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1. A Large-Signal Model of Ferroelectric Thin-Film Transmission Lines"
Topic: Electromagnetics
Published: 12/1/2011
Authors: Eduard Rocas, Juan C. Collado Gomez, Jordi Mateu, Nathan D Orloff, James C Booth, Juan Manuel O'C allaghan
Abstract: "This work evaluates the microwave nonlinear properties and tuning at RF frequencies of ferroelectric Ba0.3Sr0.7TiO3 thin-films by on-wafer measurements of the second and third-order harmonics and intermodulation products of several coplanar transmis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907951

2. A Low-Frequency Model for Radio-Frequency Absorber
Series: Journal of Research (NIST JRES)
Topic: Electromagnetics
Published: 6/1/1995
Author: James Paul Randa
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3298

3. Amplifier and Transistor Noise-Parameter Measurements
Topic: Electromagnetics
Published: 10/1/2014
Author: James Paul Randa
Abstract: Methods for measuring the noise parameters of amplifiers and on-wafer transistors are reviewed. After some preliminary background information and conventions, noise parameters are defined and the most common measurement strategies are presented, bot ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915122

4. Boundary Effects on the Determination of the Effective Parameters of a Metamaterial from Normal Incidence Reflection and Transmission
Topic: Electromagnetics
Published: 6/1/2011
Authors: Sung Kim, Edward E. Kuester, Christopher L Holloway, James R. Baker-Jarvis, Aaron D. Scher
Abstract: This paper presents a method for the determination of the effective electromagnetic parameters of a metamaterial, taking boundary effects at the interfaces between a conventional material and metamaterial into account. In the technique presented here ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904074

5. Catalogue of Electromagnetic Environment Measurements, 30 to 300 Hz
Report Number: 1507
Topic: Electromagnetics
Published: 2/1/1995
Authors: James Paul Randa, D. Gilliland, W. Gjertson, W. Lauber, M. Mcinerney
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3828

6. Characterization and Applications of On-Wafer Diode Noise Sources
Topic: Electromagnetics
Published: 12/1/1998
Authors: Lawrence P. Dunleavy, James Paul Randa, David K Walker, Robert L. Billinger, John Rice
Abstract: A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5598

7. Characterization of Tissue-Equivalent Materials for High-Frequency Applications (200 MHz to 20 GHz)
Series: Technical Note (NIST TN)
Report Number: 1554
Topic: Electromagnetics
Published: 7/1/2010
Authors: James R. Baker-Jarvis, Sung Kim, Luke Leschallinger, Justin Johnson, Brad Givot
Abstract: The purpose of this report is to summarize the characterization of a number of high-frequency solid, liquid, and semisolid tissue-equivalent materials, from 200 MHz to 20 GHz. Carbon black and liquid mixtures were studied, but were found to be uns ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905167

8. Checks of Amplifier Noise-Parameter Measurements
Topic: Electromagnetics
Published: 6/11/2004
Authors: James Paul Randa, David K Walker
Abstract: We propose two verification methods for measurements of noise parameters of amplifiers, particularly low-noise amplifiers (LNAs). One method is a direct measurement of the parameter Trev, the noise temperature from the amplifier input, and the compar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31669

9. Comparison of Adapter Characterization Methods
Topic: Electromagnetics
Published: 12/1/1999
Authors: James Paul Randa, Wojciech Wiatr, Robert L. Billinger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21880

10. Comparison of Methods for Adapter Characterization
Topic: Electromagnetics
Published: 6/1/1999
Authors: James Paul Randa, Wojciech Wiatr, Robert L. Billinger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4428



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