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Topic Area: Microwave Measurement Services

Displaying records 31 to 40 of 88 records.
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31. Developing Frequency-Domain Models for Nonlinear Circuits Based on Large-Signal Measurements
Topic: Microwave Measurement Services
Published: 8/17/2002
Authors: Jeffrey A Jargon, Kuldip Gupta, Dominique Schreurs, Donald C. DeGroot
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30828

32. Simulations of Noise-Parameter Uncertainties
Topic: Microwave Measurement Services
Published: 6/7/2002
Author: James Paul Randa
Abstract: This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlyin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24469

33. Vector Corrected Noise Temperature Measurements
Topic: Microwave Measurement Services
Published: 6/7/2002
Authors: Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James Paul Randa
Abstract: A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using iso ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=954

34. Repeat Measurements and Metrics for Nonlinear Model Development
Topic: Microwave Measurement Services
Published: 6/6/2002
Authors: Catherine A Remley, Jeffrey A Jargon, Dominique Schreurs, Donald C. DeGroot, Kuldip Gupta
Abstract: We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30001

35. The 30/60 MHz Tuned Radiometer - The NIST System for Noise Temperature Measurements
Series: Technical Note (NIST TN)
Report Number: 1525
Topic: Microwave Measurement Services
Published: 5/1/2002
Authors: Chriss A. Grosvenor, Robert L Billinger
Abstract: The NIST Noise Project has completed reconstruction of their 30/60 MHz tuned, coaxial (Type N) radiometer system. This system is used at low frequencies where isolators are impractical to incorporate. Without isolators, the ambient and cryogenic stan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14689

36. Wideband Frequency-Domain Characterization of High-Impedance Probes
Topic: Microwave Measurement Services
Published: 11/30/2001
Authors: Uwe Arz, Howard C. Reader, Pavel Kabos, Dylan F Williams
Abstract: In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6221

37. Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines
Topic: Microwave Measurement Services
Published: 10/1/2001
Authors: Uwe Arz, Dylan F Williams, Hartmut Grabinski
Abstract: We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7589

38. Artificial Neural Network Modeling for Improved On-Wafer Line-Reflect-Match Calibrations
Topic: Microwave Measurement Services
Published: 9/1/2001
Authors: Jeffrey A Jargon, Kuldip Gupta
Abstract: We model a load using an artificial neural network (ANN) to improve an on-wafer line-reflect-match (LRM) calibration of a vector network analyzer. The ANN is trained with measurement data obtained from a thru-reflect-line (TRL) calibration. The acc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16549

39. Characteristic-Impedance Measurement Error on Lossy Substrates
Topic: Microwave Measurement Services
Published: 7/1/2001
Authors: Dylan F Williams, Uwe Arz, Hartmut Grabinski
Abstract: This paper examines error in the characteristic impedance measured by the calibration comparison method.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13906

40. Measurement Comparison of a Low-Intermodulation Termination for the U.S. Wireless Industry
Series: Technical Note (NIST TN)
Report Number: 1521
Topic: Microwave Measurement Services
Published: 7/1/2001
Author: Jeffrey A Jargon
Abstract: After the recent, successful completion of a passive intermodulation measurement comparison for nonlinear two-port devices, the National Institute of Standards and Technology was requested to perform a second comparison for a one-port termination. W ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7229



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