. Rogers, M. Rudack, D. Treytner, Hartmut Grabinski
Abstract: This paper investigates the properties of asymmetric coupled lines built in a 0.25 5m CMOS technology in the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from callibrated four-port S-parameter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14312

42. Estimating the Magnitude and Phase Response of a 50 GHz Sampling Oscilloscope Using the Nose-to-Nose Method
Topic: Microwave Measurement Services
Published: 6/1/2000
Authors: Paul D Hale, Tracy S. Clement, Kevin J Coakley, Chih-Ming Wang, Donald C. DeGroot, A. P. Verdoni
Abstract: We describe estimation of the magnitude and phase response of a sampling oscilloscope over 50 Ghz bandwidth using the nose-to-nose method. The measurements are corrected for the non-ideal properties of the oscilloscope and calibration apparatus, inc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27262

43. NFRad: Review of the New NIST Noise Measurement System
Topic: Microwave Measurement Services
Published: 6/1/2000
Authors: Chriss A. Grosvenor, James Paul Randa, Robert L Billinger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21667

44. NIST 0.05-50 GHz Direct Comparison Power Calibration System
Topic: Microwave Measurement Services
Published: 5/1/2000
Author: John R. Juroshek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10485

45. Noise-Source Stability Measurements
Topic: Microwave Measurement Services
Published: 5/1/2000
Authors: James Paul Randa, L. A. Terrell, Lawrence P. Dunleavy
Abstract: We report results of stability tests on several noise sources for selected frequencies between 12 and 26.5 GHz. Measurements covered intervals of about 1 week and about 1 year or more. Drifts in noise temperature were typically less than the uncert ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22465

46. Design and Testing of NFRad - A New Noise Measurement System
Series: Technical Note (NIST TN)
Report Number: 1518
Topic: Microwave Measurement Services
Published: 3/1/2000
Authors: Chriss A. Grosvenor, James Paul Randa, Robert L Billinger
Abstract: The NIST Noise project has constructed and tested a new, automated, coaxial (GPC-7) radiometer for the measurement of noise sources in the 8-12 GHz frequency band. It is an isolated, total-power radiometer that relies on lookup tables for relevant re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6264

47. Switched-Coupler Measurements for High Power FR Calibrations
Topic: Microwave Measurement Services
Published: 3/1/2000
Author: J. W. Allen
Abstract: Calibration of RF power sensors at levels greater than 10 mW and uncertainties on the order of 2 % need not require complex calorimetric methods. Using a series of cascaded directional couplers makes it possible to compare a high-power RF sensor agai ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10864

48. Comparison of Adapter Characterization Methods
Topic: Microwave Measurement Services
Published: 12/1/1999
Authors: James Paul Randa, Wojciech Wiatr, Robert L Billinger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21880

49. Influence of the Substrate Resistivity on the Broadband Characteristics of Silicon Transmission Lines
Topic: Microwave Measurement Services
Published: 12/1/1999
Authors: Uwe Arz, Hartmut Grabinski, Dylan F Williams
Abstract: This work investigates the broadband propagation characteristics of transmission lines fabricated on silcon substrates of different conductivities.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24545

50. Sources of Error in Coplanar Waveguide TRL Calibrations
Topic: Microwave Measurement Services
Published: 12/1/1999
Authors: Raian K. Kaiser, Dylan F Williams
Abstract: This paper explores the impact of five sources of systematic error on coplanar waveguide thru-reflect-line calibrations.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2573