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You searched on: Topic Area: Microwave Measurement Services

Displaying records 21 to 30 of 34 records.
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21. Comparison of Microwave Black-Body Target Radiometric Measurements
Topic: Microwave Measurement Services
Published: 7/30/2010
Authors: David K Walker, Dazhen Gu, Katherine MacReynolds, Randy Direen, James Paul Randa, Amanda Cox, Derek Anderson Houtz, Robert L. Billinger
Abstract: Accurate characterization of the brightness temperature (T_B) of black-body targets used for calibrating microwave remote-sensing radiometers includes many inputs: antenna pattern and loss, target temperature, target emissivity, mechanical alignment, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906078

22. REFLECTIVITY STUDIES OF PASSIVE MICROWAVE CALIBRATION TARGETS AND ABSORPTIVE MATERIALS
Topic: Microwave Measurement Services
Published: 7/30/2010
Authors: Dazhen Gu, Amanda Cox, Derek Anderson Houtz, David K Walker, James Paul Randa, Robert L. Billinger
Abstract: We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at varia ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906017

23. Full-wave Evaluation of Carbon Nanotubes as Microwave Interconnects
Topic: Microwave Measurement Services
Published: 7/25/2010
Authors: Kichul Kim, Paul Rice, Pavel Kabos, Dejan Filipovic
Abstract: Microwave interconnect configurations composed of single wall carbon nanotubes (CNTs) are studied in this paper. Specifically, an atomic layer deposition (ALD) enabled nano-coaxial line with individual CNTs comprising the inner conductor, CNT Goubau ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905332

24. Near-Field Antenna as a Scanning Microwave Probe for Characterization of Materials and Devices
Topic: Microwave Measurement Services
Published: 4/12/2010
Authors: Atif A. Imtiaz, Thomas M Wallis, SangHyun (Sang-Hyun) Lim, Jonathan Chisum, Zoya Popovic, Pavel Kabos
Abstract: The Scanning Microwave Probe (SMP) is emerging as an important broadband metrology tool for characterizing the materials and devices in the micron and sub-micron length scales in the frequency range of 10 MHz to 110 GHz. In this document we establis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905030

25. Wideband measurement of extreme impedance with a multistate reflectometer
Topic: Microwave Measurement Services
Published: 12/12/2008
Authors: Arkadiusz C. Lewandowski, Denis X. LeGolvan, Ronald A Ginley, Thomas M Wallis, Atif A. Imtiaz, Pavel Kabos
Abstract: Abstract: We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900214

26. Recommended Terminology For Microwave Radiometry
Series: Technical Note (NIST TN)
Topic: Microwave Measurement Services
Published: 8/1/2008
Authors: James Paul Randa, Janne Lahtinen, Adriano Camps, A. Gasiewski, Martti Hallikainen, David Leine V, Manuel Martin-Neira, Jeff Piepmeier, Philip Rosenkranz, Christopher Ruf, James Shiue, Niels Skou
Abstract: We present recommended definitions for common terms in microwave remote-sensing radiometry. Terms are grouped into three chapters: General Terminology, Real-Aperture Radiometers, and Polarimetric Radiometry. AN alphabetical index lists the terms t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33079

27. SIMULATIONS OF NOISE-PARAMETER VERIFICATION USING CASCADE WITH ISOLATOR OR MISMATCHED TRANSMISSION LINE
Topic: Microwave Measurement Services
Published: 11/30/2007
Authors: James Paul Randa, Ken Wong, Roger Pollard
Abstract: Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the DUT) and then mea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32814

28. Radiometer Measurements of a Near-Ambient, Variable-Temperature Noise Standard
Topic: Microwave Measurement Services
Published: 6/7/2004
Authors: George Free, James Paul Randa, Robert L. Billinger
Abstract: A near-ambient, variable-temperature noise standard whose physical temperature can be accurately measured was constructed and then measured with the NIST total-power radiometer to test the accuracy of radiometer measurements in the temperature range ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31593

29. Simulations of Noise-Parameter Uncertainties
Topic: Microwave Measurement Services
Published: 6/7/2002
Author: James Paul Randa
Abstract: This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlyin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24469

30. Vector Corrected Noise Temperature Measurements
Topic: Microwave Measurement Services
Published: 6/7/2002
Authors: Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James Paul Randa
Abstract: A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using iso ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=954



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