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Displaying records 31 to 40 of 51 records.
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31. Noise Parameter Uncertainties from Monte Carlo Simulations
Topic: Electromagnetics
Published: 11/8/2001
Authors: James Paul Randa, Wojciech Wiatr
Abstract: We present results for uncertainties in noise-parameter measurements, obtained using a Monte Carlo simulation of the measurements. Sets of data were generated to simulate measurements on a low-noise amplifier, with given uncertainties in the underlyi ...

32. Noise Temperature Measurements on Wafer
Series: Technical Note (NIST TN)
Report Number: 1390
Topic: Electromagnetics
Published: 3/1/1997
Author: James Paul Randa

33. Noise-Parameter Uncertainties: A Monte Carlo Simulation
Series: Journal of Research (NIST JRES)
Topic: Electromagnetics
Published: 10/1/2002
Author: James Paul Randa
Abstract: This paper reports the formulation and results of a Monte Carlo study of uncertainties in noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underly ...

34. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Electromagnetics
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...

35. On-Wafer Measurement of Transistor Noise Parameters at NIST
Topic: Electromagnetics
Published: 4/1/2007
Authors: James Paul Randa, David K Walker
Abstract: NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.

36. On-Wafer Measurements of Noise Temperature
Topic: Electromagnetics
Published: 12/1/1999
Authors: James Paul Randa, Robert L. Billinger
Abstract: The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on wafer. This report summarizes the theoretical formulation and describes the design, methods, and results ...

37. On-Wafer Noise-Parameter Measurements at NIST
Topic: Electromagnetics
Published: 7/14/2006
Authors: James Paul Randa, David K Walker
Abstract: NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched tran ...

38. Parameter Estimation and Uncertainty Evaluation in a Low Rician K-Factor Reverberation-Chamber Environment
Topic: Electromagnetics
Published: 10/15/2014
Authors: Chih-Ming Wang, Catherine A Remley, Ansgar T. Kirk, Ryan J. Pirkl, Christopher L Holloway, Dylan F Williams, Paul D Hale
Abstract: In this paper we study statistical methods for estimating the Rician K-factor when this parameter is small. A fiducial approach for making statistical inference on the K-factor is discussed. The approach requires a Monte Carlo method to compute the u ...

39. Potential Interference Issues between FCC Part 15 Compliant UHF ISM Emitters and Equipment Passing Standard Immunity Testing Requirements
Topic: Electromagnetics
Published: Date unknown
Authors: David R Novotny, Jeffrey R Guerrieri, Daniel G. Kuester
Abstract: The potential of electromagnetic (EM) interference between multi-channel, FCC Part 15 UHF (902-928 MHz) ISM [1] emitters and devices that have passed immunity requirements under international standards [2] is examined. At close ranges, the fields fr ...

40. Precision Measurement Method for Cryogenic Amplifier Noise Temperatures Below 5 K
Topic: Electromagnetics
Published: 3/1/2006
Authors: James Paul Randa, Eyal Gerecht, Dazhen Gu, Robert L. Billinger
Abstract: We report precision measurements of the effective input noise temperature of a cryogenic (liquid helium temperature) MMIC amplifier at the amplifier reference planes within the cryostat. A method is given for characterizing and removing the effect of ...

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