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991. Reverse Noise Measurement and Use in Device Characterization
Topic: Electromagnetics
Published: 6/10/2006
Authors: James Paul Randa, Tom McKay, Susan L. Sweeney, David K Walker, Lawrence Wagner, David R. Greenberg, Jon Tao, G. Ali Rezvani
Abstract: We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check m ...

992. Reversible axial-strain effect and extended strain limits in Y-Ba-Cu-O coatings on deformation-textured substrates
Topic: Electromagnetics
Published: 11/17/2003
Authors: Najib Cheggour, John (Jack) Ekin, Cameron C. Clickner, D. T. Verebelyi, C. L. H. Thieme, Ron Feenstra, P Goyal
Abstract: The dependence of transport critical-current density (J^dc^) on axial tensile strain ({epsilon}) was measured at 76 K and self-magnetic field for YBa^d2^Cu^d3^O^d7-{delta}^ (YBCO) coatings on buffered, deformation-textured substrates of pure Ni, Ni-5 ...

993. Reversible axial-strain effect in Y-Ba-Cu-O coated conductors
Topic: Electromagnetics
Published: 11/7/2005
Authors: Najib Cheggour, John (Jack) Ekin, C. L. H. Thieme, Y Y Xie, V Selvamanickam, Ron Feenstra
Abstract: The recently discovered reversible strain effect in Y-Ba-Cu-O (YBCO) coated conductors contrasts with the general understanding that the effect of strain on critical-current density {I}J^dc^{/I} in practical high-temperature superconductors is determ ...

994. Ripening during magnetite nanoparticle synthesis: Resulting interfacial defects and magnetic properties
Topic: Electromagnetics
Published: 10/3/2005
Authors: Alexander J Barker, Brant Cage, Stephen E Russek, Conrad Stoldt
Abstract: The structure and magnetic properties of magnetite (Fe^d3^O^d4^) nanoparticles synthesized by a solvothermal processing route are investigated. The nanoparticles are grown from the single organometallic precursor Fe(III) acetylacetonate in trioctylam ...

995. Robust SOLT and Alternative Calibrations for Four-Sampler Vector Network Analyzers
Topic: Electromagnetics
Published: 10/1/1999
Authors: Jeffrey A Jargon, Roger Marks, D. K. Rytting
Abstract: This paper assesses the accuracy of several proposed lumped-element calibration techniques for four-sampler vector network analyzers in the face of imperfectly defined standards. We find that these methods offer a wide range of accuracies, depending ...

996. Robust Separation of Background and Target Signals in Radar Cross Section Measurments
Topic: Electromagnetics
Published: 12/1/2005
Authors: Lorant A. Muth, C. M. Wang, Timothy Conn
Abstract: Coherent radar cross section measurements on a target moving along the system line-of-sight in free space will trace a circle centered on the origin of the complex (I,Q) plane. The presence of additional complex background signals (including stationa ...

997. SEMCconductors Resistivity Measurements Using Split-Dielectric Resonator Technique
Topic: Electromagnetics
Published: 5/1/1996
Authors: Jerzy Krupka, S. Pietruszko, Richard G. Geyer, James R. Baker-Jarvis, Kristof Derzakowski

Topic: Electromagnetics
Published: 11/30/2007
Authors: James Paul Randa, Ken Wong, Roger Pollard
Abstract: Results are presented for simulations of a verification process for noise-parameter measurements. The verification process consists of first measuring separately both a passive device and the amplifier or transistor of interest (the DUT) and then mea ...

Topic: Electromagnetics
Published: 9/7/2007
Authors: James Paul Randa, Eyal Gerecht, David K Walker, Amanda Cox, Dazhen Gu, Lixing You, Robert L Billinger
Abstract: The Noise Project in the Electromagnetics Division of the National Institute of Standards and Technology (NIST) has proposed the development of standards for microwave brightness temperature, for use in remote-sensing applications such as satellite-b ...

1000. Sampling Oscilloscope Models and Calibrations
Topic: Electromagnetics
Published: 6/17/2003
Authors: Catherine A Remley, Dylan F Williams
Abstract: We discuss the basic principles of operation of electrical sampling oscilloscopes and describe circuit models developed to design, characterize, and help explain their operation. We survey common oscilloscope calibration schemes that correct for fini ...

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