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Displaying records 31 to 40 of 53 records.
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31. NIST's High Frequency Metrology Program: Current Capabilities and Future Directions
Topic: Electromagnetics
Published: 3/31/2011
Author: Ronald A Ginley
Abstract: There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current ec ...

32. Noise Characterization of Multiport Amplifiers
Topic: Electromagnetics
Published: 10/1/2001
Author: James Paul Randa
Abstract: I address the issue of the definition and measurement of noise figure and parameters to characterize multiport devices, particularly differential amplifiers. A parameterization in terms of the noise matrix appears to be the most practical. the noise ...

33. Noise Parameter Uncertainties from Monte Carlo Simulations
Topic: Electromagnetics
Published: 11/8/2001
Authors: James Paul Randa, Wojciech Wiatr
Abstract: We present results for uncertainties in noise-parameter measurements, obtained using a Monte Carlo simulation of the measurements. Sets of data were generated to simulate measurements on a low-noise amplifier, with given uncertainties in the underlyi ...

34. Noise Temperature Measurements on Wafer
Series: Technical Note (NIST TN)
Report Number: 1390
Topic: Electromagnetics
Published: 3/1/1997
Author: James Paul Randa

35. Noise-Parameter Uncertainties: A Monte Carlo Simulation
Series: Journal of Research (NIST JRES)
Topic: Electromagnetics
Published: 10/1/2002
Author: James Paul Randa
Abstract: This paper reports the formulation and results of a Monte Carlo study of uncertainties in noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underly ...

36. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Electromagnetics
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...

37. On-Wafer Measurement of Transistor Noise Parameters at NIST
Topic: Electromagnetics
Published: 4/1/2007
Authors: James Paul Randa, David K Walker
Abstract: NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.

38. On-Wafer Measurements of Noise Temperature
Topic: Electromagnetics
Published: 12/1/1999
Authors: James Paul Randa, Robert L. Billinger
Abstract: The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on wafer. This report summarizes the theoretical formulation and describes the design, methods, and results ...

39. On-Wafer Noise-Parameter Measurements at NIST
Topic: Electromagnetics
Published: 7/14/2006
Authors: James Paul Randa, David K Walker
Abstract: NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched tran ...

40. Parameter Estimation and Uncertainty Evaluation in a Low Rician K-Factor Reverberation-Chamber Environment
Topic: Electromagnetics
Published: 10/15/2014
Authors: Chih-Ming Wang, Catherine A Remley, Ansgar T. Kirk, Ryan J. Pirkl, Christopher L Holloway, Dylan F Williams, Paul D Hale
Abstract: In this paper we study statistical methods for estimating the Rician K-factor when this parameter is small. A fiducial approach for making statistical inference on the K-factor is discussed. The approach requires a Monte Carlo method to compute the u ...

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