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Displaying records 961 to 970 of 1000 records.
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961. RangeCAD and the NIST RCS Uncertainty Analysis
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5022
Topic: Electromagnetics
Published: 12/1/1994
Authors: L. Lewis, Lorant A. Muth, Ronald Curtis Wittmann

962. Rapid Evaluation of Mode-Stirred Chambers Using Impulsive UWBs
Series: Technical Note (NIST TN)
Report Number: 1381
Topic: Electromagnetics
Published: 6/1/1996
Authors: John M Ladbury, Robert T. Johnk, Arthur Ondrejka

963. Reactive epitaxy of beryllium on Si(1 1 1)-(7 x 7)
Topic: Electromagnetics
Published: 1/1/2003
Authors: Dustin Alexander Hite, Shu-Jung Tang, Phillip T Sprunger
Abstract: Scanning tunneling microscopy (STM) and photoelectron spectroscopy (PES) have been used to investigate the nucleation, growth, and structure of beryllium on Si(1 1 1)-(7 x 7). STM indicates that a chemical reaction occurs at temperatures as low as 12 ...

964. Realistic Sampling-Circuit Model for Nose-to-Nose Simulation
Topic: Electromagnetics
Published: 6/1/2000
Authors: Catherine A Remley, Dylan F Williams, Donald C. DeGroot
Abstract: We extend previously developed oscilloscope sampler models to include realistic circuit characteristics and use these models to investigate the nose-to-nose calibration technique.

965. Realization of a Controllable Metafilm (``Smart Surface'') Composed of Resonant Magnetodielectric Particles: Measurements and Theory
Topic: Electromagnetics
Published: 11/1/2005
Authors: Christopher L Holloway, Pavel Kabos, Mohamed Mohamed, Edward Kuester, Michael D Janezic, James R. Baker-Jarvis
Abstract: In previous work, we derived generalized sheet-transition conditions (GSTCs) for the average electromagnetic fields across a metafilm, which, when properly designed, can have certain desired reflection and transmission properties. A metafilm is the t ...

966. Recent Advances in Metrology for the Electromagnetic Characterization of Bulk Materials at Microwave Frequencies
Topic: Electromagnetics
Published: 5/1/1998
Authors: Jerzy Krupka, Claude Weil

967. Recent Improvements in Time-Domain EMC Measurement System
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 89-3927
Topic: Electromagnetics
Published: 11/1/1989
Authors: J W Adams, Arthur Ondrejka, Kenneth H. Cavcey, J. E. Cruz, H. W. Medley, John H. Grosvenor Jr

968. Reciprocity Relations for On-Wafer Power Measurements
Topic: Electromagnetics
Published: 12/1/1991
Authors: Roger Marks, Dylan F Williams

969. Reciprocity Relations in Waveguide Junctions
Topic: Electromagnetics
Published: 7/1/1993
Authors: Dylan F Williams, Roger Marks

970. Reference Flat Pulse Generator
Series: Technical Note (NIST TN)
Report Number: 1067
Topic: Electromagnetics
Published: 10/1/1983
Authors: J R Andrews, Barry A. Bell, E E Baldwin

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