Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Electromagnetics Sorted by: title

Displaying records 31 to 40 of 91 records.
Resort by: Date / Title


31. Experimental Bounds on Classical Random Field Theories
Topic: Electromagnetics
Published: 12/10/2014
Authors: Joffrey Kent Peters, Sergey V Polyakov, Jingyun Fan, Alan L Migdall
Abstract: Alternative theories to quantum mechanics motivate important fundamental tests of our understanding and description of the smallest physical systems. Here we place experimental limits on those classical field theories which result in power-depend ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917261

32. Experimental Evaluation of the Statistical Isotropy of a Reverberation Chamber‰s Plane-Wave Spectrum
Topic: Electromagnetics
Published: 11/27/2013
Authors: Ryan J. Pirkl, Catherine A Remley
Abstract: Synthetic aperture measurements in a loaded reverberation chamber are used to calculate power-angle profiles describing the instantaneous distribution of received power versus azimuth angle-of-arrival. Averaging multiple power-angle profiles leads to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912807

33. Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope
Topic: Electromagnetics
Published: 5/14/2012
Authors: Atif A. Imtiaz, Thomas M Wallis, SangHyun S. Lim, H. Tanbakuchi, H-P Huber, A. Hornung, P. Hinterdorfer, J. Smoliner, F. Kienberger, Pavel Kabos
Abstract: We report frequency dependent contrast in d(S11)/dV measurements of a variably doped p-type silicon sample in the frequency range from 2GHz to 18GHz. The measurements were conducted bys use of a scanning microwave microscope. The measurements were ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909532

34. Full-Wave Analysis of Dielectric-Loaded Cylindrical Waveguides and Cavities Using a New Four-Port Ring Network
Topic: Electromagnetics
Published: 8/31/2012
Authors: Felipe Penaranda-foix, Michael D. Janezic, Jose M. Catala-Civera, Antoni J. Canos-Marin
Abstract: In this paper, a full-wave method for the electromagnetic analysis of dielectric-loaded cylindrical and coaxial waveguides and cavities is developed. For this purpose, a new four-port ring network is proposed, and the mode-matching method is applied ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907688

35. HIGH-Q ON-CHIP MICROWAVE RESONATOR FOR SENSITIVE PERMITTIVITY DETECTION IN NANOLITER VOLUMES
Topic: Electromagnetics
Published: 6/21/2015
Authors: A Padilla, Alex Watson, Christopher L Holloway, James C Booth
Abstract: This work presents the design, fabrication and characterization results for a thick film (6µm Cu), coplanar waveguide (CPW) resonator operating at 2.2GHz with a high Q (~177), integrated with a microfluidic channel. We demonstrate detection of change ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918320

36. Handheld Firefighter Radio Testing
Topic: Electromagnetics
Published: 6/11/2013
Authors: Catherine A Remley, William F Young, Anthony D Putorti Jr., Michelle K Donnelly
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914055

37. High-Frequency Dielectric Measurements: A Tutorial
Topic: Electromagnetics
Published: 4/1/2010
Authors: James R. Baker-Jarvis, Michael D Janezic, Donald C. DeGroot
Abstract: KNOWLEDGE of the response of materials to electromagnetic (EM) fields in the frequency range of radio frequency (RF) through terahertz (THz) is critical to numerous research projects and electronic product development activities. Electromagnetic wave ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904207

38. INTER-LABORATORY COMPARISON OF NOISE-PARAMETER MEASUREMENTS ON CMOS DEVICES WITH 0.12 um GATE LENGTH
Topic: Electromagnetics
Published: 12/1/2005
Authors: James Paul Randa, Susan L. Sweeney, Tom McKay, David K Walker, David R. Greenberg, Jon Tao, Judah Mendez, G. Ali Rezvani, John J. Pekarik
Abstract: We present results of an interlaboratory comparison of S-parameter and noise-parameter measurements performed on 0.12 {mu}m gate-length CMOS transistors. Copies of the same device were measured at three different laboratories (IBM, NIST, RFMD), and t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32120

39. Impact of RF Interference between a Passive RFID System and a Frequency Hopping Communications System in the 900 MHz ISM Band
Topic: Electromagnetics
Published: 7/25/2010
Author: Michael R Souryal
Abstract: We present experimental measurements and analysis of RF interference between a passive RFID system and a generic frequency hopping communications system in the 902 928 MHz ISM radio band. Interference in both directions is considered, RFID to communi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904764

40. Improvement in the Evaluation of a Rectangular Waveguide Microcalorimeter Correction Factor
Topic: Electromagnetics
Published: 8/29/2014
Authors: Thomas P. Crowley, Weihai Fang
Abstract: The correction factor of the National Institute of Standards and Technology‰s WR-15 (50 to 75 GHz) microcalorimeters has been re-evaluated. Use of modeled values for the reflection coefficient of a flat short and offset short instead of measured valu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915326



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series