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Topic Area: Microwave Measurement Services

Displaying records 21 to 30 of 88 records.
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21. NIST Microwave Scattering Parameter and Power Measurement Services
Topic: Microwave Measurement Services
Published: 9/30/2007
Author: Ronald A Ginley
Abstract: This paper describes the microwave scattering parameter (s-parameter) and power measurement services available at NIST. This includes what is measured in each of the services, the techniques used for both calibration of the systems and subsequent mea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32810

22. Microwave-Mixer Measurement with a Sampling Oscilloscope
Topic: Microwave Measurement Services
Published: 3/1/2006
Authors: Dylan F Williams, Hassen Khenissi, Fabien Ndagijimana, Catherine A Remley, Joel Dunsmore, Paul D Hale, Jack Wang, Tracy S. Clement
Abstract: We describe a straightforward method of separately characterizing up-conversion and down-conversion in microwave mixers with a sampling oscilloscope. The method mismatch-corrects the results, determines both magnitude and phase, and uses a novel time ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31966

23. Temperature Control of Microfluidic Systems by Microwave Heating
Topic: Microwave Measurement Services
Published: 5/5/2005
Authors: Siddarth Sundaresan, Brian J. Polk, Darwin R Reyes-Hernandez, M Rao, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906336

24. Radiometer Measurements of a Near-Ambient, Variable-Temperature Noise Standard
Topic: Microwave Measurement Services
Published: 6/7/2004
Authors: George Free, James Paul Randa, Robert L Billinger
Abstract: A near-ambient, variable-temperature noise standard whose physical temperature can be accurately measured was constructed and then measured with the NIST total-power radiometer to test the accuracy of radiometer measurements in the temperature range ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31593

25. Expanding Definitions of Gain by Taking Harmonic Content into Account
Topic: Microwave Measurement Services
Published: 9/1/2003
Authors: Jeffrey A Jargon, Kuldip Gupta, Alessandro Cidronali, Donald C. DeGroot
Abstract: We expand the definitions of power gain, transducer gain, and available gain by taking harmonic content into account. Furthermore, we show that under special conditions, these expanded definitions of gain can be expressed in terms of nonlinear large- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30921

26. StatistiCAL Vector-Network-Analyzer Calibration Software
Topic: Microwave Measurement Services
Published: 6/1/2003
Authors: Dylan F Williams, Jack Wang, Uwe Arz
Abstract: StatistiCAL is a new freeware package for calibrating vector network analyzers (VNAs) developed at the National Institute of Standards and Technology (NIST).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31335

27. VNA Calibration Software Manual
Topic: Microwave Measurement Services
Published: 6/1/2003
Authors: Dylan F Williams, Jack Wang, Uwe Arz
Abstract: This software algorithm combines a decade of experience in applying orthogonal distance regression and other iterative techniques to solving vector-network-analyzer (VNA) calibrations. The new software features a robust algorithm capable of finding s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31315

28. Multiline TRL Revealed
Topic: Microwave Measurement Services
Published: 12/5/2002
Authors: Donald C. DeGroot, Jeffrey A Jargon, Roger Marks
Abstract: We reveal the techniques behind a successful implementation of the Multiline TRL calibration for vector network analyzers (VNAs). For the first time, this paper describes the inner workings of NIST's Multical software, an evolved, automated implement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30862

29. Applications of Calibration Comparison in On-wafer Measurement
Topic: Microwave Measurement Services
Published: 8/17/2002
Authors: Uwe Arz, Dylan F Williams
Abstract: In this paper we discuss several applications of calibration comparison in on-wafer measurement. This technique can be understood as an abstraction of the well-known two-tier deembedding scheme used in test-fixture characterization. The applications ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33081

30. Characteristic Impedance Measurement of Planar Transmission Lines
Topic: Microwave Measurement Services
Published: 8/17/2002
Authors: Uwe Arz, Dylan F Williams, Hartmut Grabinski
Abstract: In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines like CPW and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33080



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