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21. Checks of Amplifier Noise-Parameter Measurements
Topic: Microelectronics
Published: 6/11/2004
Authors: James Paul Randa, David K Walker
Abstract: We propose two verification methods for measurements of noise parameters of amplifiers, particularly low-noise amplifiers (LNAs). One method is a direct measurement of the parameter Trev, the noise temperature from the amplifier input, and the compar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31669

22. Noise Characterization of Multiport Amplifiers
Topic: Microelectronics
Published: 10/1/2001
Author: James Paul Randa
Abstract: I address the issue of the definition and measurement of noise figure and parameters to characterize multiport devices, particularly differential amplifiers. A parameterization in terms of the noise matrix appears to be the most practical. the noise ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5219

23. On-Wafer Measurements of Noise Temperature
Topic: Microelectronics
Published: 12/1/1999
Authors: James Paul Randa, Robert L Billinger, Joseph Paul Rice
Abstract: The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on wafer. This report summarizes the theoretical formulation and describes the design, methods, and results ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27649

24. Characterization and Applications of On-Wafer Diode Noise Sources
Topic: Microelectronics
Published: 12/1/1998
Authors: Lawrence P. Dunleavy, James Paul Randa, David K Walker, Robert L Billinger, Joseph Paul Rice
Abstract: A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5598

25. Characterization of On-Wafer Diode Noise Sources
Topic: Microelectronics
Published: 6/1/1998
Authors: James Paul Randa, David K Walker, Lawrence P. Dunleavy, Robert L Billinger, Joseph Paul Rice
Abstract: A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27897

26. Noise Temperature Measurements on Wafer
Series: Technical Note (NIST TN)
Report Number: 1390
Topic: Microelectronics
Published: 3/1/1997
Author: James Paul Randa
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11089

27. The Art in Science of microTAS (Editorial)
Topic: Microelectronics
Published: 3/12/0013
Author: Michael Gaitan
Abstract: The discovery of a natural phenomenon unveils a curtain of ignorance from what has always existed. However, the creation of art requires the use of materials and knowledge combined with artistic inspiration to create a work of aesthetic appeal. By ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913450