NIST logo

Publications Portal

You searched on: Topic Area: Electromagnetics Sorted by: title

Displaying records 81 to 90.
Resort by: Date / Title

81. The Reverberation Chamber's Unstirred Field: A Validation of the Image Theory Interpretation
Topic: Electromagnetics
Published: 8/15/2011
Authors: Ryan J. Pirkl, John M Ladbury, Catherine A Remley
Abstract: Synthetic aperture measurements of a reverberation chamber's unstirred wireless channel are used to compare the observed power, time-of-arrival, and angle-of-arrival of unstirred multipath components to that predicted by ray/image theory for a re ...

82. Traceability for Millimeter and Submillimeter-Wave Power Measurements
Topic: Electromagnetics
Published: 5/21/2014
Author: Ronald A Ginley
Abstract: The need for traceable power measurements above 110 GHz is well established for use in communications, spectral line investigation, molecular particle signature identification, material property characterization and others. There have been increment ...

83. Transport in Electromagnetic Metrology Based on Nonequilibrium Statistical Mechanics
Topic: Electromagnetics
Published: 11/3/2009
Authors: James R. Baker-Jarvis, Jack T Surek
Abstract: Current research is probing transport on ever smaller scales. Modeling of the electromagnetic interaction with nanoparticles or small collections of dipoles and its associated the energy transport and nonequilibrium characteristics requires a deta ...

84. Two modes behavior of vortex oscillations in spin-transfer nanocontacts subject to in-plane magnetic fields
Topic: Electromagnetics
Published: 6/25/2010
Authors: Michaela Kuepferling, Claudio Serpico, Matthew R Pufall, William H Rippard, Thomas M Wallis, Atif A. Imtiaz, Pavel Kabos
Abstract: The field dependence of vortex oscillations in a spin-transfer metallic nanocontact, subject to in-plane, spatially uniform, external fields, is studied by measuring the power spectral density of the voltage across the device. The measured spectra ...

85. Uncertainties in NIST Noise-Temperature Measurements
Series: Technical Note (NIST TN)
Report Number: 1502
Topic: Electromagnetics
Published: 3/1/1998
Author: James Paul Randa
Abstract: Uncertainty analyses are presented for NIST measurements of noise temperature. All systems currently used in NIST calibrations of thermal-noise sources are treated. These include tuned systems for 30 and 60 MHz, coaxial total-power radiometers for 1 ...

86. Uncertainty Analysis for Noise-Parameter Measurements
Topic: Electromagnetics
Published: 6/8/2008
Author: James Paul Randa
Abstract: A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave repre ...

87. Uncertainty Analysis for Noise-Parameter Measurements at NIST
Topic: Electromagnetics
Published: 4/9/2009
Author: James Paul Randa
Abstract: The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of t ...

88. Unified Model for Bulk Acoustic Wave Resonators‰ Nonlinear Effects
Topic: Electromagnetics
Published: 9/20/2009
Authors: Eduard Rocas, Juan C. Collado Gomez, James C Booth, Enrique Iborra, Robert Aigner
Abstract: We present a nonlinear model for Bulk Acoustic Wave resonators that combines different sources of nonlinearity, using device-independent material specific parameters, to predict the intermodulation and harmonics generation. The actual model accounts ...

89. Using the Amplitude Variation of a Reverberation Chamber Channel to Predict the Synchronization of a Wireless Digital Communication Test System
Topic: Electromagnetics
Published: 8/16/2015
Authors: Ray R Tanuhardja, Luis Alberto Gonzalez, Chih-Ming Wang, William F Young, Catherine A Remley
Abstract: This contribution discusses the use of a metric based on the amplitude variation of a channel in the signal bandwidth to predict whether or not a digital wireless communication test system receiver will be able to demodulate a test signal. This metri ...

90. Verification of Noise-Parameter Measurements and Uncertainties
Topic: Electromagnetics
Published: 11/1/2011
Authors: James Paul Randa, Dazhen Gu, David K Walker
Abstract: We propose and implement verification methods for measurements of noise parameters of amplifiers and transistors. Because the verification rests on the comparison of different measurement results, it also serves as a test of the uncertainties. The ve ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series